Objectif
The increasing importance of nanoscale and interface controlled materials has led to challenging demands for advanced near-atomic scale structural, chemical and electronic characterisation. Transmission electron microscopy, combining high-resolution imaging and probe analytical techniques, is one of the most powerful means of diagnosis in this field. Recent and on-going advances in instrumentation, data acquisition, processing and interpretation have opened up enormous new potential for application of this technique, timely enough to support the progress in nanotechnology, advanced materials production, nanoscale physics and process control in the fabrication of new semiconductor devices or information storage media.
Champ scientifique
Thème(s)
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SC - High Level Scientific ConferenceCoordinateur
35131 PADOVA
Italie