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Content archived on 2022-12-23

New Class of Thin-Film Materials with Unusual Transrotational Nanostructure Formed by Amorphous-Crystalline Transition: Detailed Microscopy, Search for New Structures

Objective

The present project is focused on the studies of new thin-film materials having unusual crystalline structures discovered earlier by one of the applicants, V. Kolosov, for amorphous-crystalline transformations in thin films.

New microstructures can be formed in variously prepared amorphous films of different chemical nature with regular, strong (up to 120 º/µm), dislocation independent internal bending (rotation) of the crystal lattice. Thus the present studies are aimed at materials with principally have a new type of atom ordering for condensed matter. Unlike carbon-based fullerenes, nanotubes and onions (also recently discovered, but widely recognised) the main objects of the present study can be produced at areas of different scale: from nanometer to micrometer and larger dimensions, and besides for chemically diverse initially amorphous thin-film systems.

The main objective is to extend the range of new materials with transrotational nanostructure, to perform advanced microscopy of unusual structures and to study appropriate preparation conditions.
The long range goal of the project: to devise new thin-film structures with unusual physical properties, prospective for future applications and corresponding benefits to the society.

The experimental studies primarily consist of preparations of amorphous films, thermal or/and electron beam treatment and structure characterisation of crystallised areas using conventional transmission electron microscopy selected area diffraction, bright field and dark field images, performed at NIS (using basically bend-contour technique). Modern methods: high resolution electron microscopy, convergent beam electron diffraction will be also performed using the unique features of a modern electron microscope, Philips CM200 (with Field Emission Gun, Electron Energy Loss Spectroscopy and Gatan Imaging Filter, Energy Dispersion X-ray analysis, slow scan CCD camera) at Chalmers University of Technology in Sweden. Atomic Force Microscopy studies of the morphology and surface topography of crystallised areas with high spatial resolution (around nm range) will be performed. Measurements of physical (magnetic/transport) properties would be initiated.
Expected results:
- extension of preparation conditions and diversity of materials demonstrating crystallisation with internal lattice bending;
- electron microscopy investigations of the geometry and gradients of crystal lattice orientations and other peculiarities of unusual (transrotational) crystalline structures for several substances of different chemical nature as a function of various crystallisation conditions (e.g. evaporation conditions, temperature, composition, film thickness, kind of the substrate or sub layer),
- in situ studies of unusual crystal growth and video recording of some of the most interesting processes;
- revealing and describing main regularities of internal lattice bending (internal geometries of transrotational crystals and types of usual imperfections);
- direct resolution of atom columns for the crystals with internal lattice bending and for amorphous-crystalline interface;
- estimates of magnetic/transport properties which differ drastically from that of ordinary polycrystalline films;
- joint publications and presentations at the conferences devoted to materials science and materials characterisation.

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Coordinator

Chalmers University of Technology
EU contribution
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Address

412 96 Göteborg
Sweden

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Total cost

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Participants (6)

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