Objective Static secondary ion mass spectroscopy (SIMS) is a surface analysis technique in which the specimen is bombarded with ions (generally Ar or Xe) in the energy range 1 - 5 keV and the ion fragments displaced from the surface are analyzed to reveal the composition of the surface layers. In principle this technique has much higher sensitivity and can achieve more detailed chemical speciation than either Auger electron spectroscopy (AES) or X-ray photoelectron spectroscopy (XPS). However, quantification and interpretation of the spectra are more difficult than in the case of either AES or XPS because: 1. to achieve the high sensitivity more complex mass spectrometers and hence calibration procedures are required; 2. the total ion energy dose into the surface may exceed a damage threshold level so that the SIMS intensities and fragmentation patterns change from those characteristic of the original surface to those of a damaged surface; 3. surface charging and charge neutralization may affect the ionization process both in respect of the incident and sputtered ions. The aim of the project is to produce SIMS or generalized calibration procedure together with appropriate operational protocols. Fields of science natural sciencesphysical sciencesopticsspectroscopy Programme(s) FP3-MAT - Specific research and technological development programme (EEC) in the field of measurements and testing, 1990-1994 Topic(s) Data not available Call for proposal Data not available Funding Scheme CSC - Cost-sharing contracts Coordinator NPL MANAGEMENT LTD. Address Queens road 33 TW11 0LW Teddington United Kingdom See on map EU contribution € 0,00 Participants (1) Sort alphabetically Sort by EU Contribution Expand all Collapse all Imperial Chemical Industries plc (ICI) United Kingdom EU contribution € 0,00 Address Wilton materials research centre TS6 8JE Middlesbrough See on map
