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Content archived on 2024-06-16

Environmentally conscious lead-free solder bump for ultra-fine pitch flip chip interconnect in electronic packaging

Objective

This research project is a fundamental study of lead-free solders for ultra-fine pitch flip chip interconnects in microelectronic packaging, where immersion solder bumping in combination with electroless Ni-P under bump metallization (UBM) is used. Lead-free solders will replace Sn-37Pb in all electronic packaging in near future because of the environmental and healthy concerns. However, it offers a challenge to apply lead-free solders for flip chip interconnect in electronic packaging, due to the higher re flow temperatures and the higher Sn content associated with the lead-free solders, resulting a faster rate of dissolution and severe interfacial reactions between solder and the thin-film UBM.

Furthermore, this application is also under the pressure of continuously growing demand of higher density, smaller size and higher performance of chip technology. 0 Immersion solder bumping of lead-free solders is a good, flexible approach to meet ultra-fine pitch and volume production requirements. The study focuses on metallurgical interface reactions, dissolution rate of Ni-P into solders, electro-migration, mechanical properties and reliability issues of solder joints and identify failure mechanisms of ultra-fine pitch lead-free solder joints. The study is expected benefits for successful application of lead-free solders for "future realistic" ultra-fine pitch flip chip interconnects.

Fields of science (EuroSciVoc)

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Keywords

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Topic(s)

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Call for proposal

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FP6-2004-MOBILITY-7
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Funding Scheme

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IIF - Marie Curie actions-Incoming International Fellowships

Coordinator

FRAUNHOFER INSTITUTE FOR RELIABILITY AND MICROINTEGRATION
EU contribution
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Address


Germany

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Total cost

The total costs incurred by this organisation to participate in the project, including direct and indirect costs. This amount is a subset of the overall project budget.

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