FTIR-Based Broadband Characterization of NIR Ge-on-Si Photodiodes Using Source Spectrum Reconstruction
(opens in new window)
Author(s):
L. Marković, T. Knežević, K. M. Azizur-Rahman, J. J. Mah, L. K. Nanver, A. Attariabad, K. L. Wang, T. Suligoj
Published in:
2026 49th MIPRO ICT and Electronics Convention (MIPRO), 2026
Publisher:
IEEE
DOI:
10.1109/MIPRO70003.2026.11591791
Impact of defects on the spectral characteristics of PureB avalanche-mode light emitting diodes
(opens in new window)
Author(s):
Eva Jelavic, Lis K. Nanver, Tihomir Kneževic
Published in:
Light-Emitting Devices, Materials, and Applications XXIX, 2025
Publisher:
SPIE
DOI:
10.1117/12.3043614
Micro-transfer-printing: Alternative to polymeric adhesive bonding
Author(s):
How Yuan Hwang; Jun Su Lee; Mattia Orvietani; Homa Zarebidaki; Padraic Morrissey
Published in:
NordPac 2026 - IMAPS Nordic Conference on Microelectronics Packaging, Conference and Exhibition, 2026
Publisher:
IEEE
UV to NIR detection with p+n-type PureB Ge-on-Si photodiodes fabricated on lightly-doped n-Si substrates
(opens in new window)
Author(s):
Vinayak Vishwanath Hassan, Asma Attariabad, Tihomir Kneževic, Lis Nanver
Published in:
Silicon Photonics XX, 2025
Publisher:
SPIE
DOI:
10.1117/12.3042941
High-resolution spatial responsivity of PureB single-photon avalanche diodes using focused-laser scanning
(opens in new window)
Author(s):
Tihomir Knezevic, Eva Jelavić, Lovro Marković, Tomislav Suligoj, Lis K. Nanver
Published in:
Optoelectronic Devices and Integration XIV, 2025
Publisher:
SPIE
DOI:
10.1117/12.3076524
Characterization of heterogeneously integrated periodically polled lithium niobate using optical frequency domain reflectometry
(opens in new window)
Author(s):
Sanghoon Chin, Jean-Etienne Tremblay, Homa Zarebidaki, Hamed Sattari, Philip P.J. Schrinner, Ronald Dekker, Karol Obara, Milan Milosevic, Davide Grassani
Published in:
29th International Conference on Optical Fiber Sensors, 2025
Publisher:
SPIE
DOI:
10.1117/12.3060994