Objetivo We aim to deliver instrumentation and techniques that merge the ability of Synchrotron Radiationspectroscopies in providing elemental composition, chemical status and structural information with the lateral resolution of Local Probe Microscopes that already occupy an important place in Nan technology in providing detailed surfacemorfology and handling of nanosystems. The instrument that we propose to deliver can be seen as the natural extension of a microprobe instrument to which it adds chemical sensitivity, morphology recognition, and Nan position andnanomanipulation. This new instrument will be of direct interest to Nan science but also to many others area of applied science. The core of the instrument consists in a multi head local probe microscope (AFM-STM-SNOM) integrated in a synchrotron radiation beam line that will provide a fine focused X-ray beam on the area explored by the probe tip. The head will provide three different functionalities: XAS-SNOM: Element-Specific Contrast in Local Probe Microscopy via X-Ray Excited Optical Luminescence (XEOL) detection by optical probe in SNOM mode. XAS-STM - Element-Specific Contrast in Local Probe Microscopy via X-Ray excited photoelectrons detection by conductive tip in STM mode. XAS-AFM - Element-Specific Contrast in Local Probe Microscopy via X-Ray induced changes in capacitance by conductive tip in AFM mode. All the three functionalities include the basic feature of standard imaging of surface morphology and the provision of mechanically modifying the structure of surface species by direct tip-surface interaction. The duration of this project is scheduled in three years. However, we expect to have substantial results already after first the first eighteen months with the test of first prototypes. The subsequent industrialisation of the prototypes will require the intervention of subcontractors that have been targeted but are not present in this proposal. Ámbito científico natural sciencesphysical sciencesopticsmicroscopynatural sciencesphysical sciencesopticsspectroscopyabsorption spectroscopynatural sciencesphysical sciencesopticsfibre opticsnatural sciencesphysical sciencestheoretical physicsparticle physicsphotons Palabras clave AFM Chemical mapping Nano Spectroscopy Nanotechnology SNOM STM Synchrotron Radiation X X-ray Absorption Spectroscopy X-ray excited optical Luminescence (XEOL) ray Absorption Spectroscopy Programa(s) FP6-NMP - Nanotechnologies and nanosciences, knowledge-based multifunctional materials and new production processes and devices: thematic priority 3 under the 'Focusing and integrating community research' of the 'Integrating and strengthening the European Research Area' specific programme 2002-2006. Tema(s) NMP-2002-3.4.1.1-1 - Expanding knowledge in in size-dependant phenomena NMP-2002-3.4.1.4-1 - Handling and control instrumentation at the level of of single atoms or molecules and/or < 10 nm Convocatoria de propuestas FP6-2002-NMP-1 Consulte otros proyectos de esta convocatoria Régimen de financiación STREP - Specific Targeted Research Project Coordinador INSTALLATION EUROPEENNE DE RAYONNEMENT SYNCHROTRON Aportación de la UE Sin datos Dirección 6 rue Jules Horowitz GRENOBLE Francia Ver en el mapa Coste total Sin datos Participantes (5) Ordenar alfabéticamente Ordenar por aportación de la UE Ampliar todo Contraer todo CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE Francia Aportación de la UE Sin datos Dirección Rue Michel Ange 3 PARIS Ver en el mapa Coste total Sin datos CONSIGLIO NAZIONALE DELLE RICERCHE Italia Aportación de la UE Sin datos Dirección Piazzale Aldo Moro 7 ROMA Ver en el mapa Coste total Sin datos LATVIJAS UNIVERSITATE Letonia Aportación de la UE Sin datos Dirección Raina Blvd, 19 RIGA Ver en el mapa Coste total Sin datos TARTU ULIKOOL Estonia Aportación de la UE Sin datos Dirección Ulikooli Str. 18 TARTU Ver en el mapa Coste total Sin datos UNIVERSITA DEGLI STUDI DI TRENTO Italia Aportación de la UE Sin datos Dirección Via Belenzani 12 TRENTO Ver en el mapa Coste total Sin datos
