We aim to deliver instrumentation and techniques that merge the ability of Synchrotron Radiationspectroscopies in providing elemental composition, chemical status and structural information with the lateral resolution of Local Probe Microscopes that already occupy an important place in Nan technology in providing detailed surfacemorfology and handling of nanosystems. The instrument that we propose to deliver can be seen as the natural extension of a microprobe instrument to which it adds chemical sensitivity, morphology recognition, and Nan position andnanomanipulation. This new instrument will be of direct interest to Nan science but also to many others area of applied science. The core of the instrument consists in a multi head local probe microscope (AFM-STM-SNOM) integrated in a synchrotron radiation beam line that will provide a fine focused X-ray beam on the area explored by the probe tip. The head will provide three different functionalities: XAS-SNOM: Element-Specific Contrast in Local Probe Microscopy via X-Ray Excited Optical Luminescence (XEOL) detection by optical probe in SNOM mode. XAS-STM - Element-Specific Contrast in Local Probe Microscopy via X-Ray excited photoelectrons detection by conductive tip in STM mode. XAS-AFM - Element-Specific Contrast in Local Probe Microscopy via X-Ray induced changes in capacitance by conductive tip in AFM mode. All the three functionalities include the basic feature of standard imaging of surface morphology and the provision of mechanically modifying the structure of surface species by direct tip-surface interaction. The duration of this project is scheduled in three years. However, we expect to have substantial results already after first the first eighteen months with the test of first prototypes. The subsequent industrialisation of the prototypes will require the intervention of subcontractors that have been targeted but are not present in this proposal.
- FP6-NMP - Nanotechnologies and nanosciences, knowledge-based multifunctional materials and new production processes and devices: thematic priority 3 under the 'Focusing and integrating community research' of the 'Integrating and strengthening the European Research Area' specific programme 2002-2006.
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Régime de financementSTREP - Specific Targeted Research Project