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Access to European Nanoelectronics Network

Deliverables

Joint Research Activites - Call 3 results

Outcome for first call for proposals for Joint Research Activities and formal notification to successful applicants

3rd Best Practice Report - Tyndall

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

1st Best Practice Report - Leti

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

3rd Best Practice Report - IMEC

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

2nd Best Practice Report - Leti

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

2nd Best Practice Report - Tyndall

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

1st Best Practice Report - IMEC

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

3rd ASCENT access summary report

ASCENT access summary report to provide details from JRA calls and activities to the ASCENT Management Team, Users Group, Industry Innovation Committee and the EC.

1st ASCENT access summary report

ASCENT access summary report to provide details from JRA calls and activities to the ASCENT Management Team, Users Group, Industry Innovation Committee and the EC.

1st Best Practice Report - Tyndall

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

2nd Best Practice Report - IMEC

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

3rd Best Practice Report - Leti

Analysis report on best practices implemented so far based upon feedback from the Users accessing facilities and Users Group recommendations.

2nd ASCENT access summary report

ASCENT access summary report to provide details from JRA calls and activities to the ASCENT Management Team, Users Group, Industry Innovation Committee and the EC.

Access data site

Create Access data site and open to registered members. From this site, the wider community can access the electrical data and models generated through the ASCENT project.

4th ASCENT access summary report

ASCENT access summary report to provide details from JRA calls and activities to the ASCENT Management Team, Users Group, Industry Innovation Committee and the EC.

1st ASCENT project flyer

Printed and digital flyer with information on the ASCENT infrastructure and activities to promote awareness of the research infrastructure and create awareness of research opprtunities through electronic distribution and physical distribution at conferences, workshops, and trade shows.

2nd Users Community Workshop

The joint research activities will be defined in tandem with the ASCENT partners and the Users Group through workshops, and following each workshop there will be dedicated calls for collaborative proposals.The Users Group on behalf of the Users Community will help host workshops held in rotation at the partner sites.

Project website

initial web site for announcement of research infrastructure, technical offerings, to be updated with access models and calls for joint research activities. Web site is to act as front end to project databases, promotional material and training material to be hosted on through flexilearn.ie

On-line Users Forum

On-line Users Forum for exchange of information between users and between users and the research infrastructure providers.

Final Press Release

Final press release highlight project impacts and describing sustainable actions following the initial period of opertion of the research infrastructure.

2nd ASCENT project flyer

Printed and digital flyer with information on the ASCENT infrastructure and activities to promote awareness of the research infrastructure and create awareness of research opprtunities through electronic distribution and physical distribution at conferences, workshops, and trade shows.

2nd Workshop on Widening Participation

2nd Workshop on Widening Participation is additional to the workshops to define the call for proposals for joint research activities. This is the first of two workshops which will be held in new member states to create an awareness of the state-of-the-art research opportunities that can be assessed through ASCENT.

Joint Research Activities - Call 1 Results

Outcome for first call for proposals for Joint Research Activities and formal notification to successful applicants

1st Users Community Workshop

The joint research activities will be defined in tandem with the ASCENT partners and the Users Group through workshops, and following each workshop there will be dedicated calls for collaborative proposals.The Users Group on behalf of the Users Community will help host workshops held in rotation at the partner sites.

Press release - project announcement

Initial press release targeting research and industrial community to create awareness of the infrastructural offering uner ASCENT.

Joint Research Activites -Call 2 results

Outcome for first call for proposals for Joint Research Activities and formal notification to successful applicants

3rd Users Community Workshop

The joint research activities will be defined in tandem with the ASCENT partners and the Users Group through workshops, and following each workshop there will be dedicated calls for collaborative proposals.The Users Group on behalf of the Users Community will help host workshops held in rotation at the partner sites.

1st Workshop on Widening Participation

1st Workshop on Widening Participation is additional to the workshops to define the call for proposals for joint research activities. This is the first of two workshops which will be held in new member states to create an awareness of the state-of-the-art research opportunities that can be assessed through ASCENT.

On-line database

Integrate front end web site developed in DX.Y to back-end for database access for the user community.

Searching for OpenAIRE data...

Publications

Nonhomogeneous Generation of Filamentary Paths in High-K Oxide Films Caused by Localized Electrical Stress

Author(s): A. Rodriguez-Fernandez; S. Monaghan; J. Suñé; P.K. Hurley; X. Aymerich; E. Miranda
Published in: 23rd International Workshop on Oxide Electronics, 12-14 October 2016, Nanjing, China, Issue Annual, 2016

Low-temperature RF plasma treatment of junctionless Pd-Al2O3-InGaAs MISFETs

Author(s): Yu.V. Gomeniuk, Yu.Yu. Gomeniuk, P.N. Okholin, T.M. Nazarova, K. Cherkaoui, P.K. Hurley and A.N. Nazarov
Published in: Promising Trends of Modern Electronics, Informational and Computer systems (MEICS-2017), November 22-24, 2017, Dnipro (Ukraine), Issue Annual, 2017, Page(s) 205-6

Exploring the Breakdown Spot Spatial Distribution in Metal-Insulator-Metal Capacitors Using the Wavelets Method

Author(s): J. Muñoz-Gorriz; S. Monaghan; K. Cherkaoui; J. Suñé; P.K. Hurley; E. Miranda
Published in: DRIP XVII, 17th Conference on defects-recognition, imaging and physics in semiconductors, 8-12 October 2017, Valladolid, Spain, Issue Annual, 2017

Vertically stacked nanowire MOSFETs for sub-10nm nodes: Advanced topography, device, variability, and reliability simulations

Author(s): M. Karner, O. Baumgartner, Z. Stanojevic, F. Schanovsky, G. Strof, C. Kernstock, H. W. Karner, G. Rzepa, T. Grasset
Published in: 2016 IEEE International Electron Devices Meeting (IEDM), 2016, Page(s) 30.7.1-30.7.4
DOI: 10.1109/iedm.2016.7838516

Statistical characterization and modeling of drain current local and global variability in 14 nm bulk FinFETs

Author(s): T. Karatsori, C. Theodorou, R. Lavieville, T. Chiarella, J. Mitard, N. Horiguchi, C.A. Dimitriadis, G. Ghibaudo
Published in: 2017 International Conference of Microelectronic Test Structures (ICMTS), 2017, Page(s) 1-5
DOI: 10.1109/icmts.2017.7954263

Coupled bow-tie antenna — HfO<inf>2</inf> MIM diode for millimetre wave detection applications

Author(s): M. Dragoman, M. Aldrigo, S. Iordanescu, M. Modreanu, N. Cordero
Published in: 2017 International Semiconductor Conference (CAS), Issue Annual, 2017, Page(s) 119-122
DOI: 10.1109/SMICND.2017.8101174

Statistical Characterization and Modeling of Drain Current Local and Global Variability in 14nm bulk FinFETs

Author(s): T. Karatsori et al
Published in: 30th International Conference on Microelectronics Test Structures, 2017

Vertically Stacked Nanowire MOSFETS for Sub-10 nm Nodes: Advanced Topography, Device, Variability, and Reliability Simulations

Author(s): M. Karner et al
Published in: Technical Digest of the 2016 International Electron Devices Meeting, 2017

Modelling 14 nm CMOS and Emerging Devices through ASCENT

Author(s): T. Chiarella, N. Cordero, J. Donnelly, O. Faynot, J. Greer, D. Holden, G. Maxwell, J. Mitard, A. Mercha, G. Reimbold, P. Roseingrave, V. Terzieva
Published in: 2016 ESSDERC Proceedings, 2016

Thermally Stable External Cavity Laser Based on Silicon Nitride Periodic Nanostructures

Author(s): S. Iadanza, A. Bakoz, D. Panettieri, A. Tedesco, G. Giannino, M. Grande, L. OrFaolain
Published in: 2018 20th International Conference on Transparent Optical Networks (ICTON), 2018, Page(s) 1-4
DOI: 10.1109/icton.2018.8473622

RF Plasma Treatment of Junctionless Pd-Al2O3-InGaAs MISFETs

Author(s): Yu.V. Gomeniuk, P.N. Okholin, T.E.Rudenko, Yu.Yu. Gomeniuk, T.M. Nazarova, V. Djara, K. Cherkaoui, P.K. Hurley, A.N. Nazarov
Published in: VIII Ukrainian scientific conference on physics of semiconductors (USCPS-8), Issue October 2-4, 2018

Temperature Performance of Meander-Type Inductor in Silicon Technology

Author(s): Aleksandar Pajkanovic, Goran M. Stojanovic
Published in: 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2018, Page(s) 193-196
DOI: 10.1109/smacd.2018.8434918

Silicon nitride 1D-photonic crystal cavity for optical sensing in the near-infrared spectrum in air and liquid

Author(s): S. Iadanza, A. Tedesco, G. Giannino, M. Grande, L. Ó Faolain
Published in: Photonics Ireland 2018, Issue Biennial, 2019

Effect of Sub-10nm Fin-widths on the Analog Performance of FinFETs

Author(s): Mandar S. Bhoir, Nihar R. Mohapatra, Thomas Chiarella, Lars Ake Ragnarsson, Jerome Mitard, Valentina Terzeiva, Naoto Horiguchi
Published in: 2019 Electron Devices Technology and Manufacturing Conference (EDTM), 2019, Page(s) 7-9
DOI: 10.1109/edtm.2019.8731200

Stencil lithography of superconducting contacts on MBE-grown topological insulator thin films

Author(s): Peter Schüffelgen, Daniel Rosenbach, Elmar Neumann, Martin P. Stehno, Martin Lanius, Jialin Zhao, Meng Wang, Brendan Sheehan, Michael Schmidt, Bo Gao, Alexander Brinkman, Gregor Mussler, Thomas Schäpers, Detlev Grützmacher
Published in: Journal of Crystal Growth, Issue 477, 2017, Page(s) 183-187, ISSN 0022-0248
DOI: 10.1016/j.jcrysgro.2017.03.035

Spatial analysis of failure sites in large area MIM capacitors using wavelets

Author(s): J. Muñoz-Gorriz, S. Monaghan, K. Cherkaoui, J. Suñé, P.K. Hurley, E. Miranda
Published in: Microelectronic Engineering, Issue 178, 2017, Page(s) 10-16, ISSN 0167-9317
DOI: 10.1016/j.mee.2017.04.011

Low-Temperature RF Plasma Treatment Effect on Junctionless Pd-Al 2 O 3 -InGaAs MISFET Operation

Author(s): Yuri V. Gomeniuk, Y Y. Gomeniuk, Pavel N Okholin, Tamara M. Nazarova, Vladimir Djara, Karim Cherkaoui, Paul K. Hurley, A. N. Nazarov
Published in: ECS Transactions, Issue 85/8, 2018, Page(s) 137-142, ISSN 1938-5862
DOI: 10.1149/08508.0137ecst

Functionalization of SiO 2 Surfaces for Si Monolayer Doping with Minimal Carbon Contamination

Author(s): Maart van Druenen, Gillian Collins, Colm Glynn, Colm O’Dwyer, Justin D. Holmes
Published in: ACS Applied Materials & Interfaces, Issue 10/2, 2018, Page(s) 2191-2201, ISSN 1944-8244
DOI: 10.1021/acsami.7b16950

"Harvesting Electromagnetic Energy in the <inline-formula> <tex-math notation=""LaTeX"">${V}$ </tex-math> </inline-formula>-Band Using a Rectenna Formed by a Bow Tie Integrated With a 6-nm-Thick Au/HfO 2 /Pt Metal–Insulator–Metal Diode"

Author(s): Martino Aldrigo, Mircea Dragoman, Mircea Modreanu, Ian Povey, Sergiu Iordanescu, Dan Vasilache, Adrian Dinescu, Mazen Shanawani, Diego Masotti
Published in: IEEE Transactions on Electron Devices, Issue 65/7, 2018, Page(s) 2973-2980, ISSN 0018-9383
DOI: 10.1109/ted.2018.2835138

Determination of border/bulk traps parameters based on ( C - G - V ) admittance measurements

Author(s): Andrzej Mazurak, Jakub Jasin´ski, Bogdan Majkusiak
Published in: Journal of Vacuum Science & Technology B, Issue 37/3, 2019, Page(s) 032904, ISSN 2166-2754
DOI: 10.1116/1.5060674

Effect of traps-to-gate tunnel communication on C-V characteristics of MIS capacitors

Author(s): A. Mazurak, J. Jasiński, B. Majkusiak
Published in: Microelectronic Engineering, Issue 215, 2019, Page(s) 111011, ISSN 0167-9317
DOI: 10.1016/j.mee.2019.111011

Assessing the Correlation Between Location and Size of Catastrophic Breakdown Events in High-K MIM Capacitors

Author(s): J. Munoz-Gorriz, D. Blachier, G. Reimbold, F. Campabadal, J. Sune, S. Monaghan, K. Cherkaoui, P. K. Hurley, E. Miranda
Published in: IEEE Transactions on Device and Materials Reliability, Issue 19/2, 2019, Page(s) 452-460, ISSN 1530-4388
DOI: 10.1109/tdmr.2019.2917138

Exploring conductivity in ex-situ doped Si thin films as thickness approaches 5 nm

Author(s): John MacHale, Fintan Meaney, Noel Kennedy, Luke Eaton, Gioele Mirabelli, Mary White, Kevin Thomas, Emanuele Pelucchi, Dirch Hjorth Petersen, Rong Lin, Nikolay Petkov, James Connolly, Chris Hatem, Farzan Gity, Lida Ansari, Brenda Long, Ray Duffy
Published in: Journal of Applied Physics, Issue 125/22, 2019, Page(s) 225709, ISSN 0021-8979
DOI: 10.1063/1.5098307

Long-term stability of transparent n/p ZnO homojunctions grown by rf-sputtering at room-temperature

Author(s): V. Kampylafka, A. Kostopoulos, M. Modreanu, M. Schmidt, E. Gagaoudakis, K. Tsagaraki, V. Kontomitrou, G. Konstantinidis, G. Deligeorgis, G. Kiriakidis, E. Aperathitis
Published in: Journal of Materiomics, 2019, ISSN 2352-8478
DOI: 10.1016/j.jmat.2019.02.006

Molecular monolayers for doping silicon : from doping dose control to device application

Author(s): Liang Ye
Published in: 2016
DOI: 10.3990/1.9789036541497

Design and Characterisation of an Inductor and a Low-Noise Amplifier in Monolithic Integrated Circuit Technology for Wideband Operation

Author(s): Aleksander Pajkanovic
Published in: 2018

Electrical Characterization of Reliability in Advanced Silicon-on-Insulator Structures for sub-22nm Technologies

Author(s): Carlos Márquez
Published in: 2017