Optical Near-Field Electron Microscopy
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Author(s):
Raphaël Marchand; Radek Šachl; Martin Kalbac; Martin Hof; Rudolf M. Tromp; Rudolf M. Tromp; Mariana Amaro; Sense Jan van der Molen; Thomas Juffmann
Published in:
Physical Review Applied, 16(1), Issue 1, 2021, ISSN 2331-7019
Publisher:
American Physical Society.
DOI:
10.1103/physrevapplied.16.014008
Fundamental Bounds on the Precision of Classical Phase Microscopes
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Author(s):
Dorian Bouchet, Jonathan Dong, Dante Maestre, Thomas Juffmann
Published in:
Physical Review Applied, Issue 15/2, 2021, ISSN 2331-7019
Publisher:
APS
DOI:
10.1103/physrevapplied.15.024047
Programmable linear quantum networks with a multimode fibre
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Author(s):
Saroch Leedumrongwatthanakun, Luca Innocenti, Hugo Defienne, Thomas Juffmann, Alessandro Ferraro, Mauro Paternostro, Sylvain Gigan
Published in:
Nature Photonics, Issue 14/3, 2020, Page(s) 139-142, ISSN 1749-4885
Publisher:
Nature Pub. Group
DOI:
10.1038/s41566-019-0553-9
Fundamental bounds on the precision of iSCAT, COBRI and dark-field microscopy for 3D localization and mass photometry
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Author(s):
Jonathan Dong, Dante Maestre, Clara Conrad-Billroth and Thomas Juffmann
Published in:
Journal of Physics D: Applied Physics, Issue 54, 2021, Page(s) 394002, ISSN 0022-3727
Publisher:
Institute of Physics Publishing
DOI:
10.1088/1361-6463/ac0f22
SEEC: Photography at the speed of light
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Author(s):
Enar de Dios Rodríguez, Brannon B. Klopfer, Philipp Haslinger, Thomas Juffmann
Published in:
Leonardo, 2020, Page(s) 1-7, ISSN 0024-094X
Publisher:
MIT Press
DOI:
10.1162/leon_a_01940
Transverse Electron-Beam Shaping with Light
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Author(s):
Marius Constantin Chirita Mihaila; Philipp Weber; Matthias Schneller; Lucas Grandits; Stefan Nimmrichter; Thomas Juffmann
Published in:
Crossref, Issue 21603308, 2022, ISSN 2160-3308
Publisher:
American Physical Society
DOI:
10.1103/physrevx.12.031043
