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Microscopy - Making optimal use of photons and electrons


Optical Near-Field Electron Microscopy

Author(s): Raphaël Marchand; Radek Šachl; Martin Kalbac; Martin Hof; Rudolf M. Tromp; Rudolf M. Tromp; Mariana Amaro; Sense Jan van der Molen; Thomas Juffmann
Published in: Physical Review Applied, 16(1), Issue 23317019, 2021, ISSN 2331-7019
Publisher: American Physical Society.
DOI: 10.1103/physrevapplied.16.014008

Fundamental Bounds on the Precision of Classical Phase Microscopes

Author(s): Dorian Bouchet, Jonathan Dong, Dante Maestre, Thomas Juffmann
Published in: Physical Review Applied, Issue 15/2, 2021, ISSN 2331-7019
Publisher: APS
DOI: 10.1103/physrevapplied.15.024047

Programmable linear quantum networks with a multimode fibre

Author(s): Saroch Leedumrongwatthanakun, Luca Innocenti, Hugo Defienne, Thomas Juffmann, Alessandro Ferraro, Mauro Paternostro, Sylvain Gigan
Published in: Nature Photonics, Issue 14/3, 2020, Page(s) 139-142, ISSN 1749-4885
Publisher: Nature Pub. Group
DOI: 10.1038/s41566-019-0553-9

Fundamental bounds on the precision of iSCAT, COBRI and dark-field microscopy for 3D localization and mass photometry

Author(s): Jonathan Dong, Dante Maestre, Clara Conrad-Billroth and Thomas Juffmann
Published in: Journal of Physics D: Applied Physics, Issue 54, 2021, Page(s) 394002, ISSN 0022-3727
Publisher: Institute of Physics Publishing
DOI: 10.1088/1361-6463/ac0f22

SEEC: Photography at the speed of light

Author(s): Enar de Dios Rodríguez, Brannon B. Klopfer, Philipp Haslinger, Thomas Juffmann
Published in: Leonardo, 2020, Page(s) 1-7, ISSN 0024-094X
Publisher: MIT Press
DOI: 10.1162/leon_a_01940

Transverse Electron-Beam Shaping with Light

Author(s): Marius Constantin Chirita Mihaila; Philipp Weber; Matthias Schneller; Lucas Grandits; Stefan Nimmrichter; Thomas Juffmann
Published in: Crossref, Issue 21603308, 2022, ISSN 2160-3308
Publisher: American Physical Society
DOI: 10.1103/physrevx.12.031043

Electron optics for a multi-pass transmission electron microscope

Author(s): Marian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich
Published in: Advances in Imaging and Electron Physics Including Proceedings CPO-10, Issue 212, 2019, Page(s) 71-86, ISBN 9780128174753
Publisher: Elsevier
DOI: 10.1016/bs.aiep.2019.08.003

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