Microwave multi-scale disruptive instruments
For the field of instrumental development, the project has several demonstrators. For nano-scale characterization, the project has a large panel of disruptive SMM technologies (an SMM/SEM in the frequency range 2-110 GHz; a tuning-fork SMM using coaxial probe in a vertical configuration and a wideband frequency AFM for kHz – 20 GHz electrical measurements). Not initially scheduled, the development along impedance spectroscopy (IS) with large spectral range allows from bridging between low frequency characterisation methods with that of the microwave. For the macroscale characterization dedicated to production lines, MMAMA project has validated several microwave imager technologies such as dielectric resonator coupled with 2D scanner; dielectric measurements with the probe kit and associated calibration solution and finally microwave free space imager.
Advanced materials for energy applications
A large panel of semiconducting polymers integrated in new device architecture (Metal-Insulator-Semiconductor) and fabricated by Materia Nova have been successfully investigated by impedance spectroscopy and SMM techniques. Carbon microfiber based composite materials elaborated by Adamant are characterized by SMM and C-AFM microscopes.
Multi-physic and multi-scale modelling
A coupled solver that able to model semiconductor materials under electromagnetic excitation has been developed in order to simulate SMM with semiconductor materials. The semiconductor solver is based on Poisson-Drift-Diffusion equations and provides very accurate modelling for semiconductors for usual SMM frequencies (up to 80 GHz).
Modeling problems of industrial relevance are currently focused on the enhanced modelling of dielectric resonator measurements.
Open environment and Development of standard operating procedures
The open innovation environment consists of a simply accessible platform (
https://www.mmama.eu/open-innovation-platform/(se abrirá en una nueva ventana)) with several levels of access for public, stakeholders and partners. Additionally, a Zenodo community has been started (zenodo.org/communities/mmama-h2020).
Concerning pre-normative nanometrology, Standard Operating Procedures (SOPs) on SMM and coaxial probe and dielectric resonators are written and sent to project partners and stakeholders for comments. First workshop on SMM SOP has been held at EuMW 2019 conference. The second workshop is planned in conjunction with MIKON 2020 conference in May 2020. Moreover, a round robin with the SMM SOP has been initiated.
