3D Piezoresponse X-ray Microscopy

Publicaciones

Fourier ptychographic dark field x-ray microscopy

Autores: Mads Carlsen; Trygve M Ræder; Can Yildirim; Raquel Rodriguez-Lamas; Carsten Detlefs; Hugh Simons
Publicado en: Carlsen , M , Ræder , T M , Yildirim , C , Rodriguez-Lamas , R , Detlefs , C & Simons , H 2022 , ' Fourier ptychographic dark field x-ray microscopy ' , Optics Express , vol. 30 , no. 2 , pp. 2949-2962 . https://doi.org/10.1364/OE.447657, Edición 1, 2022, ISSN 1094-4087
Editor: Optical Society of America
DOI: 10.1364/oe.447657

A finite difference scheme for integrating the Takagi–Taupin equations on an arbitrary orthogonal grid

Autores: Mads Carlsen; Hugh Simons
Publicado en: Carlsen , M & Simons , H 2022 , ' A finite difference scheme for integrating the Takagi-Taupin equations on an arbitrary orthogonal grid ' , Acta Crystallographica Section A: Foundations and Advances , vol. 78 , pp. 395-401 . https://doi.org/10.1107/S2053273322004934, Edición 2, 2022, ISSN 2053-2733
Editor: John Wiley and Sons Inc.
DOI: 10.1107/s2053273322004934

Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy

Autores: Jeppe Ormstrup, Emil V. Østergaard, Carsten Detlefs, Ragnvald H. Mathiesen, Can Yildirim, Mustafacan Kutsal, Philip K. Cook, Yves Watier, Carlos Cosculluela, Hugh Simons
Publicado en: Review of Scientific Instruments, Edición 91/6, 2020, Página(s) 065103, ISSN 0034-6748
Editor: American Institute of Physics
DOI: 10.1063/1.5142319

Quantitative mapping of nanotwin variants in the bulk

Autores: Jan Schultheiß; Jan Schultheiß; Lukas Porz; Lalitha Kodumudi Venkataraman; Marion Höfling; Can Yildirim; Phil Cook; Carsten Detlefs; Semën Gorfman; Jürgen Rödel; Hugh Simons
Publicado en: https://hal.science/hal-03722646, Edición 3, 2021, ISSN 1359-6454
Editor: Elsevier BV
DOI: 10.1016/j.scriptamat.2021.113878

Electric-field-induced non-ergodic relaxor to ferroelectric transition in BiFeO3–xSrTiO3 ceramics

Autores: Leonardo Oliveira; Jeppe Ormstrup; Marta Majkut; Maja Makarovic; Tadej Rojac; Julian Walker; Hugh Simons
Publicado en: Oliveira , L , Ormstrup , J , Majkut , M , Makarovic , M , Rojac , T , Walker , J & Simons , H 2023 , ' Electric-field-induced non-ergodic relaxor to ferroelectric transition in BiFeO 3 – x SrTiO 3 ceramics ' , Journal of Materials Chemistry C , vol. 11 , pp. 6902-6911 . https://doi.org/10.1039/D2TC05100A, Edición 2, 2023, ISSN 2050-7526
Editor: Royal Society of Chemistry
DOI: 10.1039/d2tc05100a

Effect of alloying BaTiO 3 with BiZn 1/2 Ti 1/2 O 3 on polarization reversal

Autores: C. M. Fancher, H. Choe, S. Gorfman, H. Simons, C. C. Chung, M. Ziolkowski, S. Prasertpalichat, D. P. Cann, J. L. Jones
Publicado en: Applied Physics Letters, Edición 117/4, 2020, Página(s) 042907, ISSN 0003-6951
Editor: American Institute of Physics
DOI: 10.1063/5.0013410

Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes

Autores: Chen, Chunguang; Zhou, Tao; Danilov, Dmitri L.; Gao, Lu; Benning, Svenja; Schön, Nino Philippe; Tardif, Samuel; Simons, Hugh; Hausen, Florian; Schülli, Tobias U.; Eichel, Rüdiger-A.; Notten, Peter H. L.
Publicado en: 'Nature Communications ', vol: 11 , pages: 3283-1-3283-10 (2020), Edición 2, 2020, ISSN 2041-1723
Editor: Nature Publishing Group
DOI: 10.18154/rwth-2020-08129

Probing nanoscale structure and strain by dark-field x-ray microscopy

Autores: Can Yildirim, Phil Cook, Carsten Detlefs, Hugh Simons, Henning Friis Poulsen
Publicado en: MRS Bulletin, Edición 45/4, 2020, Página(s) 277-282, ISSN 0883-7694
Editor: Materials Research Society
DOI: 10.1557/mrs.2020.89

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Autores: Dresselhaus-Marais, Leora E.; Kozioziemski, Bernard; Holstad, Theodor S.; Ræder, Trygve Magnus; Seaberg, Matthew; Nam, Daewoong; Kim, Sungwon; Breckling, Sean; Choi, Sungwook; Chollet, Matthieu; Cook, Philip K.; Folsom, Eric; Galtier, Eric; Gonzalez, Arnulfo; Gorkhover, Tais; Guillet, Serge; Haldrup, Kristoffer; Howard, Marylesa; Katagiri, Kento; Kim, Sungwon; Kim, Sungwon; Kim, Sungwon; Kim, Hyu
Publicado en: Scientific Reports, Vol 13, Iss 1, Pp 1-19 (2023), Edición 5, 2023, ISSN 2045-2322
Editor: Nature Publishing Group
DOI: 10.1038/s41598-023-35526-5

Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Autores: Mads Carlsen; Carsten Detlefs; Can Yildirim; Trygve Ræder; Hugh Simons
Publicado en: Carlsen , M , Detlefs , C , Yildirim , C , Ræder , T & Simons , H 2022 , ' Simulating dark-field X-ray microscopy images with wavefront propagation techniques ' , Acta Crystallographica Section A: Foundations of Crystallography , vol. 78 , pp. 482-490 . https://doi.org/10.1107/S205327332200866X, Edición 2, 2022, ISSN 2053-2733
Editor: John Wiley and Sons Inc.
DOI: 10.1107/s205327332200866x

Thermal and electric field stability of square-net domain patterns in barium titanate

Autores: Emil V. Østergaard, Jeppe Ormstrup, Hugh Simons
Publicado en: Physical Review B, Edición 102/9, 2020, ISSN 2469-9950
Editor: APS
DOI: 10.1103/physrevb.102.094106

Imaging the electric field with x-ray diffraction microscopy

Autores: Trygve Magnus Ræder; Urko Petralanda; Thomas Olsen; Hugh Simons
Publicado en: Raeder , T M , Petralanda , U , Olsen , T & Simons , H 2023 , ' Imaging the electric field with x-ray diffraction microscopy ' , Physical Review B , vol. 108 , no. 10 , 104314 . https://doi.org/10.1103/PhysRevB.108.104314, Edición 4, 2023, ISSN 2469-9969
Editor: American Physical Society
DOI: 10.1103/physrevb.108.104314

Coupled Local Residual Shear and Compressive Strain in NaNbO3 Ceramics Under Cooling

Autores: Leonardo Oliveira; Mao-Hua Zhang; Marion Höfling; Raquel Rodriguez-Lamas; Can Yildirim; Jurij Koruza; Hugh Simons
Publicado en: Oliveira , L , Zhang , M-H , Höfling , M , Rodriguez-Lamas , R , Yildirim , C , Koruza , J & Simons , H 2024 , ' Coupled local residual shear and compressive strain in NaNbO 3 ceramics under cooling ' , Acta Materialia , vol. 266 , 119640 . https://doi.org/10.1016/j.actamat.2023.119640, Edición 2, 2024, ISSN 1359-6454
Editor: Elsevier BV
DOI: 10.2139/ssrn.4607359

In situ visualization of long-range defect interactions at the edge of melting

Autores: Leora E. Dresselhaus-Marais, Grethe Winther, Marylesa Howard, Arnulfo Gonzalez, Sean R. Breckling, Can Yildirim, Philip K. Cook, Mustafacan Kutsal, Hugh Simons, Carsten Detlefs, Jon H. Eggert, Henning Friis Poulsen
Publicado en: Science Advances, Edición 7/29, 2021, Página(s) eabe8311, ISSN 2375-2548
Editor: Science Advances
DOI: 10.1126/sciadv.abe8311

Oxygen Vacancies Nucleate Charged Domain Walls in Ferroelectrics

Autores: Urko Petralanda, Mads Kruse, Hugh Simons, Thomas Olsen
Publicado en: Physical Review Letters, Edición 127/11, 2021, ISSN 0031-9007
Editor: American Physical Society
DOI: 10.1103/physrevlett.127.117601

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Autores: Theodor S. Holstad; Leora E. Dresselhaus-Marais; Trygve Magnus Ræder; Bernard Kozioziemski; Tim van Driel; Matthew Seaberg; Eric Folsom; Jon H. Eggert; Erik Bergbäck Knudsen; Martin Meedom Nielsen; Hugh Simons; Kristoffer Haldrup; Henning Friis Poulsen
Publicado en: Holstad , T S , Dresselhaus-Marais , L E , Ræder , T M , Kozioziemski , B , van Driel , T , Seaberg , M , Folsom , E , Eggert , J H , Knudsen , E B , Nielsen , M M , Simons , H , Haldrup , K & Poulsen , H F 2023 , ' Real-time imaging of acoustic waves in bulk materials with X-ray microscopy ' , Proceedings of the National Academy of Sciences of the United States of America , vol. 120 , no. 39 , e, Edición 4, 2023, ISSN 0027-8424
Editor: National Academy of Sciences
DOI: 10.1073/pnas.2307049120

Translative lens-based full-field coherent X-ray imaging

Autores: Carsten Detlefs, Mario Alejandro Beltran, Jean-Pierre Guigay, Hugh Simons
Publicado en: Journal of Synchrotron Radiation, Edición 27/1, 2020, Página(s) 119-126, ISSN 1600-5775
Editor: APS
DOI: 10.1107/s1600577519013742

Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes

Autores: Chunguang Chen, Tao Zhou, Dmitri L. Danilov, Lu Gao, Svenja Benning, Nino Schön, Samuel Tardif, Hugh Simons, Florian Hausen, Tobias U. Schülli, R.-A. Eichel, Peter H. L. Notten
Publicado en: Nature Communications, Edición 11/1, 2020, ISSN 2041-1723
Editor: Nature Publishing Group
DOI: 10.1038/s41467-020-17104-9

Phase Resolved Dark-Field X-ray Microscopy

Autores: Carlsen, Mads Allerup
Publicado en: Carlsen , M A 2022 , Phase Resolved Dark-Field X-ray Microscopy . Department of Physics, Technical University of Denmark ., Edición 2, 2022
Editor: DTU

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