Skip to main content

Functionality of Oxide based devices under Electric-field: Towards Atomic-resolution Operando Nanoscopy

Searching for OpenAIRE data...

Publications

Highly Accurate Analytic Modeling of Dispersive Field Distributions in MIM Capacitances With Electrodes Thinner Than Skin Depth

Author(s): Dominik Walk, Holger Maune, Daniel Kienemund, Patrick Salg, Lukas Zeinar, Aldin Radetinac, Leopoldo Molina-Luna, Philipp Komissinskiy, Lambert Alff, Rolf Jakoby
Published in: IEEE Transactions on Microwave Theory and Techniques, Issue 67/12, 2019, Page(s) 4665-4673, ISSN 0018-9480
DOI: 10.1109/tmtt.2019.2944622

Atomically interface engineered micrometer-thick SrMoO 3 oxide electrodes for thin-film Ba x Sr 1- x TiO 3 ferroelectric varactors tunable at low voltages

Author(s): P. Salg, D. Walk, L. Zeinar, A. Radetinac, L. Molina-Luna, A. Zintler, R. Jakoby, H. Maune, P. Komissinskiy, L. Alff
Published in: APL Materials, Issue 7/5, 2019, Page(s) 051107, ISSN 2166-532X
DOI: 10.1063/1.5094855

Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO 2 -based RRAM: Towards a Component Specific in situ TEM Investigation

Author(s): Alexander Zintler, Robert Eilhardt, Stefan Petzold, Nico Kaiser, Sharath Ulhas, Lambert Alff, Leopoldo Molina-Luna
Published in: Microscopy and Microanalysis, Issue 25/S2, 2019, Page(s) 1842-1843, ISSN 1431-9276
DOI: 10.1017/s1431927619009942

Analysis and simulation of the multiple resistive switching modes occurring in HfO x -based resistive random access memories using memdiodes

Author(s): S. Petzold, E. Miranda, S. U. Sharath, J. Muñoz-Gorriz, T. Vogel, E. Piros, N. Kaiser, R. Eilhardt, A. Zintler, L. Molina-Luna, J. Suñé, L. Alff
Published in: Journal of Applied Physics, Issue 125/23, 2019, Page(s) 234503, ISSN 0021-8979
DOI: 10.1063/1.5094864

Gradual reset and set characteristics in yttrium oxide based resistive random access memory

Author(s): Stefan Petzold, Eszter Piros, S U Sharath, Alexander Zintler, Erwin Hildebrandt, Leopoldo Molina-Luna, Christian Wenger, Lambert Alff
Published in: Semiconductor Science and Technology, Issue 34/7, 2019, Page(s) 075008, ISSN 0268-1242
DOI: 10.1088/1361-6641/ab220f

Resistive Switching: Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices (Adv. Electron. Mater. 10/2019)

Author(s): Stefan Petzold, Alexander Zintler, Robert Eilhardt, Eszter Piros, Nico Kaiser, Sankaramangalam Ulhas Sharath, Tobias Vogel, Márton Major, Keith Patrick McKenna, Leopoldo Molina‐Luna, Lambert Alff
Published in: Advanced Electronic Materials, Issue 5/10, 2019, Page(s) 1970054, ISSN 2199-160X
DOI: 10.1002/aelm.201970054

Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices

Author(s): Stefan Petzold, Alexander Zintler, Robert Eilhardt, Eszter Piros, Nico Kaiser, Sankaramangalam Ulhas Sharath, Tobias Vogel, Márton Major, Keith Patrick McKenna, Leopoldo Molina‐Luna, Lambert Alff
Published in: Advanced Electronic Materials, Issue 5/10, 2019, Page(s) 1900484, ISSN 2199-160X
DOI: 10.1002/aelm.201900484

Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion

Author(s): Leopoldo Molina-Luna, Shuai Wang, Yevheniy Pivak, Alexander Zintler, Héctor H. Pérez-Garza, Ronald G. Spruit, Qiang Xu, Min Yi, Bai-Xiang Xu, Matias Acosta
Published in: Nature Communications, Issue 9/1, 2018, Page(s) 1-8, ISSN 2041-1723
DOI: 10.1038/s41467-018-06959-8

Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier

Author(s): Eszter Piros, Stefan Petzold, Alexander Zintler, Nico Kaiser, Tobias Vogel, Robert Eilhardt, Christian Wenger, Leopoldo Molina-Luna, Lambert Alff
Published in: Applied Physics Letters, Issue 117/1, 2020, Page(s) 013504, ISSN 0003-6951
DOI: 10.1063/5.0009645

Role of Oxygen Defects in Conductive-Filament Formation in Y 2 O 3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy

Author(s): Eszter Piros, Martin Lonsky, Stefan Petzold, Alexander Zintler, S.U. Sharath, Tobias Vogel, Nico Kaiser, Robert Eilhardt, Leopoldo Molina-Luna, Christian Wenger, Jens Müller, Lambert Alff
Published in: Physical Review Applied, Issue 14/3, 2020, ISSN 2331-7019
DOI: 10.1103/physrevapplied.14.034029

Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching

Author(s): Stefan Petzold, Eszter Piros, Robert Eilhardt, Alexander Zintler, Tobias Vogel, Nico Kaiser, Aldin Radetinac, Philipp Komissinskiy, Eric Jalaguier, Emmanuel Nolot, Christelle Charpin‐Nicolle, Christian Wenger, Leopoldo Molina‐Luna, Enrique Miranda, Lambert Alff
Published in: Advanced Electronic Materials, Issue 6/11, 2020, Page(s) 2000439, ISSN 2199-160X
DOI: 10.1002/aelm.202000439

Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO 2 Based Memristors

Author(s): Robert Eilhardt, Alexander Zintler, Oscar Recalde, Déspina Nasiou, Stefan Petzold, Lambert Alff, Leopoldo Molina-Luna
Published in: Microscopy and Microanalysis, Issue 27/S1, 2021, Page(s) 1238-1239, ISSN 1431-9276
DOI: 10.1017/s1431927621004645