Innovative prediction of electronic system reliability
Reliability in electronic systems with a high degree of accuracy is crucial to ensure efficient performance. The EU-funded ABSREF project envisages predicting it. The project will introduce an innovative workload-dependent ageing-aware simulation framework that has acceptable run-time. This generic framework will enable the performance of system optimisation in presence of multiple ageing-related phenomena including negative and positive bias temperature instability, and hot carrier injection. The improved timing margin or guard band incurred by this flow is expected to contribute to further improving the speed, power and durability of electronic systems and to reduce costs.