The PolarNon project covered the development and testing of an automated polarimetric nonlinear microscope for quality control of materials in the semiconductor industry (Market segment I), and metallic or ceramic alloys in the aerospace industry (Market segment II). Our solution has emerged as a powerful technique to access a variety of material properties such as crystallographic structures, materials composition and ferroelectric domains organization. Thanks to its submicrometer spatial and polar resolution, nanoscale crystalline heterogeneities, invisible with conventional optical method, were revealed in various thin films and nanostructures. As multiphoton microscopy is a non-destructive, contact-free and surface sensitive characteristic technic, the PolarNon allows opening new possibilities to decrease the time and cost of new components and new materials development.
Starting from a research prototype, we adapted the hardware towards a ready-to-commercialize industrial prototype. In order to meet the requirements of our research and industrial partners, our original CCD camera has been replaced by a high speed and high sensitivity CMOS camera. In addition to that, a spectrometer has been implemented as a second detection system, increasing the measurement possibilities. Additional components such as an optical filters rotation system and an accurate power control unit were added and automated to make the user experience as comfortable as possible.
Besides the hardware solution, we upgraded the automation software with the intention of simplifying its handling. In addition, a sourcemeter has been coupled to the PolarNon software to allow automatic and flexible electric-field modulation of the sample. In order to facilitate the data analysis as much as possible, a data analysis application software was developed in addition to the automation software. With these tools, one can evaluate raw data in a convenient and effortless way while saving a precious time.
As one of the main outcome of the PoC project, we developed a large portfolio of industrial applications. Indeed, a variety of materials was studied, ranging from semiconductors as GaAs, InAs or SiC, to diverse metallic oxydes and hydroxydes, as well as ferroelectrics such as BaTiO3 or LiNbO3 for example. Therewith, our technology, and multiphoton microscopy in general, was proven to be a powerful, reliable and precise alternative to study materials characteristics as well as for getting insight about the quality of industrial samples.
