Descripción del proyecto
Un microscopio innovador podría mejorar considerablemente la tecnología de ensayos no destructivos
Los materiales constan de moléculas y compuestos complejos con distintas estructuras en 3D que afectan a sus propiedades. Las tecnologías ópticas no lineales aprovechan los cambios en las propiedades ópticas de los materiales ante la presencia de luz. Estas presentan un gran potencial para su uso en ensayos no destructivos, pero tienen dificultades técnicas relacionadas con los rígidos requisitos de muestreo y las condiciones de medición complejas. El proyecto PolarNon, financiado con fondos europeos, ha desarrollado un microscopio no lineal fácil de utilizar capaz de predecir la estructura de un material dentro de un dispositivo con una resolución de un solo píxel. Ahora, el equipo lo pasará del laboratorio a un prototipo industrial dirigido a las industrias aeroespacial y de semiconductores como sus primeros beneficiarios.
Objetivo
The analysis of materials is a key requirement for device quality control in medical, electronic and photonic industry. Currently, fluorescence imaging, electron microscopy and photoluminescence are typical tools for quality control in research and industry. However, they suffer from several limitations: complex samples preparation, special environments, destructive and time-consuming measurements. The development of new materials and components needs innovative approaches for fast and non-destructive testing (NDT). We propose to use nonlinear optical responses that are strongly dependent on material properties like crystal structure, defects and roughness for NDT. Despite the high potential of nonlinear optics in material sciences, the existing solutions are not convenient in terms of equipment, measurements methods, sample preparation and human resources costs.
We propose the implementation and testing of a fully automated polarimetric nonlinear microscope ‘PolarNon’ as a hardware and software solution for NDT and quality control of materials or optoelectronic components in the semiconductor industry (Market segment I), and metallic or ceramic alloys in the aerospace industry (Market segment II). The PolarNon system overcomes the limitations of current methods: it does not require special sample preparation or measurement conditions, like low temperatures, vacuum or ultrathin substrates, and it can characterize materials already incorporated in a device. The PolarNon includes a method of per-pixel analysis of optical images to reconstruct the material crystalline properties down to the pixel resolution. We already successfully applied this approach to several materials for predicting samples inner structure. This project allows us to build an industrial prototype for future commercialization and secure the invention to create an engineering start-up focused on the development of nonlinear optical microscopy tools for material analysis.
Ámbito científico
- engineering and technologymaterials engineeringcrystals
- natural sciencesphysical sciencesopticsmicroscopysuper resolution microscopy
- natural sciencesphysical sciencesopticsmicroscopyelectron microscopy
- natural sciencesphysical scienceselectromagnetism and electronicssemiconductivity
- natural sciencesphysical sciencesopticsnonlinear optics
Programa(s)
Régimen de financiación
ERC-POC-LS - ERC Proof of Concept Lump Sum PilotInstitución de acogida
8092 Zuerich
Suiza