SiC optical nano-strain-meters for pico-detection in Geosciences (SiC nano for picoGeo)

Resultado final

Stakeholders outreach activities.
Security on the perforation sites
Communication plan.

Communication plan.

Sites equipment, deep drillings, housing tests.
IPR management plan.

IIPR management plan.

Characterization report of the structural properties of the 3C-SiC layer
Determination of the testing sites.
Characterization report of the mechanical properties of the 3C-SiC layer.

SiC nano for pico Geo project webpage and logo.

Data management plan

Publicaciones

Real-time signal processing of high-precision borehole strainmeters at Mt. Etna for volcanic surveillance and eruptive events detection

Autores: L. Carleo, G. Currenti, A. Bonaccorso, A. Sicali
Publicado en: Il Nuovo Cimento C, 2022, ISSN 1826-9885
Editor: Società Italiana di Fisica
DOI: 10.1393/ncc/i2022-22185-5

Effect of N and Al Doping on 3C-SiC Stacking Faults

Autores: Cristiano Calabretta, Viviana Scuderi, Ruggero Anzalone, Annalisa Cannizzaro, Marco Mauceri, Danilo Crippa, Simona Boninelli, Francesco La Via
Publicado en: Materials Science Forum, Edición Vol. 1062, 2022, Página(s) 64-68, ISSN 1662-9752
Editor: Trans Tech Publications Ltd
DOI: 10.4028/p-s5v3jb

Impact of Nitrogen on the Selective Closure of Stacking Faults in 3C-SiC

Autores: Cristiano Calabretta, Viviana Scuderi*, Corrado Bongiorno, Annalisa Cannizzaro, Ruggero Anzalone, Lucia Calcagno, Marco Mauceri, Danilo Crippa, Simona Boninelli, and Francesco La Via
Publicado en: Crystal Growth & Design, 2022, ISSN 1528-7483
Editor: American Chemical Society
DOI: 10.1021/acs.cgd.2c00515

Impact of N Doping on 3C-SiC Defects

Autores: Cristiano Calabretta, Viviana Scuderi, Annalisa Cannizzaro, Ruggero Anzalone, Marco Mauceri, Danilo Crippa, Simona Boninelli, Francesco La Via
Publicado en: Materials Science Forum, Edición 1062, 2022, ISSN 1662-9752
Editor: Trans Tech Publications Ltd
DOI: 10.4028/p-54nqrc

Residual Stress Measurement by Raman on Surface-Micromachined Monocrystalline 3C-SiC on Silicon on Insulator

Autores: F. La Via, L. Belsito, M. Ferri S. Sapienza, A. Roncaglia, M. Zielinski, V. Scuderi
Publicado en: Material Science Forum, Edición 1062, 2022, ISSN 1662-9752
Editor: Trans Tech Publications Ltd
DOI: 10.4028/p-04623q

Emerging SiC Applications beyond Power Electronic Devices

Autores: Francesco La Via, Daniel Alquier, Filippo Giannazzo, Tsunenobu Kimoto, Philip Neudeck, Haiyan Ou, Alberto Roncaglia, Stephen E. Saddow and Salvatore Tudisco
Publicado en: Micromachines, 2023, ISSN 2072-666X
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/mi14061200

Correlation between Q-Factor and Residual Stress in Epitaxial 3C-SiC Double-Clamped Beam Resonators

Autores: Sergio Sapienza*, Matteo Ferri, Luca Belsito, Diego Marini, Marcin Zielinski, Francesco La Via, Alberto Roncaglia
Publicado en: Material Science Forum, 2023, ISSN 1662-9752
Editor: Scientifici.net
DOI: 10.4028/p-3g82bg

Measurement of Residual Stress and Young’s Modulus on Micromachined Monocrystalline 3C-SiC Layers Grown on <111> and <100> Silicon

Autores: Sergio Sapienza, Matteo Ferri, Luca Belsito, Diego Marini, Marcin Zielinski, Francesco La Via, Alberto Roncaglia
Publicado en: Micromachines, Edición 12/9, 2021, Página(s) 1072, ISSN 2072-666X
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/mi12091072

Explosive Paroxysmal Events at Etna Volcano of Different Magnitude and Intensity Explored through a Multidisciplinary Monitoring System

Autores: Sonia Calvari, Emilio Biale, Alessandro Bonaccorso, Andrea Cannata, Luigi Carleo, Gilda Currenti, Giuseppe Di Grazia, Gaetana Ganci, Adriana Iozzia, Emilio Pecora, Michele Prestifilippo, Mariangela Sciotto and Simona Scollo
Publicado en: Remote sensing, 2022, ISSN 2072-4292
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/rs14164006

Magma Migration at Shallower Levels and Lava Fountains Sequence as Revealed by Borehole Dilatometers on Etna Volcano

Autores: Alessandro Bonaccorso, Luigi Carleo, Gilda Currenti, Antonino Sicali
Publicado en: Frontiers in Earth Science, Edición 9, 2021, ISSN 2296-6463
Editor: Frontiers
DOI: 10.3389/feart.2021.740505

Vanadium Incorporation in 3C-SiC Epilayers and its Consequences for Electrical Properties of 3C-SiC Material

Autores: Marcin Zielinski, Marc Bussel, Catherine Moisson, Hugues Mank, Sylvain Monnoye, Marc Portail, Adrien Michon, Yvon Cordier
Publicado en: Materials Science Forum, Edición 1062, 2022, ISSN 1662-9752
Editor: Trans Tech Publications Ltd
DOI: 10.4028/p-10ru0j

Precise Control of Al Incorporation during CVD Growth of SiC Epilayers by Using Hydrogen Chloride

Autores: Marcin Zielinski, Marc Bussel, Hugues Mank, Sylvain Monnoye, Marc Portail, Adrien Michon, Yvon Cordier
Publicado en: Materials Science Forum, Edición 1062, 2022, ISSN 1662-9752
Editor: Trans Tech Publications Ltd
DOI: 10.4028/p-n5l77t

Near real-time filtering of high precision borehole strainmeter signals for volcano surveillance

Autores: Luigi Carleo, Alessandro Bonaccorso, Gilda Currenti and Antonino Sicali
Publicado en: Annals of Geophysics, 2022, ISSN 1593-5213
Editor: Editrice Compositori srl
DOI: 10.4401/ag-8787

Clustering of eruptive events from high-precision strain signals recorded during the 2020–2022 lava fountains at the Etna volcano (Italy)

Autores: Luigi Carleo, Gilda Currenti, and Alessandro Bonaccorso
Publicado en: Natural Hazards and Earth System Sciences, 2023, ISSN 1684-9981
Editor: EGU
DOI: 10.5194/nhess-23-1743-2023

Impact of Doping on Cross-Sectional Stress Assessment of 3C-SiC/Si Heteroepitaxy

Autores: Viviana Scuderi, Marcin Zielinski and Francesco La Via
Publicado en: Materials, 2023, ISSN 1996-1944
Editor: MDPI Open Access Publishing
DOI: 10.3390/ma16103824

Anatomy of a Paroxysmal Lava Fountain at Etna Volcano: The Case of the 12 March 2021, Episode

Autores: Sonia Calvari, Alessandro Bonaccorso, Gaetana Ganci
Publicado en: Remote Sensing, Edición 13/15, 2021, Página(s) 3052, ISSN 2072-4292
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/rs13153052

Evaluation of Strain in 3C-SiC/Si Epiwafers from X-Ray Diffraction Measurements

Autores: Marcin Zielinski, Marc Bussel, Hugues Mank, Sylvain Monnoye, Marc Portail, Adrien Michon Yvon Cordier, Viviana Scuderi, Francesco La Via
Publicado en: Defect and Diffusion Forum, 2023, ISSN 1662-9507
Editor: Scientific.net
DOI: 10.4028/p-jf4ooe

Resultado final

Publicaciones

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