Standard Delay Cells with Improved Tolerance to Single Event Transients
(se abrirá en una nueva ventana)
Autores:
M. Andjelkovic, C. Calligaro, O. Schrape , U. Gatti, F.A. Kuentzer, M. Krstic
Publicado en:
IEEE International Conference on Microelectronics, Edición 32nd, 329 (2021), 2021
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/miel52794.2021.9569110
Addressing Single-Event-Multiple-Transient Faults in Asynchronous RH-Click Controllers
(se abrirá en una nueva ventana)
Autores:
F. A. Kuentzer, C. Georgakidis, C. Sotiriou, M. Krstic
Publicado en:
Symposium on Integrated Circuits and Systems Design, Edición 36th (2023), 2023
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/sbcci60457.2023.10261666
Hardware/Software Co-Verifizierungsplattform für eingebettete Multiprozessoren
Autores:
Aleksandar Simevski and Milos Krstic
Publicado en:
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2020), Edición 32. GI / GMM / ITG - Workshop, 2020, Página(s) 29-30
Editor:
VDE Verlag GmbH
A CMOS 10-Bit 3MS/s Rad-Hard DAC Based on Resistor String Poly-Matrix
(se abrirá en una nueva ventana)
Autores:
C. Calligaro, U. Gatti
Publicado en:
IEEE International Conference on Microelectronics, Edición 32nd, 329 (2021), 2021
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/miel52794.2021.9569131