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Monolithic Multi-Junction Picosecond Avalanche Detector for future physics experiments and applications

Publications

Measurements and analysis of different front-end configurations for monolithic SiGe BiCMOS pixel detectors for HEP applications

Author(s): F. Martinelli, C. Magliocca, R. Cardella, E. Charbon, G. Iacobucci, M. Nessi, L. Paolozzi, H. Rücker, P. Valerio
Published in: Journal of Instrumentation, 2021, ISSN 1748-0221
Publisher: Institute of Physics
DOI: 10.1088/1748-0221/16/12/p12038

Efficiency and time resolution of monolithic silicon pixel detectors in SiGe BiCMOS technology

Author(s): G. Iacobucci, L. Paolozzi, P. Valerio, T. Moretti, F. Cadoux, R. Cardarelli, R. Cardella, S. Débieux, Y. Favre, D. Ferrere, S. Gonzalez-Sevilla, Y. Gurimskaya, R. Kotitsa, C. Magliocca, F. Martinelli, M. Milanesio, M. Münker, M. Nessi, A. Picardi, J. Saidi, H. Rücker, M. Vicente Barreto Pinto, S. Zambito
Published in: Journal of Instrumentation, 2021, ISSN 1748-0221
Publisher: Institute of Physics
DOI: 10.1088/1748-0221/17/02/p02019

Monolithic Picosecond Silicon Pixel Sensors for Future Physics: Experiments and Applications

Author(s): G. Iacobucci, L. Paolozzi, P. Valerio
Published in: IEEE Instrumentation & Measurement Magazine, 2021, ISSN 1094-6969
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/mim.2021.9620045

20 ps time resolution with a fully-efficient monolithic silicon pixel detector without internal gain layer

Author(s): S. Zambito, M. Milanesio, T. Moretti, L. Paolozzi, M. Munker, R. Cardella, T. Kugathasan, F. Martinelli, A. Picardi, M. Elviretti, H. Rücker, A. Trusch, F. Cadoux, R. Cardarelli, S. Débieux, Y. Favre, C.A. Fenoglio, D. Ferrere, S. Gonzalez-Sevilla, L. Iodice, R. Kotitsa, C. Magliocca, M. Nessi, A. Pizarro-Medina, J. Sabater Iglesias, J. Saidi, M. Vicente Barreto Pinto and G. Iacobucci
Published in: journal of instrumentation, 2023, ISSN 1748-0221
Publisher: Institute of Physics
DOI: 10.1088/1748-0221/18/03/p03047

A massively scalable Time-to-Digital Converter with a PLL-free calibration system in a commercial 130 nm process

Author(s): F. Martinelli, P. Valerio, R. Cardarelli, E. Charbon, G. Iacobucci, M. Nessi, L. Paolozzi
Published in: Journal of Instrumentation, 2021, ISSN 1748-0221
Publisher: Institute of Physics
DOI: 10.1088/1748-0221/16/11/p11023

Intellectual Property Rights

MULTI-JUNCTION PICO-AVALANCHE DETECTOR

Application/Publication number: 19 802143
Date: 2019-11-08

MULTI-JUNCTION PICO-AVALANCHE DETECTOR

Application/Publication number: 19 802143
Date: 2019-11-08
Applicant(s): UNIVERSITE DE GENEVE

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