Reduced Precision DWC: an Efficient Hardening Strategy for Mixed-Precision Architectures
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Author(s):
Fernandes dos Santos, Fernando
Brandalero, Marcelo
Sullivan, Michael
Martins Basso, Pedro
Hubner, Michael
CARRO, LUIGI
RECH, PAOLO
Published in:
IEEE Transactions on Computers, 2021, ISSN 0018-9340
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tc.2021.3058872
Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs
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Author(s):
Fernandes dos Santos, Fernando; Malde, Sujit; Cazzaniga, Carlo; Frost, Chris; Carro, Luigi; Rech, Paolo
Published in:
IEEE Transactions on Nuclear Science, 2022, ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2022.3141341
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits
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Author(s):
Samuel, Pagliarini
Luis, Benites
Mayler, Martins
RECH, PAOLO
Fernanda, Kastensmidt
Published in:
IEEE Transactions on Nuclear Science, 2021, ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3070643
High Energy and Thermal Neutrons Sensitivity of Google Tensor Processing Units
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Author(s):
Luiz Rech Junior, Rubens
Malde, Sujit
Cazzaniga, Carlo
Kastriotou, Maria
Letiche, Manon
Frost, Christopher
RECH, PAOLO
Published in:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2022, ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2022.3142092
Soft Error Effects on Arm Microprocessors: Early Estimations vs. Chip Measurements
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Author(s):
Bodman, Pablo; Papadimitriou, George; Rech, Rubens Luiz Junior; Gizopoulos, Dimitris; Rech, Paolo
Published in:
IEEE Transactions on Computers, 2022, ISSN 0018-9340
Publisher:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tc.2021.3128501