Boosting TalTech Capacity in Reliable and Efficient AI-Chip Design

Resultado final

Plan for the dissemination and exploitation, including communication

Plan for the dissemination and exploitation, including communication (a plan, implementation and conclusive analysis). It reports on activities in tasks T5.1, T5.2 and T5.3.

Report on upskilling staff in research management

Report on TAICHIP research management capacity development related to the progress of tasks:T3.1 Upskilling staff in project proposal preparation and project managementT3.3 Upgrading research management/administration unit

Initial techniques for optimization and implementation of AI-chips

"Report on initial research results achieved in tasks T4.3 ""Efficiency optimisation of processor-accelerator pair"" and T4.4 ""Reliable hardware implementation of AI chips""."

Initial techniques for open AI-accelerator and processor architectures

"Report on initial research results achieved in tasks T4.1 ""Advanced AI-accelerator architectures"" and T4.2 ""Open processor architectures""."

Report on TAICHIP networking for excellence in research

Report on TAICHIP networking for excellence in research related to the progress of tasks:T1.1 Short-term scientific missions and virtual meetings within the consortiumT1.2 TAICHIP training eventsT1.3 Advanced technical tutorials by invited external expertsT1.4 Joint supervision of students and postdocs

Publicaciones

IEEE Access

Autores: Dadmehr Rahbari, Masoud Daneshtalab, Maksim Jenihhin
Publicado en: IEEE Access, Edición 13, 2025, ISSN 2169-3536
Editor: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/ACCESS.2025.3576689

IEEE Transactions on Device and Materials Reliability

Autores: Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin
Publicado en: IEEE Transactions on Device and Materials Reliability, Edición 25, 2025, ISSN 1530-4388
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/TDMR.2024.3523386

European Test Symposium Teams: an Anniversary Snapshot

Autores: Jenihhin, Maksim; Raik, Jaan; Jutman, Artur; Cherezova, Natalia; Ubar, Raimund; Miclea, Liviu; Enyedi, Szilard; Stefan, Iulia; Stan, Ovidiu; Corches, Cosmina; Peng, Zebo; Eles, Petru; Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Glowatz, Andreas; Tille, Daniel; Gielen, Georges; Coyette, Anthony; Dobbelaere, Wim; Vanhooren, Ronny; Chuang, Po-Yao; Marinissen, Erik Jan; Di Natale, Giorgio; Barragan, Manuel; Maistri, Paolo; Mir, Salvador; Vatajelu, Ioana; Bernardi, Paolo; Di Carlo, Stefano; Prinetto, Paolo; Sonza Reorda, Matteo; Violante, Massimo; Stratigopoulos, Haralampos; Michael, Maria K.; Neophytou, Stelios; Hadjitheophanous, Stavros; Christou, Kyriakos A.; Skitsas, Michael; Bosio, Alberto; Deveautour, Bastien; Girard, Patrick; Traiola, Marcello; Virazel, Arnaud; Fernandes dos Santos, Fernando; Kritikakou, Angeliki; Casagranda, Giulia; Vallero, Marzio; Vella, Flavio; Rech, Paolo; Bolzani Poehls, Letícia Maria; Krstic, Milos; Andjelkovic, Marko; Vargas, Fabian Luis; Tshagharyan, Grigor; Harutyunyan, Gurgen; Vardanian, Valery; Shoukourian, Samvel K.; Zorian, Yervant; Dworak, Jennifer; Nepal, Kundan; Manikas, Theodore; Taouil, Motta; Fieback, Moritz; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Hamdioui, Said; Chatterjee, Abhijit; Saha, Anurup; Komarraju, Sri Gowri; Ma, Kwondo; Amarnath, Chandramouli; Tahoori, Mehdi B.; Mayahinia, Mahta; Rajabalipanah, Maryam; Basharkhah, Katayoon; Nosrati, Nooshin; Jahanpeima, Zahra; Navabi, Zainalabedin; Wunderlich, Hans-Joachim; Hellebrand, Sybille
Publicado en: 2025 IEEE European Test Symposium (ETS), 2025, ISSN 1558-1780
Editor: IEEE
DOI: 10.15480/882.15435

Investigating the Impact of Soft Errors in GPU-Accelerated Sparse DNNs

Autores: Ahmadilivani, Mohammad Hasan; Rodriguez Condia, Josie Esteban; Jenihhin, Maksim; Sonza Reorda, Matteo
Publicado en: 2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS), 2026, ISSN 2473-4667
Editor: IEEE
DOI: 10.5281/ZENODO.18432212

FORTALESA: Fault-tolerant reconfigurable systolic array for DNN inference

Autores: Natalia Cherezova, Artur Jutman, Maksim Jenihhin
Publicado en: Microprocessors and Microsystems, Edición 119, 2025, ISSN 0141-9331
Editor: Elsevier BV
DOI: 10.1016/J.MICPRO.2025.105222

An Efficient Architecture for Edge AI Federated Learning With Homomorphic Encryption

Autores: Dadmehr Rahbari, Masoud Daneshtalab, Maksim Jenihhin
Publicado en: 2025 IEEE Access, Edición 13, 2025, ISSN 2169-3536
Editor: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/ACCESS.2025.3576689

AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators

Autores: Mahdi Taheri; Natalia Cherezova; Samira Nazari; Ali Azarpeyvand; Tara Ghasempouri; Masoud Daneshtalab; Jaan Raik; Maksim Jenihhin
Publicado en: IEEE Transactions on Device and Materials Reliability, Edición 25, 2024, ISSN 1558-2574
Editor: IEEE Transactions on Device and Materials Reliability
DOI: 10.1109/TDMR.2024.3523386

AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators

Autores: Mahdi Taheri, Natalia Cherezova, Samira Nazari, Ali Azarpeyvand, Tara Ghasempouri, Masoud Daneshtalab, Jaan Raik, Maksim Jenihhin
Publicado en: IEEE Transactions on Device and Materials Reliability, Edición 25, 2025, ISSN 1530-4388
Editor: Institute of Electrical and Electronics Engineers (IEEE)
DOI: 10.1109/TDMR.2024.3523386

Late Breaking Results: Uncovering the Limits of ECCs in Vision Transformers and a Zero-Cost Reliability Enhancement

Autores: Ahmadilivani, Mohammad Hasan; Roots, Marten; Restifo, Marco; Loorits, Sven-Markus; di Mauro, Luca; Raik, Jaan
Publicado en: 2026
Editor: IEEE
DOI: 10.5281/ZENODO.18432121

DART: Input-Difficulty-AwaRe Adaptive Threshold for Early-Exit DNNs

Autores: Patne, Parth; Taheri, Mahdi; Herglotz, Christian; Jenihhin, Maksim; Krstic, Milos; Hübner, Michael
Publicado en: CoRR, 2026
DOI: 10.5281/ZENODO.18475467

AxEnMULT: Design of an Efficient and Reliable Approximate Encoding-Based Multiplier

Autores: Ahsan Rafiq, Alberto Bosio, Salvatore Pappalardo, Maksim Jenihhin
Publicado en: 2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2025
Editor: IEEE
DOI: 10.1109/ISVLSI65124.2025.11130248

Adaptive Fault Resilience for Early-Exit DNNs

Autores: Rama Mounika Kodamanchili, Natalia Cherezova, Mahdi Taheri, Maksim Jenihhin
Publicado en: 2025 IEEE International Test Conference in Asia (ITC-Asia), 2025, ISSN 2768-069X
Editor: IEEE
DOI: 10.5281/ZENODO.18462542

Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs

Autores: Selg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan
Publicado en: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2024, ISSN 2765-933X
DOI: 10.1109/DFT63277.2024.10753541

Reliability-Aware Performance Optimization of DNN HW Accelerators Through Heterogeneous Quantization

Autores: Samira Nazari, Mahdi Taheri, Ali Azarpeyvand, Mohsen Afsharchi, Christian Herglotz, Maksim Jenihhin
Publicado en: 2025 IEEE 26th Latin American Test Symposium (LATS), 2025
Editor: IEEE
DOI: 10.1109/LATS65346.2025.10963948

FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs

Autores: Samira Nazari, Mahdi Taheri, Ali Azarpeyvand, Mohsen Afsharchi, Tara Ghasempouri, Christian Herglotz, Masoud Daneshtalab, Maksim Jenihhin
Publicado en: 2024
Editor: Institute of Electrical and Electronics Engineers (IEEE)
DOI: 10.36227/techrxiv.173143099.94285566/v1

Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs

Autores: Hardi Selg, Konstantin Shibin, Anton Tsertov, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
Publicado en: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2024
Editor: IEEE
DOI: 10.1109/DFT63277.2024.10753541

FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs

Autores: Samira Nazari, Mahdi Taheri, Ali Azarpeyvand, Mohsen Afsharchi, Tara Ghasempouri, Christian Herglotz, Masoud Daneshtalab, Maksim Jenihhin
Publicado en: 2024 IEEE 33rd Asian Test Symposium (ATS), 2025
Editor: IEEE
DOI: 10.1109/ATS64447.2024.10915463

GENIE: GENetIc Algorithm-Based REliability Assessment Methodology for Deep Neural Networks

Autores: Samira Nazari, Mahdi Taheri, Ali Azarpeyvand, Mohsen Afsharchi, Christian Herglotz, Maksim Jenihhin
Publicado en: 2025 11th International Conference on Computing and Artificial Intelligence (ICCAI), 2025
Editor: IEEE
DOI: 10.1109/ICCAI66501.2025.00049

XMULT: An Energy-Efficient Design of Approximate Multiplier

Autores: Ahsan Rafiq, Maksim Jenihhin
Publicado en: 2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), 2025
Editor: IEEE
DOI: 10.1109/DSN-W65791.2025.00047

RL-Agent-based Early-Exit DNN Architecture Search Framework

Autores: Mahdi Taheri, Parth Patne, Natalia Cherezova, Ali Mahani, Christian Herglotz, Maksim Jenihhin
Publicado en: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2025
Editor: IEEE
DOI: 10.1109/DDECS63720.2025.11006795

Cross-Layer Co-Optimized LSTM Accelerator for Real-Time Gait Analysis

Autores: Ahmadilivani, Mohammad Hasan; Aksoy, Levent; Eslami, Mohamma; Raik, Jaan; Kuusik, Alar
Publicado en: CoRR, 2026
Editor: IEEE
DOI: 10.5281/ZENODO.18432024

Resultado final

Publicaciones

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