Power Semiconductor and Electronics Manufacturing 4.0

Project Information

SemI40

Grant agreement ID: 692466

DOI 10.3030/692466

Project closed

EC signature date 4 May 2016

Start date 1 May 2016

End date 30 April 2019

Funded under

• INDUSTRIAL LEADERSHIP - Leadership in enabling and industrial technologies - Information and Communication Technologies (ICT)

Total cost € 61 919 643,75

EU contribution € 12 227 386,14

Coordinated by

INFINEON TECHNOLOGIES AUSTRIA AG
Austria

Publications

Conference proceedings (66)

Multi-Loop Feedback Hierarchy Involving Human Workers in Manufacturing Processes

Author(s): Heimo Gursch, David Cemernek, Roman Kern
Published in: 2017
Publisher: Mensch und Computer Konferenz 2017

Black-box Identification of the Energy Efficiency Ratio of Water-cooled Chillers

Author(s): Federica Acerbi; Giuseppe De Nicolao; Cristina De Luca; Josef Obiltschnig; Patrick Richter
Published in: 2017
Publisher: Convegno Automatica.IT 2017 - SIDRA 2017

Continuous Flow Transport Scheduling for Conveyor-based AMHS in Wafer Fabs

Author(s): Clemens Schwenke; Klaus Kabitzsch
Published in: 2017
Publisher: Winter Simulation Conference 2017

Unified Frontend and Backend Industrie 4.0 Roadmap for Semiconductor Manufacturing

Author(s): Bernd Waschneck; Lee W. F. Brian; Koh C. W. Benny; Christopher Rippler; Gottfried Schmid
Published in: CEUR - Workshop Proceedings - Proceedings of the Workshop Papers of i-Know 2017 co-located with International Conference on Knowledge Technologies and Data-Driven Business 2017 (i-Know 2017), Issue Vol-2025, 2017
Publisher: CEUR Workshop Proceedings

Decision Support for Operational Excellence in Manufacturing Systems

Author(s): Andreas Felsberger, Bernhard Oberegger, Simon Reisinger, Gerald Reiner
Published in: CEUR - Workshop Proceedings - SamI40 – 2nd International Workshop on Science, Application and Methods in Industry 4.0, 2017
Publisher: CEUR Workshop Proceedings

Markov Random Fields for Pattern Extraction in Analog Wafer Test Data

Author(s): Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kaestner; Roman Kern
Published in: 2017
Publisher: IPTA 2017 - International Conference on Image Processing Theory, Tools & Applications

Eine Vorgehensweise zur Unterstützung der Einführung von Industrie 4.0 Technologien

Author(s): Manfred Rosenberger, Alexander Stocker
Published in: 2017
Publisher: Mensch und Computer Konferenz 2017

Understanding semiconductor produtcion with variational auto-encoders

Author(s): Tiago Santos, Roman Kern
Published in: 2018
Publisher: European Symposium on Artificial Neural Networks, Computational Intelligence and Machine Learning

Framework for a Closed Control Loop Between Supply Chain Segments and Production Line

Author(s): Dennis Bauer, Florian Maier, Bernd Waschneck
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

The granularity of the automated-generated long-term simulation model

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Author(s): Thomas Wagner, Germar Schneider, Klaus Kabitzsch
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Fab Simulation and Virtualization - The Key to Enhance the Fab Performance within the Semiconductor Industry

Author(s): Germar Schneider, Thomas Wagner , Jens Naake, Sebastian Rank, Frank Schulze
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Statistical KPI Forecast in Semiconductor Manufacturing

Author(s): Mike Gißrau, Lutz Muche
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

A Computationally Efficient 3D Mathematical Model of a Molybdenum Batch-Reheating Furnace

Author(s): Florian Roetzer, Alexander Aschauer, Andreas Steinboeck, Andreas Kugi
Published in: 2018
Publisher: 9th Vienna International Conference on Mathematical Modelling (Mathmod2018)

Product health assessment using patterns in semiconductor wafer test data

Author(s): Anja Zernig, Olivia Bluder, Andre Kästner
Published in: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Pilot line for advance process control with self-learning cross-process root cause analysis

Author(s): L. Custodio, Pedro Vasconcelos, Ricardo Gaio
Published in: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

APC of complex Bosch Process @ SPTS Rapier

Author(s): Lutz Eichhorn, Klick Michael
Published in: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Optimal Wafer Dispatching based on Dynamic Programming

Author(s): Alessio Mosca, Giuseppe De Nicolao, Germar Schneider, Torsten Niekisch, Davide Raimondo
Published in: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Unsupervised Wafermap Patterns Clustering via Variational Autoencoders

Author(s): Peter Tulala, Hamidreza Mahyar, Elahe Ghalebi, Radu Grosu
Published in: AMSC Proceedings, 2018
Publisher: AMSC

Opportunities and Challenges of Video and Video Comunication Technology in Smart Factories

Author(s): Rene Kaiser
Published in: Proceedings uDAYXVI - Assistenztechnologien in der Arbeitswelt, 2018
Publisher: uDAYXVI - Assistenztechnologien in der Arbeitswelt

How to measure the digital transformation along industrial value chains? Cases of the semiconductor industry

Author(s): Andreas Felsberger, Gerald Reiner
Published in: 2018
Publisher: 25th Annual EurOMA Conference

A comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data

Author(s): Stefan Schrunner, Olivia Bluder, Andre Kästner, Roman Kern
Published in: 2018
Publisher: 17th IEEE International Conference on Machine Learning and Applications 2018 (ICMLA)

Monitoring Industry 4.0 Applications for Security and Safety Standard Compliance

Author(s): Anic Bicaku, Christoph Schmittner, Markus Tauber, Jerker Delsing
Published in: Proceedings ICPS2018 - 1st IEEE Interrnational Conference on Industrial Cyber-Physical Systems, 2018
Publisher: ICPS2018 - 1st IEEE Interrnational Conference on Industrial Cyber-Physical Systems

Accuracy and robustness against covariate shift of water chiller models

Author(s): Federica Acerbi; Giuseppe De Nicolao; Josef Obiltschnig; Patrick Richter; Cristina de Luca
Published in: 2018
Publisher: 14th IEEE International Conference on Automation Science and Engineering

Application of IEC 62443 for IoT Components

Author(s): Abdelkader Shaaban, Erwin Kristen, Christoph Schmittner (AIT)
Published in: 2018
Publisher: "Safecomp 2018 - 37th Intrernation conference on computer safety, reliability & security - DECSoS 2018 - 13th International ERCIM/EWICS/ARTEMIS Workshop on ""Dependable Smart Embedded and Cyber-physical Systems and Systems-of-Systems""."

Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0

Author(s): Firooz B. Saghezchi, Georgios Mantas , Alireza Esfahani, Hassan Alizadeh, Joaquim Bastos and Jonathan Rodriguez
Published in: 2018
Publisher: The 9th International Conference on Broadband Communications, Newtorks and Systems - Broadnets 2018

Ein Industrie 4.0 Use Case in der Motorenproduktion

Author(s): Darko Stanislavjevic, Manfred Rosenberger, Gernot Lechner, Stefan Körner, Roman Kern, Bernd Jeitler, Alexander Stocker
Published in: 2018
Publisher: Mensch und Computer 2018 (MUC 2018)

Oppurtinities, Challenges and Use Cases of Digitization iwthin the Semiconductor Industry

Author(s): Germar Schneider, Sophia Keil, Gerhard Luhn
Published in: Proceedings ASMC 2018, 2018
Publisher: ASMC 2018

Queuing Network Modelling for improved Decision Support in Manufacturing Systems

Author(s): Andreas Felsberger, Boualem Rabta and Gerald Reiner
Published in: Proceedings of the 20th International Working Seminar on Production Economics, 2018
Publisher: 20th International Working Seminar on Production Economics

Digitalisierung zur Sicherstellung von Qualitätszielen in der Halbleiterindustrie

Author(s): Germar Schneider
Published in: 2018
Publisher: 10. Forum Technische Logistik

Towards Robust Visual Wafer Cleaning Anomaly Detection

Author(s): Romana Boiger, Gerfried Millner, Manfred Mücke, Bernat Zaragoza Travieso
Published in: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Stochastic Optimal Power Flow in islanded grids with renewable penetration, energy storage systems and possible curtailments

Author(s): Alessio Mosca, Davide. M. Raimondo
Published in: 2018
Publisher: IEEE CCTA 2018 - 2nd IEEE Conference on Control Technolog and Applications

Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins

Author(s): Markus Tauber, Christoph Schmittner
Published in: Special Issue ERCIM News 115, 2018
Publisher: ERCIM News 115

A new approach using characteristic video singals to improve the stability of manufacturing processes

Author(s): Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann, Romana Boiger, Manfred Muecke, Matthias Fehr, Dirk Motthes
Published in: 2018
Publisher: Digital Image Computing: Techniques and Applications

Towards Applying the Virtual Director Concept to 360 Degree Video Content

Author(s): Rene Kaiser
Published in: 2018
Publisher: ACM International Conference on Interactive Experiences for Television and online video: TVX360 Workshop

Lead time prediction using machine learning algorithms: A case study by a semiconductor manufacturer

Author(s): Lukas Lingitz, Viola Gallina, Fazel Ansari, David Gyulai (external), Andras Pfeiffer (external), Wilfried Sihn
Published in: Proceedings of the 51st CIRP Conference on Manufacturing Systems (CIRP CMS 2018), 2018
Publisher: 51st CIRP Conference on Manufacturing Systems (CIRP CMS 2018)

Optimization of global production scheduling with deep reinforcement learning

Author(s): Bernd Waschneck, Andre Reichstaller, Lenz Belzner, Thomas Altenmüller, Thomas Bauernhansl, Alexander Knapp, Andreas Kyek
Published in: 2018
Publisher: The 51st CIRP Conference on Manufacutring Systems

Deep Reinforcement Learning for Semiconductor Production Scheduling

Author(s): Bernd Waschneck, Andre Reichstaller, Lenz Belzner, Thomas Altenmüller, Thomas Bauernhansl, Alexander Knapp, Andreas Kyek
Published in: 2018
Publisher: ASMC 2018 SemI Advanced Semiconductor Manufacturing Conference

Case Study on Operator Compliance to Scheduling Decisions in Semiconductor Manufacturing

Author(s): Bernd Waschneck, Thomas Altenmüller, Thomas Bauernhansl, Andreas Kyek
Published in: 2018
Publisher: 14th IEEE International Conference on Automation Science and Engineering

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: 2018
Publisher: Winter Simulation Conference 2018

Identification of the Gordon-Ng Chiller Model: Linear to Nonlinear Least Squares?

Author(s): Federica Acerbi, Giuseppe De Nicolao
Published in: 2018
Publisher: ETFA 2018 - IEEE 23rd International Conference on Emerging Technologies and Factory Automation

SemI40 - Simulationsmodelle in der Halbleiterindustrie: Modellierung so detailliert wie nötig und so einfach wie möglich

Author(s): Sebastian Rank
Published in: 2018
Publisher: 10. Forum Technische Logistik

An analysis of improvement potentials and impacts of digitalization on manufacturing performance

Author(s): Andreas Felsberger, Christian Wankmüller, Bernhard Oberegger, Gernot Lechner, Gerald Reiner
Published in: 2019
Publisher: EUROMA 2019 Conference

Collaborating in a Research and Development Project: Knowledge Protection Practices applied in a Co-opetitive Setting

Author(s): Rene Kaiser, Stefan Thalmann, Viktoria Pammer-Schindler, Angela Fessl
Published in: 2019
Publisher: 10th Conference Professional Knowledge Management, Data-Driven Knowledge Management workshop

Knowledge Protection Practices in a Data-Centric Collaborative Research and Innovation Project

Author(s): Rene Kaiser
Published in: 2019
Publisher: WM 2019

Self-Adaptation Applied to MQTT via GAMF

Author(s): Silia Maksuti, Oliver Schluga, Giuseppe Settanni, Markus Tauber, Jerker Delsnig
Published in: 2019
Publisher: IEEE International Conference on Industtrial Technology

Security Safety and Organizational Standard Compliance in CPS

Author(s): Ani Bicaku, Christoph Schmittner, Patrick Rottmann, Markus Tauber, Jerker Delsnig
Published in: Issue in Infocommunications Journal XI(I):2, 2019
Publisher: Infocommunications Journal XI(I):2

Current state of digitalization in the European Electronic Components and Systems Industry: A multiple-case study analysis

Author(s): Andreas Felsberger, Christian Wankmüller, Gerald Reiner, Alexander Stocker, Gernot Lechner, Marius Lütkemeyr, Alessandro Sala
Published in: 2019
Publisher: Euroma2019 Conference

Safety & Security für M2M Kommunikation

Author(s): Schmittner, Christoph; Schoitsch, Erwin
Published in: Issue 1, 2016
Publisher: Konferenz der Mechatronik-Plattform: Smart Factory
DOI: 10.5281/zenodo.183187

A Review of Decision Support Systems for Manufacturing Systems

Author(s): Felsberger, Andreas; Oberegger, Bernhard; Reiner, Gerald
Published in: CEUR- Workshop Proceedings, Issue Vol-1793, 2017
Publisher: CEUR-WS.org
DOI: 10.5281/zenodo.495120

A Review of Related Work on Machine Learning in Semiconductor Manufacturing and Assembly Lines

Author(s): Stanisavljevic, Darko; Spitzer, Michael
Published in: CEUR-Workshop Proceedings, Issue VOl-1793, 2017
Publisher: CEUR-WS.org
DOI: 10.5281/zenodo.495135

A Literature Survey of Early Time Series Classification and Deep Learning

Author(s): Santos, Tiago; Kern, Roman
Published in: CEUR-Worksop Proceedings, Issue Vol-1793, 2017
Publisher: CEUR-WS.org
DOI: 10.5281/zenodo.495150

Production Scheduling in Complex Job Shops from an Industrie 4.0 Perspective: A Review and Challenges in the Semiconductor Industry

Author(s): Waschneck, Bernd; Bauernhansl, Thomas; Altenmüller, Thomas; Kyek, Andreas
Published in: CEUR Workshop Proceedings, Issue Vol-1793, 2017
Publisher: CEUR-WS.org
DOI: 10.5281/zenodo.495155

The impact of Industry 4.0 on Sustainable Supply & Value Chain Management: A meta analysis

Author(s): Felsberger, A.; Reiner, G.
Published in: 2017
Publisher: EurOMA2017

Security Viewpoint in a Reference Architecture Model For Cyber-Physical Production Systems

Author(s): Ma, Z.; Hudic, A.; Shaaban, A.; Plosz, S.
Published in: 2017
Publisher: EuroS&P 2017

Towards Trustworthy End-to-End Communication in Industry 4.0

Author(s): Maksuti, S.; Bicaku, A.; Tauber, M.; Palkovits-Rauter, S.; Matischek, R.; Schmittner, C.; Mantas, G.; Thron, M.; Delsing; J.
Published in: 2017
Publisher: INDIN2017

Secured Offline Authentication on Industrial Mobile Robots using Biometric Data

Author(s): Haas, S.; Ulz, T.; Steger, C.; Matischek, R.
Published in: 2017
Publisher: Robocup2017

A conceptual model for developing a smart process control system

Author(s): Weihrauch, D.; Schindler, P. A.; Sihn, W.
Published in: 2017
Publisher: Elsevier B. V./CIRP Proceedings

An Efficient Algorithm for Scheduling a Flexible Job Ship with Blocking and No-Wait Constraints

Author(s): Aschauer, A.; Roetzer, F.; Steinboeck, A.; Kugi, A.
Published in: 2017
Publisher: IFAC2017

Nonlinear Characterization of Activity Dynamics in Online Collaboration Websites

Author(s): Santos, T.; Walk, S.; Helic, D.
Published in: 2017
Publisher: WWW 2017

Concept and possible application of an automated framework to influence production dispatch based on supply chain events

Author(s): Bauer, D.; Maier, F.; Bauernhansl, T.; Ponsignon, T.; Waschneck, B.; Oberegger, B.; Felsbeger, A.; Reiner, G.
Published in: 2017
Publisher: IESM 2017

Black-box Identification for Efficient Chiller Management in a Semiconductor plant

Author(s): Acerbi, F.; De Nicolao, G.; Raimondo, D.; Obiltschnig, J.; Richter, P.; De Luca, C.
Published in: 2017
Publisher: APC/M

ENISA Based Evaluation of IaaS-Cloud Backend for Industry 4.0

Author(s): Bauer, Elisabeth; Bicaku, Ani; Schluga, Oliver; Tauber, Markus; Maksuti, Silia
Published in: 2017
Publisher: ACM AsiaCCS´17

Accessing Industrial Autonomous Robots: A Secured Authentication Approach

Author(s): Haas, S.; Steger, C.; Matischek, R.
Published in: 2017
Publisher: ICIT 2017

Towards Flexible ans Secure End-to-End Communication in Industry 4.0

Author(s): Maksuti, S.; Bicaku, A.; Tauber, M.; Palkovits-Rauter, S.; Haas, S.; Delsing, J.
Published in: 2017
Publisher: INDIN2017

Advanced Automation of Decision Making Process Flows of Manufacturing Support Processes in the High Tech Industry

Author(s): Schneider, G.; Keil, S.; Lasch, R.
Published in: 2017
Publisher: APC/M 2017

Other (63)

Towards Robust Visual Wafer Cleaning Anomaly Detection

Author(s): Romana Boiger, Thomas Haenselmann, Manfred Mücke, Frederic Ringsleben
Published in: 2017
Publisher: iKNOW 2017

Power Semiconductor and Electronics Manufacturing 4.0

Author(s): Cristina De Luca
Published in: 2017
Publisher: EFECS 2017

Applicability and robustness of ICA for semiconductor data

Author(s): Anja Zernig
Published in: 2017
Publisher: IKNOW 2017

SemI40 - Project Description - Success Stories

Author(s): Cristina De Luca
Published in: 2017
Publisher: ECSEL Austria - Success Stories 2017

Recent advancements in the automation of CVD reactors for the epitaxial deposition of SI and SIC: snyergy between modeling and experiments

Author(s): Carlo Cavalloti, Danilo Crippa
Published in: 2017
Publisher: ICG2017 - Italian Crystal Growth Conference: materials and methods in crystal growth

SAMI40 Workshop at i-KNOW 2017 - a Recap

Author(s): Rene Kaiser, Roman Kern, Alexander Stocker
Published in: 2018
Publisher: KNOW Center

SemI40 & Productive 4.0 Different but Complementary

Author(s): Cristina De Luca
Published in: 2018
Publisher: Productive 4.0 the Lighthouse Industry 4.0 & Interaction Session

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Author(s): Thomas Wagner, Germar Schneider, Klaus Kabitzsch
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Enabling Standard Compliance in Industry 4.0

Author(s): Ani Bicaku
Published in: 2018
Publisher: CPS Summer School 2018

User Day Systema - Status Infineon Technologies Dresden

Author(s): Germar Schneider, Wolfgang Scholl
Published in: 2018
Publisher: Infineon fab wide workshop at Systema

Towards Robust Visual Wafer Cleaning Anomaly Detection

Author(s): Romana Boiger, Gerfried Millner, Manfred Mücke, Bernat Zaragoza Travieso
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

SAMI40 Workshop at i-KNOW 2017 - a Recap

Author(s): Rene Kaiser, Roman Kern, Alexander Stocker
Published in: Issue IKNOW2017, 2017
Publisher: IKNOW2017

Fab Simulation and Virtualization - The Key to Enhance the Fab Performance within the Semiconductor Industry

Author(s): Germar Schneider, Thomas Wagner, Jens Naake, Sebastian Rank, Frank Schulze
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Newsletter SemI40

Author(s): all WP leaders
Published in: 2018
Publisher: www.semi40.eu

Opportunities, Challenges and Use Cases of Digitization within the Semiconductor Industry

Author(s): Germar Schneider, S. Keil, G Luhn
Published in: 2018
Publisher: ASMC 2018 SemI Advanced Semiconductor Manufacturing Conference

Framework for a Closed Control Loop Between Supply Chain Segments and Production Line

Author(s): Dennis Bauer, Florian Maier, Bernd Waschneck
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Simulation-assisted decision making for supply chain disruptions in production control

Author(s): Dennis Bauer, Andreas Schlereth, Florian Maier
Published in: 2018
Publisher: Winter Simulation Conference 2018

Investigation of multi-run Independent Component Analysis on simulated semiconductor data

Author(s): Anja Zernig
Published in: 2018
Publisher: ENBIS-18: 18th Annual Conference of the European Network for Business and Industrial Statistics

Inter-Device Sensor-Fusion for Action Authorization on Industrial Mobile Robots

Author(s): Sarah Haas, Anrea Höller, Thomas ULZ, Christian Steger
Published in: 2018
Publisher: 37th International Conference on Computer Safety, Reliability & Security (Safecomp2018)

On-Line Screening of a Chemical-Machine Wafer Cleaning Process Based on Ordinal Measure

Author(s): Bernat Zaragoza Travieso, Christoph Gaisberger, Manfred Mücke, Matthias Fehr
Published in: 2019
Publisher: APCM Europe Conference 2019

SemI40 Project Poster

Author(s): Cristina De Luca
Published in: 2018
Publisher: EFECS 2018

Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0

Author(s): Firooz B. Saghezchi, Georgios Mantas, Alireza Esfahani, Hassan Alizadeh, Joaquim Bastos, Jonathan Rodriguez
Published in: 2018
Publisher: The 9th International Conference on Broadband Communications, Newtorks and Systems - Broadnets 2018

Estimating wafer chuck angular velocity from video data

Author(s): Romana Boiger, Matthias Fehr, Gerfried Millner, Manfred Mücke
Published in: 2019
Publisher: APCM Europe Conference 2019

Product health assessment using patterns in semiconductor wafer test data

Author(s): Anja Zernig
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Data Science along the semiconductor frontend production

Author(s): Anja Zernig, Stefan Schrunner, Martin Pleschberger
Published in: 2018
Publisher: Statistische Woche 2018

Digitalization to Assure Quality Targets within the Semiconductor Industry

Author(s): Germar Schneider
Published in: 2018
Publisher: 10. Forum Technische Logistik

Cybersecurity Attacks in Semiconductor Supply Chain Environment

Author(s): Alireza Esfahani, Georgios Mantas, Firooz B. Saghezchi, Joaquim Bastos, Jonathan Rodriguez
Published in: 2019
Publisher: APCM Europe Conference 2019

The granularity of the automated-generated long-term simulation model

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: 2018
Publisher: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Security Compliance Verification in Cyber Physical Systems

Author(s): Ani Bicaku
Published in: 2018
Publisher: European Cybersecurity month

Continuous Security Compliance Verification in Industry 4.0

Author(s): Markus Tauber
Published in: 2018
Publisher: Workshop Cybersecurity for Manufacturing Environments

Bestimmung von Objektparametern aus industriellen Bildern mit neuronalen Netzwerken

Author(s): Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
Published in: 2018
Publisher: NWK2018 - Nachwuchswissenschaftlerkonferenz

Secured Action Authorization for Industrial Mobile Robots

Author(s): Sarah Haas, Thoams ULZ, Christian Steger
Published in: 2018
Publisher: 1st IEEE International Conference on Industrial Cyber-Physical Systems (ICPS2018)

Transfer of Run-to-Run-Control to Production Control Level in Semiconductor Front-End

Author(s): Dennis Bauer, Florian Maier, Andreas Schlereth
Published in: 2019
Publisher: APCM Europe Conference 2019

Job-shop scheduling with optimal inclusion of work-free night shifts

Author(s): Alexander Aschauer, Florian Rötzer, Andreas Steinboeck, Andreas Kugi, Michael Eidenberger-Schober, Gernot Reichl
Published in: 2019
Publisher: APCM Europe Conference 2019

Physics and chemistry behind plasma chamber conditioning for predictive maintenance

Author(s): Michael Klick, Dirk Suchland, Lutz Eichhorn
Published in: 2019
Publisher: APCM Europe Conference 2019

An impact evaluation approach for smart factory cases

Author(s): Andreas Felsberger, Gerald Reiner, Marius Lütkemeyer, Alessandro Sala, Alexander Stocker, Gernot Lechner
Published in: 2019
Publisher: APCM Europe Conference 2019

On-the-fly camera software solution for automatic perspective recognition of structured surfaces

Author(s): Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
Published in: 2019
Publisher: APCM Europe Conference 2019

Evaluation of Visual Decision Support Systems used in Semiconductor Industry

Author(s): Manuela Rauch, Alexander Gaal, Ilija Simic, Vedran Sabol
Published in: 2019
Publisher: APCM Europe Conference 2019

A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

Author(s): Alessio Mosca, Cristina De Luca, Davide Raimondo
Published in: 2019
Publisher: APCM Europe Conference 2019

Application Study of Hardware-Based Security for Future Industrial IOT

Author(s): Rainer Matischek and Benjamin Bara
Published in: 2019
Publisher: Euromicro Conference on Digital System Design

Simulation-assisted decision making for supply chain disruptions in production control

Author(s): Andreas Schlereth; Thomas Ponsignon, Axel Bruns, Dennis Bauer, Florian Maier
Published in: 2019
Publisher: EURO2019 Conference

Machine Learning Techniques for Automated Wafer Assessment using Wafer Test Data

Author(s): Anja Zernig, Stefan Schrunner, Martin Pleschberger, Michael Scheiber, Anna Jenul, Andre Kästner
Published in: 2019
Publisher: APCM Europe Conference 2019

Impact of Test Wafers in the Transportation System of a Semiconductor Factory

Author(s): David Wittwer, Sebastian Rank, Thorsten Schmidt
Published in: 2019
Publisher: APCM Europe Conference 2019

Continuous Standard Compliance Verification in SemI40

Author(s): Ani Bicaku, Markus Tauber, Christoph Schmittner
Published in: 2018
Publisher: APCM Europe Conference 2019

Die große Wirkung der kleinsten Teile

Author(s): Manfred Mücke
Published in: 2019
Publisher: Kurier 2019

Detection of adhesive film residues during wafer demounting

Author(s): Robert Muhr, Wolfgang Gratzer, Matthias Fehr, Germar Schneider
Published in: 2019
Publisher: APCM Europe Conference 2019

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: 2019
Publisher: Winter Simulation Conference 2019

An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data

Author(s): Anna Jenul, Stefan Schrunner, Anja Zernig, Andre Kaestner, Jürgen Pilz
Published in: 2019
Publisher: APCM Europe Conference 2019

Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells

Author(s): Mario Thron, Thomas Bangemann, Silia Maksuti, Ani Bicaku, Markus Tauber
Published in: 2019
Publisher: APCM Europe Conference 2019

Robustness against Covariate Shift of Water Chiller Models for Optimal Energy Management in a SM plant

Author(s): Federica Acerbi, Giuseppe De Nicolao, Josef Obiltschnig, Patrick Richter, Cristina De Luca
Published in: 2019
Publisher: APCM Europe Conference 2019

The impact of digital technologies on manufacturing performance: A simulation modelling approach

Author(s): Andreas Felsberger, Bernhard Oberegger, Christian Wankmüller, Gernot Lechner, Gerald Reiner
Published in: 2019
Publisher: EURO 2019 Conference

Networking the APC-Systems into a Fab Software Landscape

Author(s): Andreas Feustel, Mike Schneider
Published in: 2019
Publisher: APCM Europe Conference 2019

Systemdynamik-Ansätze zur Optimierung der PPS

Author(s): Dennis Bauer, Andreas Schlereth, Thomas Bauernhansl
Published in: 2019
Publisher: wt Werkstattstechnik online Ausgabe 4/2019

Machine Learning for Network-based Intrusion Detection in Industry 4.0

Author(s): Firooz B. Saghezchi, Georgios Mantas, Alireza Esfahani, Joaquim Bastos, Jonatahn Rodriguez
Published in: 2019
Publisher: APCM Europe Conference 2019

Interactive Stack Wafer Map with Feature Selection Capabilities

Author(s): Marcel Kunick, Peter Czerner
Published in: 2019
Publisher: APCM Europe Conference 2019

Photoresist Dispense Detection

Author(s): Yvonne Bergmann, Alexander Grosser
Published in: 2019
Publisher: APCM Europe Conference 2019

An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps

Author(s): Bernhard Geiger, Stefan Schrunner, Roman Kern
Published in: 2019
Publisher: APCM Europe Conference 2019

Continous Security Compliance Verfication in Industry 4.0

Author(s): Markus Tauber, Ani Bicaku
Published in: 2019
Publisher: Artemis Technology Conference 2019

Dimension Reduction using Feature Selection for Root Cause Analysis

Author(s): Peter Czerner, Christian Weber
Published in: 2019
Publisher: APCM Europe Conference 2019

SemI40 & Productive4.0 ECSEL JU Projects (2016-2020)

Author(s): De Luca, C.; Hufeld K.
Published in: 2017
Publisher: DeCPS

Qualitätsüberwachung und Machinen_Diagnose mittels Big Data Analyse

Author(s): Schmeja, M.; von Falck, G.; Jeitler, B.
Published in: 2016
Publisher: "Fachkongress ""Industrial Analytics & Big Data in der Automobilindustrie"

Image based wafer defect analysis

Author(s): Ringsleben, F.; Haenselmann, T.
Published in: 2017
Publisher: Hochschule Mittweida

Industrial IoT Security: A Survey

Author(s): Haas, S.; Ulz, T.; Matischek, R.; Steger, C.
Published in: 2017
Publisher: ACM AsiaCSS´17

Thesis and dissertations (9)

Implementing Self-Adaptability for Industry 4.0 Environments in Private Clouds

Author(s): Oliver Schluga
Published in: 2017
Publisher: FH Burgenland

Test Pattern Extraction for Semiconductor Wafer Test Data

Author(s): Vedo Alagic
Published in: University library Klagenfurt, 2017
Publisher: KAI Austria, University of Klagenfurt

Towards a Security Framework for the Semiconductor Supply Chain Environment

Author(s): Mariana Alexandra de Barcelos
Published in: Library Instituto de Telecomunicaos, Universidad Aveiro, 2017
Publisher: Instituto de Telecomunicaos, Universidad Aveiro

Monitoring and Standards Compliant Measurements in Industry 4.0

Author(s): Patrick Rottmann
Published in: 2018
Publisher: Fachhochschule Burgenland

Aufbau eines Modells zur ereignisgetriebenen Produktionssteuerung

Author(s): Andreas Schlereth
Published in: 2018
Publisher: Karlsruher Institut für Technologie - IFL

Statistische Prozesskontrolle als Entscheidungshilfe und Kontrollmethode für die Produktionsprogrammplanung in der Halbleiterindustrie

Author(s): Andreas Lausegger (UNI-KLU)
Published in: 2018
Publisher: Universität Klagenfurt

Intensity Quanitification of Process Patterns in Wafer Test Data

Author(s): Anna Jenul (Student), Jürgen Pilz (Supervisor UNI-KLU)
Published in: 2019
Publisher: Master Thesis at University of Klagenfurt

Design and Implementation of IIoT Demonstrators using Hardware Security Extensions

Author(s): Benjamin Bara
Published in: 2019
Publisher: Master Thesis TU GRAZ

Evaluation of open source monitoring tools in the cloud and IoT with focus on authentication and security incidents

Author(s): Michael Reinl - FH Burgerland
Published in: 2017
Publisher: FH Burgerland

Non-peer reviewed articles (2)

An Efficient Web Authentication Mechanism Preventing Man-In-The-Middle Attacks in Industry 4.0 Supply Chain

Author(s): Alireza Esfahani, Georgios Mantas, Jose Ribeiro, Joaquim Bastos, Shahid Mumtaz, Manuel A. Violas, A. Manuel De Oliveira Duarte, Jonathan Rodriguez
Published in: IEEE Access, Issue 7, 2019, Page(s) 58981-58989, ISSN 2169-3536
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/access.2019.2914454

Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model

Author(s): Tiago Santos, Stefan Schrunner, Bernhard C. Geiger, Olivia Pfeiler, Anja Zernig, Andre Kaestner, Roman Kern
Published in: IEEE Transactions on Semiconductor Manufacturing, Issue 32/2, 2019, Page(s) 190-198, ISSN 0894-6507
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tsm.2019.2911061

Book chapters (19)

Cycle Time Prediction with Machine Learning in the Wafer Production

Author(s): Lukas Lingitz, Vciola Gallin, Pedro Vasconceles
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Generic on-line video anomaly detection for cmp wafer cleaning

Author(s): Bernat Zaragoza Travieso, Manfred Mücke, Matthias Fehr
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Key elements of productivity enhancement in semiconductor manufacturing usig digitalization and fab simulation

Author(s): Germar Schneider, Thomas Wagner, Sebastian Rank, Frank Schulze
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Video-Supported real-time analysis of products and manufacturing processes

Author(s): Frederic Ringsleben and Thomas Haenselmann
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Continuous Compliance in Cyber Physical Systems

Author(s): Ani Bicaku, Markus Tauber, Christoph Schmittner
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

MES Challenges

Author(s): Mario Cordeiro, Nuno Vitorino, Pedro Gama, Joao Cortez, Augusto Vilarinho
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Author(s): Thomas Wagner, Germar Schneider
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Automated-generated long term Simulation model in semiconductor manufacturing

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Automated Framework to Influence Production Dispatch Based on Supply Chain Events

Author(s): Dennis Bauer, Andreas Schlereth, Florian Maier, Thomas Ponsignon, Bernd Waschneck
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

Author(s): Alessio Mosca, Cristina De Luca, Davide Raimondo
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterprise?

Author(s): Gerhard Luhn, Johaness Postel, Lutz Muche, Philipp Kopp, Germar Schneider
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Machine Learning and Automated Decision Making

Author(s): Anja Zernig, Ashwini Pandeshwar
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

"Tasks and Results of Work Package ""Swarm Intelligence"" "

Author(s): Karli Hatzschmann, Germar Schneider
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Easy Sensor integration in industrial environments

Author(s): Yvonne Bergmann, Florian Tripon
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Capturing Industry 4.0 Use Cases for interdisciplinary implementation teams

Author(s): Manfred Rosenberger, Alexander Stocker
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Machine Learning algorithms for advanced process control in the semiconductor industry

Author(s): Felix Kamhuber (FHA), Alessandro Chiancone (KNOW)
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Semiconductor Research Roadmap

Author(s): Alessandro Sala, Marius Lütkemeyer, Andreas Felsberger
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Impact of Test Wafers in the Transportation System of a Semiconductor Factory

Author(s): David Wittwer, Sebastian Rank, Thorsten Schmidt
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book

Identification of chiller models for HVAC Management: Classical VS Machine Learning Techniques

Author(s): Federica Acerbi, Giuseppe De Nicolao
Published in: Article in SemI40 Book, 2019
Publisher: SemI40 Book