Power Semiconductor and Electronics Manufacturing 4.0

Multi-Loop Feedback Hierarchy Involving Human Workers in Manufacturing Processes

Autorzy: Heimo Gursch, David Cemernek, Roman Kern
Opublikowane w: 2017
Wydawca: Mensch und Computer Konferenz 2017

Black-box Identification of the Energy Efficiency Ratio of Water-cooled Chillers

Autorzy: Federica Acerbi; Giuseppe De Nicolao; Cristina De Luca; Josef Obiltschnig; Patrick Richter
Opublikowane w: 2017
Wydawca: Convegno Automatica.IT 2017 - SIDRA 2017

Continuous Flow Transport Scheduling for Conveyor-based AMHS in Wafer Fabs

Autorzy: Clemens Schwenke; Klaus Kabitzsch
Opublikowane w: 2017
Wydawca: Winter Simulation Conference 2017

Unified Frontend and Backend Industrie 4.0 Roadmap for Semiconductor Manufacturing

Autorzy: Bernd Waschneck; Lee W. F. Brian; Koh C. W. Benny; Christopher Rippler; Gottfried Schmid
Opublikowane w: CEUR - Workshop Proceedings - Proceedings of the Workshop Papers of i-Know 2017 co-located with International Conference on Knowledge Technologies and Data-Driven Business 2017 (i-Know 2017), Numer Vol-2025, 2017
Wydawca: CEUR Workshop Proceedings

Decision Support for Operational Excellence in Manufacturing Systems

Autorzy: Andreas Felsberger, Bernhard Oberegger, Simon Reisinger, Gerald Reiner
Opublikowane w: CEUR - Workshop Proceedings - SamI40 – 2nd International Workshop on Science, Application and Methods in Industry 4.0, 2017
Wydawca: CEUR Workshop Proceedings

Markov Random Fields for Pattern Extraction in Analog Wafer Test Data

Autorzy: Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kaestner; Roman Kern
Opublikowane w: 2017
Wydawca: IPTA 2017 - International Conference on Image Processing Theory, Tools & Applications

Eine Vorgehensweise zur Unterstützung der Einführung von Industrie 4.0 Technologien

Autorzy: Manfred Rosenberger, Alexander Stocker
Opublikowane w: 2017
Wydawca: Mensch und Computer Konferenz 2017

Understanding semiconductor produtcion with variational auto-encoders

Autorzy: Tiago Santos, Roman Kern
Opublikowane w: 2018
Wydawca: European Symposium on Artificial Neural Networks, Computational Intelligence and Machine Learning

Framework for a Closed Control Loop Between Supply Chain Segments and Production Line

Autorzy: Dennis Bauer, Florian Maier, Bernd Waschneck
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

The granularity of the automated-generated long-term simulation model

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Autorzy: Thomas Wagner, Germar Schneider, Klaus Kabitzsch
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Fab Simulation and Virtualization - The Key to Enhance the Fab Performance within the Semiconductor Industry

Autorzy: Germar Schneider, Thomas Wagner , Jens Naake, Sebastian Rank, Frank Schulze
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Statistical KPI Forecast in Semiconductor Manufacturing

Autorzy: Mike Gißrau, Lutz Muche
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

A Computationally Efficient 3D Mathematical Model of a Molybdenum Batch-Reheating Furnace

Autorzy: Florian Roetzer, Alexander Aschauer, Andreas Steinboeck, Andreas Kugi
Opublikowane w: 2018
Wydawca: 9th Vienna International Conference on Mathematical Modelling (Mathmod2018)

Product health assessment using patterns in semiconductor wafer test data

Autorzy: Anja Zernig, Olivia Bluder, Andre Kästner
Opublikowane w: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Pilot line for advance process control with self-learning cross-process root cause analysis

Autorzy: L. Custodio, Pedro Vasconcelos, Ricardo Gaio
Opublikowane w: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

APC of complex Bosch Process @ SPTS Rapier

Autorzy: Lutz Eichhorn, Klick Michael
Opublikowane w: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Optimal Wafer Dispatching based on Dynamic Programming

Autorzy: Alessio Mosca, Giuseppe De Nicolao, Germar Schneider, Torsten Niekisch, Davide Raimondo
Opublikowane w: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Unsupervised Wafermap Patterns Clustering via Variational Autoencoders

Autorzy: Peter Tulala, Hamidreza Mahyar, Elahe Ghalebi, Radu Grosu
Opublikowane w: AMSC Proceedings, 2018
Wydawca: AMSC

Opportunities and Challenges of Video and Video Comunication Technology in Smart Factories

Autorzy: Rene Kaiser
Opublikowane w: Proceedings uDAYXVI - Assistenztechnologien in der Arbeitswelt, 2018
Wydawca: uDAYXVI - Assistenztechnologien in der Arbeitswelt

How to measure the digital transformation along industrial value chains? Cases of the semiconductor industry

Autorzy: Andreas Felsberger, Gerald Reiner
Opublikowane w: 2018
Wydawca: 25th Annual EurOMA Conference

A comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data

Autorzy: Stefan Schrunner, Olivia Bluder, Andre Kästner, Roman Kern
Opublikowane w: 2018
Wydawca: 17th IEEE International Conference on Machine Learning and Applications 2018 (ICMLA)

Monitoring Industry 4.0 Applications for Security and Safety Standard Compliance

Autorzy: Anic Bicaku, Christoph Schmittner, Markus Tauber, Jerker Delsing
Opublikowane w: Proceedings ICPS2018 - 1st IEEE Interrnational Conference on Industrial Cyber-Physical Systems, 2018
Wydawca: ICPS2018 - 1st IEEE Interrnational Conference on Industrial Cyber-Physical Systems

Accuracy and robustness against covariate shift of water chiller models

Autorzy: Federica Acerbi; Giuseppe De Nicolao; Josef Obiltschnig; Patrick Richter; Cristina de Luca
Opublikowane w: 2018
Wydawca: 14th IEEE International Conference on Automation Science and Engineering

Application of IEC 62443 for IoT Components

Autorzy: Abdelkader Shaaban, Erwin Kristen, Christoph Schmittner (AIT)
Opublikowane w: 2018
Wydawca: "Safecomp 2018 - 37th Intrernation conference on computer safety, reliability & security - DECSoS 2018 - 13th International ERCIM/EWICS/ARTEMIS Workshop on ""Dependable Smart Embedded and Cyber-physical Systems and Systems-of-Systems""."

Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0

Autorzy: Firooz B. Saghezchi, Georgios Mantas , Alireza Esfahani, Hassan Alizadeh, Joaquim Bastos and Jonathan Rodriguez
Opublikowane w: 2018
Wydawca: The 9th International Conference on Broadband Communications, Newtorks and Systems - Broadnets 2018

Ein Industrie 4.0 Use Case in der Motorenproduktion

Autorzy: Darko Stanislavjevic, Manfred Rosenberger, Gernot Lechner, Stefan Körner, Roman Kern, Bernd Jeitler, Alexander Stocker
Opublikowane w: 2018
Wydawca: Mensch und Computer 2018 (MUC 2018)

Oppurtinities, Challenges and Use Cases of Digitization iwthin the Semiconductor Industry

Autorzy: Germar Schneider, Sophia Keil, Gerhard Luhn
Opublikowane w: Proceedings ASMC 2018, 2018
Wydawca: ASMC 2018

Queuing Network Modelling for improved Decision Support in Manufacturing Systems

Autorzy: Andreas Felsberger, Boualem Rabta and Gerald Reiner
Opublikowane w: Proceedings of the 20th International Working Seminar on Production Economics, 2018
Wydawca: 20th International Working Seminar on Production Economics

Digitalisierung zur Sicherstellung von Qualitätszielen in der Halbleiterindustrie

Autorzy: Germar Schneider
Opublikowane w: 2018
Wydawca: 10. Forum Technische Logistik

Towards Robust Visual Wafer Cleaning Anomaly Detection

Autorzy: Romana Boiger, Gerfried Millner, Manfred Mücke, Bernat Zaragoza Travieso
Opublikowane w: Proceedings of the 18th European Advanced Process Control and Manufacturing Conference (apc/m), 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Stochastic Optimal Power Flow in islanded grids with renewable penetration, energy storage systems and possible curtailments

Autorzy: Alessio Mosca, Davide. M. Raimondo
Opublikowane w: 2018
Wydawca: IEEE CCTA 2018 - 2nd IEEE Conference on Control Technolog and Applications

Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins

Autorzy: Markus Tauber, Christoph Schmittner
Opublikowane w: Special Numer ERCIM News 115, 2018
Wydawca: ERCIM News 115

A new approach using characteristic video singals to improve the stability of manufacturing processes

Autorzy: Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann, Romana Boiger, Manfred Muecke, Matthias Fehr, Dirk Motthes
Opublikowane w: 2018
Wydawca: Digital Image Computing: Techniques and Applications

Towards Applying the Virtual Director Concept to 360 Degree Video Content

Autorzy: Rene Kaiser
Opublikowane w: 2018
Wydawca: ACM International Conference on Interactive Experiences for Television and online video: TVX360 Workshop

Lead time prediction using machine learning algorithms: A case study by a semiconductor manufacturer

Autorzy: Lukas Lingitz, Viola Gallina, Fazel Ansari, David Gyulai (external), Andras Pfeiffer (external), Wilfried Sihn
Opublikowane w: Proceedings of the 51st CIRP Conference on Manufacturing Systems (CIRP CMS 2018), 2018
Wydawca: 51st CIRP Conference on Manufacturing Systems (CIRP CMS 2018)

Optimization of global production scheduling with deep reinforcement learning

Autorzy: Bernd Waschneck, Andre Reichstaller, Lenz Belzner, Thomas Altenmüller, Thomas Bauernhansl, Alexander Knapp, Andreas Kyek
Opublikowane w: 2018
Wydawca: The 51st CIRP Conference on Manufacutring Systems

Deep Reinforcement Learning for Semiconductor Production Scheduling

Autorzy: Bernd Waschneck, Andre Reichstaller, Lenz Belzner, Thomas Altenmüller, Thomas Bauernhansl, Alexander Knapp, Andreas Kyek
Opublikowane w: 2018
Wydawca: ASMC 2018 SemI Advanced Semiconductor Manufacturing Conference

Case Study on Operator Compliance to Scheduling Decisions in Semiconductor Manufacturing

Autorzy: Bernd Waschneck, Thomas Altenmüller, Thomas Bauernhansl, Andreas Kyek
Opublikowane w: 2018
Wydawca: 14th IEEE International Conference on Automation Science and Engineering

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: 2018
Wydawca: Winter Simulation Conference 2018

Identification of the Gordon-Ng Chiller Model: Linear to Nonlinear Least Squares?

Autorzy: Federica Acerbi, Giuseppe De Nicolao
Opublikowane w: 2018
Wydawca: ETFA 2018 - IEEE 23rd International Conference on Emerging Technologies and Factory Automation

SemI40 - Simulationsmodelle in der Halbleiterindustrie: Modellierung so detailliert wie nötig und so einfach wie möglich

Autorzy: Sebastian Rank
Opublikowane w: 2018
Wydawca: 10. Forum Technische Logistik

An analysis of improvement potentials and impacts of digitalization on manufacturing performance

Autorzy: Andreas Felsberger, Christian Wankmüller, Bernhard Oberegger, Gernot Lechner, Gerald Reiner
Opublikowane w: 2019
Wydawca: EUROMA 2019 Conference

Collaborating in a Research and Development Project: Knowledge Protection Practices applied in a Co-opetitive Setting

Autorzy: Rene Kaiser, Stefan Thalmann, Viktoria Pammer-Schindler, Angela Fessl
Opublikowane w: 2019
Wydawca: 10th Conference Professional Knowledge Management, Data-Driven Knowledge Management workshop

Knowledge Protection Practices in a Data-Centric Collaborative Research and Innovation Project

Autorzy: Rene Kaiser
Opublikowane w: 2019
Wydawca: WM 2019

Self-Adaptation Applied to MQTT via GAMF

Autorzy: Silia Maksuti, Oliver Schluga, Giuseppe Settanni, Markus Tauber, Jerker Delsnig
Opublikowane w: 2019
Wydawca: IEEE International Conference on Industtrial Technology

Security Safety and Organizational Standard Compliance in CPS

Autorzy: Ani Bicaku, Christoph Schmittner, Patrick Rottmann, Markus Tauber, Jerker Delsnig
Opublikowane w: Numer in Infocommunications Journal XI(I):2, 2019
Wydawca: Infocommunications Journal XI(I):2

Current state of digitalization in the European Electronic Components and Systems Industry: A multiple-case study analysis

Autorzy: Andreas Felsberger, Christian Wankmüller, Gerald Reiner, Alexander Stocker, Gernot Lechner, Marius Lütkemeyr, Alessandro Sala
Opublikowane w: 2019
Wydawca: Euroma2019 Conference

Safety & Security für M2M Kommunikation

Autorzy: Schmittner, Christoph; Schoitsch, Erwin
Opublikowane w: Numer 1, 2016
Wydawca: Konferenz der Mechatronik-Plattform: Smart Factory
DOI: 10.5281/zenodo.183187

A Review of Decision Support Systems for Manufacturing Systems

Autorzy: Felsberger, Andreas; Oberegger, Bernhard; Reiner, Gerald
Opublikowane w: CEUR- Workshop Proceedings, Numer Vol-1793, 2017
Wydawca: CEUR-WS.org
DOI: 10.5281/zenodo.495120

Autorzy: Stanisavljevic, Darko; Spitzer, Michael
Opublikowane w: CEUR-Workshop Proceedings, Numer VOl-1793, 2017
Wydawca: CEUR-WS.org
DOI: 10.5281/zenodo.495135

A Literature Survey of Early Time Series Classification and Deep Learning

Autorzy: Santos, Tiago; Kern, Roman
Opublikowane w: CEUR-Worksop Proceedings, Numer Vol-1793, 2017
Wydawca: CEUR-WS.org
DOI: 10.5281/zenodo.495150

Production Scheduling in Complex Job Shops from an Industrie 4.0 Perspective: A Review and Challenges in the Semiconductor Industry

Autorzy: Waschneck, Bernd; Bauernhansl, Thomas; Altenmüller, Thomas; Kyek, Andreas
Opublikowane w: CEUR Workshop Proceedings, Numer Vol-1793, 2017
Wydawca: CEUR-WS.org
DOI: 10.5281/zenodo.495155

The impact of Industry 4.0 on Sustainable Supply & Value Chain Management: A meta analysis

Autorzy: Felsberger, A.; Reiner, G.
Opublikowane w: 2017
Wydawca: EurOMA2017

Security Viewpoint in a Reference Architecture Model For Cyber-Physical Production Systems

Autorzy: Ma, Z.; Hudic, A.; Shaaban, A.; Plosz, S.
Opublikowane w: 2017
Wydawca: EuroS&P 2017

Towards Trustworthy End-to-End Communication in Industry 4.0

Autorzy: Maksuti, S.; Bicaku, A.; Tauber, M.; Palkovits-Rauter, S.; Matischek, R.; Schmittner, C.; Mantas, G.; Thron, M.; Delsing; J.
Opublikowane w: 2017
Wydawca: INDIN2017

Secured Offline Authentication on Industrial Mobile Robots using Biometric Data

Autorzy: Haas, S.; Ulz, T.; Steger, C.; Matischek, R.
Opublikowane w: 2017
Wydawca: Robocup2017

A conceptual model for developing a smart process control system

Autorzy: Weihrauch, D.; Schindler, P. A.; Sihn, W.
Opublikowane w: 2017
Wydawca: Elsevier B. V./CIRP Proceedings

An Efficient Algorithm for Scheduling a Flexible Job Ship with Blocking and No-Wait Constraints

Autorzy: Aschauer, A.; Roetzer, F.; Steinboeck, A.; Kugi, A.
Opublikowane w: 2017
Wydawca: IFAC2017

Nonlinear Characterization of Activity Dynamics in Online Collaboration Websites

Autorzy: Santos, T.; Walk, S.; Helic, D.
Opublikowane w: 2017
Wydawca: WWW 2017

Concept and possible application of an automated framework to influence production dispatch based on supply chain events

Autorzy: Bauer, D.; Maier, F.; Bauernhansl, T.; Ponsignon, T.; Waschneck, B.; Oberegger, B.; Felsbeger, A.; Reiner, G.
Opublikowane w: 2017
Wydawca: IESM 2017

Black-box Identification for Efficient Chiller Management in a Semiconductor plant

Autorzy: Acerbi, F.; De Nicolao, G.; Raimondo, D.; Obiltschnig, J.; Richter, P.; De Luca, C.
Opublikowane w: 2017
Wydawca: APC/M

ENISA Based Evaluation of IaaS-Cloud Backend for Industry 4.0

Autorzy: Bauer, Elisabeth; Bicaku, Ani; Schluga, Oliver; Tauber, Markus; Maksuti, Silia
Opublikowane w: 2017
Wydawca: ACM AsiaCCS´17

Accessing Industrial Autonomous Robots: A Secured Authentication Approach

Autorzy: Haas, S.; Steger, C.; Matischek, R.
Opublikowane w: 2017
Wydawca: ICIT 2017

Towards Flexible ans Secure End-to-End Communication in Industry 4.0

Autorzy: Maksuti, S.; Bicaku, A.; Tauber, M.; Palkovits-Rauter, S.; Haas, S.; Delsing, J.
Opublikowane w: 2017
Wydawca: INDIN2017

Advanced Automation of Decision Making Process Flows of Manufacturing Support Processes in the High Tech Industry

Autorzy: Schneider, G.; Keil, S.; Lasch, R.
Opublikowane w: 2017
Wydawca: APC/M 2017

Towards Robust Visual Wafer Cleaning Anomaly Detection

Autorzy: Romana Boiger, Thomas Haenselmann, Manfred Mücke, Frederic Ringsleben
Opublikowane w: 2017
Wydawca: iKNOW 2017

Power Semiconductor and Electronics Manufacturing 4.0

Autorzy: Cristina De Luca
Opublikowane w: 2017
Wydawca: EFECS 2017

Applicability and robustness of ICA for semiconductor data

Autorzy: Anja Zernig
Opublikowane w: 2017
Wydawca: IKNOW 2017

SemI40 - Project Description - Success Stories

Autorzy: Cristina De Luca
Opublikowane w: 2017
Wydawca: ECSEL Austria - Success Stories 2017

Recent advancements in the automation of CVD reactors for the epitaxial deposition of SI and SIC: snyergy between modeling and experiments

Autorzy: Carlo Cavalloti, Danilo Crippa
Opublikowane w: 2017
Wydawca: ICG2017 - Italian Crystal Growth Conference: materials and methods in crystal growth

SAMI40 Workshop at i-KNOW 2017 - a Recap

Autorzy: Rene Kaiser, Roman Kern, Alexander Stocker
Opublikowane w: 2018
Wydawca: KNOW Center

SemI40 & Productive 4.0 Different but Complementary

Autorzy: Cristina De Luca
Opublikowane w: 2018
Wydawca: Productive 4.0 the Lighthouse Industry 4.0 & Interaction Session

A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs

Autorzy: Thomas Wagner, Germar Schneider, Klaus Kabitzsch
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Enabling Standard Compliance in Industry 4.0

Autorzy: Ani Bicaku
Opublikowane w: 2018
Wydawca: CPS Summer School 2018

User Day Systema - Status Infineon Technologies Dresden

Autorzy: Germar Schneider, Wolfgang Scholl
Opublikowane w: 2018
Wydawca: Infineon fab wide workshop at Systema

Towards Robust Visual Wafer Cleaning Anomaly Detection

Autorzy: Romana Boiger, Gerfried Millner, Manfred Mücke, Bernat Zaragoza Travieso
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

SAMI40 Workshop at i-KNOW 2017 - a Recap

Autorzy: Rene Kaiser, Roman Kern, Alexander Stocker
Opublikowane w: Numer IKNOW2017, 2017
Wydawca: IKNOW2017

Fab Simulation and Virtualization - The Key to Enhance the Fab Performance within the Semiconductor Industry

Autorzy: Germar Schneider, Thomas Wagner, Jens Naake, Sebastian Rank, Frank Schulze
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Newsletter SemI40

Autorzy: all WP leaders
Opublikowane w: 2018
Wydawca: www.semi40.eu

Opportunities, Challenges and Use Cases of Digitization within the Semiconductor Industry

Autorzy: Germar Schneider, S. Keil, G Luhn
Opublikowane w: 2018
Wydawca: ASMC 2018 SemI Advanced Semiconductor Manufacturing Conference

Framework for a Closed Control Loop Between Supply Chain Segments and Production Line

Autorzy: Dennis Bauer, Florian Maier, Bernd Waschneck
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Simulation-assisted decision making for supply chain disruptions in production control

Autorzy: Dennis Bauer, Andreas Schlereth, Florian Maier
Opublikowane w: 2018
Wydawca: Winter Simulation Conference 2018

Investigation of multi-run Independent Component Analysis on simulated semiconductor data

Autorzy: Anja Zernig
Opublikowane w: 2018
Wydawca: ENBIS-18: 18th Annual Conference of the European Network for Business and Industrial Statistics

Inter-Device Sensor-Fusion for Action Authorization on Industrial Mobile Robots

Autorzy: Sarah Haas, Anrea Höller, Thomas ULZ, Christian Steger
Opublikowane w: 2018
Wydawca: 37th International Conference on Computer Safety, Reliability & Security (Safecomp2018)

On-Line Screening of a Chemical-Machine Wafer Cleaning Process Based on Ordinal Measure

Autorzy: Bernat Zaragoza Travieso, Christoph Gaisberger, Manfred Mücke, Matthias Fehr
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

SemI40 Project Poster

Autorzy: Cristina De Luca
Opublikowane w: 2018
Wydawca: EFECS 2018

Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0

Autorzy: Firooz B. Saghezchi, Georgios Mantas, Alireza Esfahani, Hassan Alizadeh, Joaquim Bastos, Jonathan Rodriguez
Opublikowane w: 2018
Wydawca: The 9th International Conference on Broadband Communications, Newtorks and Systems - Broadnets 2018

Estimating wafer chuck angular velocity from video data

Autorzy: Romana Boiger, Matthias Fehr, Gerfried Millner, Manfred Mücke
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Product health assessment using patterns in semiconductor wafer test data

Autorzy: Anja Zernig
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Data Science along the semiconductor frontend production

Autorzy: Anja Zernig, Stefan Schrunner, Martin Pleschberger
Opublikowane w: 2018
Wydawca: Statistische Woche 2018

Digitalization to Assure Quality Targets within the Semiconductor Industry

Autorzy: Germar Schneider
Opublikowane w: 2018
Wydawca: 10. Forum Technische Logistik

Cybersecurity Attacks in Semiconductor Supply Chain Environment

Autorzy: Alireza Esfahani, Georgios Mantas, Firooz B. Saghezchi, Joaquim Bastos, Jonathan Rodriguez
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

The granularity of the automated-generated long-term simulation model

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: 2018
Wydawca: 18th European Advanced Process Control and Manufacturing Conference (apc/m)

Security Compliance Verification in Cyber Physical Systems

Autorzy: Ani Bicaku
Opublikowane w: 2018
Wydawca: European Cybersecurity month

Continuous Security Compliance Verification in Industry 4.0

Autorzy: Markus Tauber
Opublikowane w: 2018
Wydawca: Workshop Cybersecurity for Manufacturing Environments

Bestimmung von Objektparametern aus industriellen Bildern mit neuronalen Netzwerken

Autorzy: Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
Opublikowane w: 2018
Wydawca: NWK2018 - Nachwuchswissenschaftlerkonferenz

Secured Action Authorization for Industrial Mobile Robots

Autorzy: Sarah Haas, Thoams ULZ, Christian Steger
Opublikowane w: 2018
Wydawca: 1st IEEE International Conference on Industrial Cyber-Physical Systems (ICPS2018)

Transfer of Run-to-Run-Control to Production Control Level in Semiconductor Front-End

Autorzy: Dennis Bauer, Florian Maier, Andreas Schlereth
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Job-shop scheduling with optimal inclusion of work-free night shifts

Autorzy: Alexander Aschauer, Florian Rötzer, Andreas Steinboeck, Andreas Kugi, Michael Eidenberger-Schober, Gernot Reichl
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Physics and chemistry behind plasma chamber conditioning for predictive maintenance

Autorzy: Michael Klick, Dirk Suchland, Lutz Eichhorn
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

An impact evaluation approach for smart factory cases

Autorzy: Andreas Felsberger, Gerald Reiner, Marius Lütkemeyer, Alessandro Sala, Alexander Stocker, Gernot Lechner
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

On-the-fly camera software solution for automatic perspective recognition of structured surfaces

Autorzy: Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Evaluation of Visual Decision Support Systems used in Semiconductor Industry

Autorzy: Manuela Rauch, Alexander Gaal, Ilija Simic, Vedran Sabol
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

A Scalable Wafer Dispatching Strategy Based on Dynamic Programming

Autorzy: Alessio Mosca, Cristina De Luca, Davide Raimondo
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Application Study of Hardware-Based Security for Future Industrial IOT

Autorzy: Rainer Matischek and Benjamin Bara
Opublikowane w: 2019
Wydawca: Euromicro Conference on Digital System Design

Simulation-assisted decision making for supply chain disruptions in production control

Autorzy: Andreas Schlereth; Thomas Ponsignon, Axel Bruns, Dennis Bauer, Florian Maier
Opublikowane w: 2019
Wydawca: EURO2019 Conference

Machine Learning Techniques for Automated Wafer Assessment using Wafer Test Data

Autorzy: Anja Zernig, Stefan Schrunner, Martin Pleschberger, Michael Scheiber, Anna Jenul, Andre Kästner
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Impact of Test Wafers in the Transportation System of a Semiconductor Factory

Autorzy: David Wittwer, Sebastian Rank, Thorsten Schmidt
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Continuous Standard Compliance Verification in SemI40

Autorzy: Ani Bicaku, Markus Tauber, Christoph Schmittner
Opublikowane w: 2018
Wydawca: APCM Europe Conference 2019

Die große Wirkung der kleinsten Teile

Autorzy: Manfred Mücke
Opublikowane w: 2019
Wydawca: Kurier 2019

Detection of adhesive film residues during wafer demounting

Autorzy: Robert Muhr, Wolfgang Gratzer, Matthias Fehr, Germar Schneider
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry

Autorzy: Igor Stogniy, Wolfgang Scholl
Opublikowane w: 2019
Wydawca: Winter Simulation Conference 2019

An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data

Autorzy: Anna Jenul, Stefan Schrunner, Anja Zernig, Andre Kaestner, Jürgen Pilz
Opublikowane w: 2019
Wydawca: APCM Europe Conference 2019

Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells

Autorzy: Mario Thron, Thomas Bangemann, Silia Maksuti, Ani Bicaku, Markus Tauber
Opublikowane w: 2019
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