Obiettivo This proposal is aimed at developing a new method based on quantitative depth profile analysis by DC GD-OES, which permits rapid multi-element analysis of very thin films (passive films on stainless steels, conversion layers on plane and coated steel sheets,), with the following technical specifications: minimum information depth about 5nm; multi-element capability of 20 elements in one measurement; quantification of major and minor elements with an accuracy better than 10%; analysis time (measurement + quantification) of a few minutes for very thin layers. Programma(i) ECSC-STEELRES 8C - Medium-term guidelines (ECSC) for the programmes of technical steel research and of steel pilot/demonstration projects, 1991-1995 Argomento(i) E - Analytical Techniques for Processes, Products & Environment Invito a presentare proposte Data not available Meccanismo di finanziamento Data not available Coordinatore INSTITUTET FÖR METALLFORSKNING, ANSLAGSSTIFTELSE Contributo UE Nessun dato Indirizzo Drottning Kristinas väg 48 114 28 STOCKHOLM Svezia Mostra sulla mappa Costo totale Nessun dato
