Risultati finali
Facility dosimetry procedure and dedicated monitors (ESR 1-3 and ESR5)
Documentation of test setups practical for mixed-facilitiesDocumentation of test setups practical for mixed-facilities (ESR3 collaborating with WP2 and WP3 ESRs)
Summary of RHA approaches in European irradiation testSummary of RHA approaches in European irradiation test facilities (all WP1 ESRs)
Final Report on system level test methodology compared with component test resultsFinal Report on system level test methodology compared with component test results (ESRs12-14 with WP1 and 2)
Handbook of test methodologies and applicable facilities for advanced systemsHandbook of test methodologies and applicable facilities for advanced systems (input from ESR1-4/9/10/12-14)
Design status report and prototype of the rad-tolerant CMOS imagerDesign status report and prototype of the rad-tolerant CMOS imager (ESR11 with tools/techniques from ESR9/10)
Final PhD thesis or respective status report available, approved by TO/EC and stored on RADSAGA networkRisk assessment and application procedure of system test methodologies
Risk assessment and application procedure of system test methodologies (ESRs 12-14)
Evaluation report of 14 MeV test methodologyEvaluation report of 14 MeV test methodology (ESR15 and ESR13 with input from ESR1 and ESR5)
Progress Report on system level test methodology compared with component test resultsProgress Report on system level test methodology compared with component test results (ESRs12-14 with WP1 and 2)
Status report on coupled effects and predictions toolsStatus report on coupled effects and predictions tools (ESR7 and 8)
Collection and documentation of testing tools and facilities required for system level testsCollection and documentation of testing tools and facilities required for system level testing (ESR13 and ESR14)
Closing meeting and RADSAGA summary reportCombined status report on modelling techniques and tools
Combined status report on modelling techniques and tools (SEU, SET and SEL) (ESR9 and ESR10)
Report on hardening by design rules, tools and modellingReport on hardening by design rules, tools and modelling (ESR6 with ESR8 and ESR9/10 [synergistic effects])
Design status report and prototype of SRAM radiation monitorDesign status report and prototype of SRAM radiation monitor (ESR5 with ESR4 for modelling and environments)
Initial training event completed and evaluated in order to feed into future RADSAGA generalized training
Feedback collected from public lecture and discussion tables and included in remaining outreach planning
Feedback collected from first public presentation and discussion tables; included in remaining outreach planning
Final press release on RADSAGA findings, attributed awards and all public relevant informationFinal press release on RADSAGA findings attributed awards and all public relevant information
Introduction to Intellectual Property WorkshopElaboration of project technology assessment fact sheets
Elaboration of project technology assessment factsheets
Web site and social media interfaces availableCollected and structured training material to allow for future RADSAGA European School on Radiation Effects in Electronics
RADECS short-course developed, delivered and evaluated
Technical status review of all ESR projects is provided
Technical status review of all ESR projects is provided (at the same time as D7.2 and milestone 6)
Pubblicazioni
Autori:
Arijit Karmakar; Jialei Wang; Jeffrey Prinzie; Valentijn De Smedt; Paul Leroux
Pubblicato in:
Radiation, Vol 1, Iss 18, Pp 194-217 (2021), Numero 9, 2021, ISSN 2673-592X
Editore:
MDPI
DOI:
10.3390/radiation1030018
Autori:
S. Guagliardo, F. Wrobel, Y.Q. Aguiar, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul
Pubblicato in:
Microelectronics Reliability, Numero 119, 2021, Pagina/e 114087, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2021.114087
Autori:
Rajkowski, T.; Saigné, F.; Wang, P.-X
Pubblicato in:
Electronics 2022, 11(3), 378, 2022, ISSN 2079-9292
Editore:
mdpi books
DOI:
10.3390/electronics11030378
Autori:
Y.Q. Aguiar, F. Wrobel, S. Guagliardo, J.-L. Autran, P. Leroux, F. Saigné, A.D. Touboul, V. Pouget
Pubblicato in:
Microelectronics Reliability, Numero 100-101, 2019, Pagina/e 113457, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2019.113457
Autori:
R.B. Schvittz, Y.Q. Aguiar, F. Wrobel, J.-L. Autran, L.S. Rosa, P.F. Butzen
Pubblicato in:
Microelectronics Reliability, Numero 114, 2020, Pagina/e 113871, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113871
Autori:
Andrea Coronetti, Ruben Garcia Alia, Matteo Cecchetto, Wojtek Hajdas, Daniel Soderstrom, Arto Javanainen, Frederic Saigne
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 67/7, 2020, Pagina/e 1606-1613, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2020.2978228
Autori:
Carlo Cazzaniga, Maria Kastriotou, Rubén García Alía, Pablo Fernandez-Martinez, Vanessa Wyrwoll, Triestino Minniti, Christopher D. Frost
Pubblicato in:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Numero 985, 2021, Pagina/e 164671, ISSN 0168-9002
Editore:
Elsevier BV
DOI:
10.1016/j.nima.2020.164671
Autori:
T. Rajkowski, F. Saigné, V. Pouget, F. Wrobel, A. Touboul, J. Boch, P. Kohler, P. Dubus, P.X. Wang
Pubblicato in:
IEEE Transactions on Nuclear Science ( Volume: 67, Numero: 7, July 2020), 2020, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2020.2992808
Autori:
V. Wyrwoll, B. Delfs, M. Lapp, D. Poppinga, P. Fernandéz Martinéz, M. Kastriotou, R. García Alía, K. Røed, A. Gerbershagen, H.K. Looe, B. Poppe
Pubblicato in:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Numero 987, 2021, Pagina/e 164831, ISSN 0168-9002
Editore:
Elsevier BV
DOI:
10.1016/j.nima.2020.164831
Autori:
Vanessa Wyrwoll, Ruben Garcia Alia, Ketil Roed, Carlo Cazzaniga, Maria Kastriotou, Pablo Fernandez-Martinez, Andrea Coronetti, Francesco Cerutti
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 67/7, 2020, Pagina/e 1530-1539, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2020.2994370
Autori:
Andrea Coronetti, Ruben Garcia Alia, Jialei Wang, Maris Tali, Matteo Cecchetto, Carlo Cazzaniga, Arto Javanainen, Frederic Saigne, Paul Leroux
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 68/5, 2021, Pagina/e 937-948, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3061209
Autori:
K. Niskanen, A. D. Touboul, R. Coq Germanicus, A. Michez, A. Javanainen, F. Wrobel, J. Boch, V. Pouget, F. Saigne
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 67/7, 2020, Pagina/e 1365-1373, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2020.2983599
Autori:
M. Kastriotou, P. Fernandez-Martinez, R. Garcia Alia, C. Cazzaniga, M. Cecchetto, A. Coronetti, G. Lerner, M. Tali, N. Kerboub, V. Wyrwoll, J. Bernhard, S. Danzeca, V. Ferlet-Cavrois, A. Gerbershagen, H. Wilkens
Pubblicato in:
IEEE Transactions on Nuclear Science ( Volume: 67, Numero: 1, Jan. 2020), 2019, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2019.2961801
Autori:
Lüdeke, Sascha; Javanainen, Arto
Pubblicato in:
IEEE Transactions on Nuclear Science ( Volume: 69, Numero: 3, March 2022), Numero 2, 2022, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2022.3147592
Autori:
C. Martinella, R. G. Alia, R. Stark, A. Coronetti, C. Cazzaniga, M. Kastriotou, Y. Kadi, R. Gaillard, U. Grossner, A. Javanainen
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 68/5, 2021, Pagina/e 634-641, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3065122
Autori:
Ruben Garcia Alia, Maris Tali, Markus Brugger, Matteo Cecchetto, Francesco Cerutti, Andrea Cononetti, Salvatore Danzeca, Luigi Esposito, Pablo Fernandez-Martinez, Simone Gilardoni, Angelo Infantino, Maria Kastriotou, Nourdine Kerboub, Giuseppe Lerner, Vanessa Wyrwoll, Veronique Ferlet-Cavrois, Cesar Boatella, Arto Javanainen, Heikki Kettunen, Yolanda Morilla, Pedro Martin-Holgado, Remi Gaillard, F
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 67/1, 2020, Pagina/e 345-352, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2019.2951307
Autori:
G. Lerner, A. Coronetti, J. Kempf, R. Garcia Alia, F. Cerutti, D. Prelipcean, M. Cecchetto, A. Gilardi, W. Farabolini, R. Corsini
Pubblicato in:
IEEE Transactions on Nuclear Science ( Early Access ), 2022, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2022.3157404
Autori:
C. Cazzaniga, R. Garcia Alia, A. Coronetti, K. Bilko, Y. Morilla, P. Martin-Holgado, M. Kastriotou, C. Frost
Pubblicato in:
IEEE Transactions on Nuclear Science ( Volume: 69, Numero: 3, March 2022), 2021, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3123814
Autori:
Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Pubblicato in:
Aerospace, Numero 7/2, 2020, Pagina/e 12, ISSN 2226-4310
Editore:
MDPI
DOI:
10.3390/aerospace7020012
Autori:
Y.Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul
Pubblicato in:
Microelectronics Reliability, Numero 114, 2020, Pagina/e 113885, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113885
Autori:
Tomasz Rajkowski, Frédéric Saigné, Kimmo Niskanen, Jérôme Boch, Tadec Maraine, Pierre Kohler, Patrick Dubus, Antoine Touboul, Pierre-Xiao Wang
Pubblicato in:
Electronics, Numero 10/11, 2021, Pagina/e 1235, ISSN 2079-9292
Editore:
MDPI
DOI:
10.3390/electronics10111235
Autori:
Vanessa Wyrwoll, Ruben Garcia Alia, Ketil Roed, Pablo Fernandez-Martinez, Maria Kastriotou, Matteo Cecchetto, Nourdine Kerboub, Maris Tali, Francesco Cerutti
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 67/7, 2020, Pagina/e 1590-1598, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2020.2973591
Autori:
Matteo Cecchetto, Ruben Garcia Alia, Frederic Wrobel, Andrea Coronetti, Kacper Bilko, David Lucsanyi, Salvatore Fiore, Giulia Bazzano, Elisa Pirovano, Ralf Nolte
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 68/5, 2021, Pagina/e 873-883, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3064666
Autori:
M. Pena-Fernandez, A. Lindoso, L. Entrena, I. Lopes, V. Pouget
Pubblicato in:
IEEE Transactions on Nuclear Science, 2021, Pagina/e 1-1, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3067554
Autori:
Y.Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul
Pubblicato in:
Microelectronics Reliability, Numero 114, 2020, Pagina/e 113877, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113877
Autori:
Daniel Soderstrom, Lucas Matana Luza, Heikki Kettunen, Arto Javanainen, Wilfrid Farabolini, Antonio Gilardi, Andrea Coronetti, Christian Poivey, Luigi Dilillo
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 68/5, 2021, Pagina/e 716-723, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3068186
Autori:
Y. Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigne, A. D. Touboul, V. Pouget
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 66/7, 2019, Pagina/e 1465-1472, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2019.2918077
Autori:
Y.Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, A.D. Touboul, V. Pouget
Pubblicato in:
Microelectronics Reliability, Numero 88-90, 2018, Pagina/e 920-924, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2018.07.018
Autori:
Jeffrey Prinzie, Sam Thys, Bjorn Van Bockel, Jialei Wang, Valentijn De Smedt, Paul Leroux
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 66/1, 2019, Pagina/e 282-289, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2018.2885693
Autori:
Ruben Garcia Alia, Pablo Fernandez Martinez, Maria Kastriotou, Markus Brugger, Johannes Bernhard, Matteo Cecchetto, Francesco Cerutti, Nikolaos Charitonidis, Salvatore Danzeca, Lau Gatignon, Alexander Gerbershagen, Simone Gilardoni, Nourdine Kerboub, Maris Tali, Vanessa Wyrwoll, Veronique Ferlet-Cavrois, Cesar Boatella Polo, Hugh Evans, Gianluca Furano, Remi Gaillard
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 66/1, 2019, Pagina/e 458-465, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2018.2883501
Autori:
Hicham El hamzaoui, Géraud Bouwmans, Bruno Capoen, Andy Cassez, Rémi Habert, Youcef Ouerdane, Sylvain Girard, Diego Di francesca, Nourdine Kerboub, Adriana Morana, Daniel Söderström, Aziz Boukenter, Mohamed Bouazaoui
Pubblicato in:
OSA Continuum, Numero 2/3, 2019, Pagina/e 715, ISSN 2578-7519
Editore:
OSA Continuum
DOI:
10.1364/osac.2.000715
Autori:
Budroweit, Mueller, Jaksch, Alía, Coronetti, Koelpin
Pubblicato in:
Aerospace, Numero 6/10, 2019, Pagina/e 106, ISSN 2226-4310
Editore:
Aerospace 2019
DOI:
10.3390/aerospace6100106
Autori:
Kimmo Niskanen; R. Coq Germanicus; A. Michez; Frédéric Wrobel; Jerome Boch; Frédéric Saigné; Antoine Touboul
Pubblicato in:
"IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩", Numero 8, 2021, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3077733
Autori:
Y. Q. Aguiar, F. Wrobel, J.-L. Autran, F. L. Kastensmidt, P. Leroux, F. Saigne, V. Pouget, A. D. Touboul
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 67/7, 2020, Pagina/e 1581-1589, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2020.3003166
Autori:
Jialei Wang, Jeffrey Prinzie, Andrea Coronetti, S. Thys, Ruben Garcia Alia, Paul Leroux
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 68/5, 2021, Pagina/e 913-920, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3072328
Autori:
Andrea Coronetti, Ruben Garcia Alia, Francesco Cerutti, Wojtek Hajdas, Daniel Soderstrom, Arto Javanainen, Frederic Saigne
Pubblicato in:
IEEE Transactions on Nuclear Science, 2021, Pagina/e 1-1, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3070216
Autori:
Jan Budroweit, Mattis Jaksch, Rubén Garcia Alía, Andrea Coronetti, Alexander Kölpin
Pubblicato in:
Aerospace, Numero 7/2, 2020, Pagina/e 14, ISSN 2226-4310
Editore:
MDPI a
DOI:
10.3390/aerospace7020014
Autori:
Daniel Soderstrom; Heikki Kettunen; Adriana Morana; Arto Javanainen; Youcef Ouerdane; Hicham El Hamzaoui; Bruno Capoen; Géraud Bouwmans; Mohamed Bouazaoui; Sylvain Girard
Pubblicato in:
Sensors, Vol 21, Iss 7523, p 7523 (2021), Numero 6, 2021, ISSN 1424-8220
Editore:
Multidisciplinary Digital Publishing Institute (MDPI)
DOI:
10.3390/s21227523
Autori:
Andrea Coronetti, Ruben Garcia Alia, Jan Budroweit, Tomasz Rajkowski, Israel Da Costa Lopes, Kimmo Niskanen, Daniel Soderstrom, Carlo Cazzaniga, Rudy Ferraro, Salvatore Danzeca, Julien Mekki, Florent Manni, David Dangla, Cedric Virmontois, Nourdine Kerboub, Alexander Koelpin, Frederic Saigne, Pierre Wang, Vincent Pouget, Antoine Touboul, Arto Javanainen, Heikki Kettunen, Rosine Coq Germanicus
Pubblicato in:
IEEE Transactions on Nuclear Science, Numero 68/5, 2021, Pagina/e 958-969, ISSN 0018-9499
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tns.2021.3061197
Autori:
A. Karmakar, V. De Smedt, and P. Leroux
Pubblicato in:
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 2021, ISBN 978-1-7281-9201-7
Editore:
IEEE
DOI:
10.1109/iscas51556.2021.9401505
Autori:
S. Guagliardo, F. Wrobel, Y. Q. Aguiar, J-L Autran, P. Leroux, F. Saigne, V. Pouget, A.D. Touboul
Pubblicato in:
2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020, Pagina/e 1-5, ISBN 978-1-7281-5426-8
Editore:
IEEE
DOI:
10.1109/dtis48698.2020.9081275
Autori:
P. Kohler, T. Rajkowski, F.Saigné, P. X. Wang, A. Sanchez, L. Puybusque, L.Gouyet
Pubblicato in:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020
Editore:
IEEE
DOI:
10.1109/redw51883.2020.9325826
Autori:
A. Coronetti, R. Garcia Alia, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Bilko, P. Martin-Holgado
Pubblicato in:
2021 IEEE Radiation Effects Data Workshop (REDW), 2021
Editore:
IEEE
DOI:
10.1109/nsrec45046.2021.9679344
Autori:
Arijit Karmakar; Valentijn De Smedt; Paul Leroux
Pubblicato in:
LASCAS, Numero 1, 2021
Editore:
IEEE
DOI:
10.1109/lascas51355.2021.9459120
Autori:
Israel C. Lopes, V. Pouget, F. Wrobel, A. Touboul, F. Saigne and K. Røed
Pubblicato in:
2020 IEEE Latin-American Test Symposium (LATS), 2020, ISBN 978-1-7281-8732-7
Editore:
IEEE
DOI:
10.1109/lats49555.2020.9093681
Autori:
Lucas Matana Luza, Daniel Soderstrom, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sanchez, Alberto Bosio, Luigi Dilillo
Pubblicato in:
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, Pagina/e 1-6, ISBN 978-1-7281-9457-8
Editore:
IEEE
DOI:
10.1109/dft50435.2020.9250865
Autori:
J. Budroweit, A. Koelpin
Pubblicato in:
2018 IEEE Topical Workshop on Internet of Space (TWIOS), 2018, Pagina/e 9-12, ISBN 978-1-5386-1294-1
Editore:
IEEE
DOI:
10.1109/twios.2018.8311399
Autori:
Steffen Mueller, Robert Weigel, Alexander Koelpin
Pubblicato in:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2017, Pagina/e 1-4, ISBN 978-1-5386-1261-3
Editore:
IEEE
DOI:
10.1109/radecs.2017.8696150
Autori:
Steffen Mueller, Salvatore Danzeca, Ruben Garcia Alia, Markus Brugger, Robert Weigel, Alexander Koelpin
Pubblicato in:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2017, Pagina/e 1-5, ISBN 978-1-5386-1261-3
Editore:
IEEE
DOI:
10.1109/radecs.2017.8696117
Autori:
K. Niskanen , A. D. Touboul, R. Coq Germanicus , A. Michez , F. Wrobel , J. Boch , V. Pouget , F. Saigné
Pubblicato in:
2018
Editore:
IEEE RADECS2018
DOI:
10.5281/zenodo.2652367
Autori:
L. Matana Luza, D. Soderstrom, H. Puchner, R. Garcia Alia, M. Letiche, A. Bosio, L. Dilillo
Pubblicato in:
2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020, ISBN 978-1-7281-5426-8
Editore:
IEEE
DOI:
10.1109/dtis48698.2020.9080918
Autori:
S. Guagliardo et al.
Pubblicato in:
2019
Editore:
IEEE
DOI:
10.1109/radecs47380.2019.9745682
Autori:
Andrea Coronetti, Matteo Cecchetto, Jialei Wang, Maris Tali, Pablo Fernandez Martinez, Maria Kastriotou, Athina Papadopoulou, Kacper Bilko, Florent Castellani, Mario Sacristan, Ruben Garcia Alia, Carlo Cazzaniga, Yolanda Morilla, Pedro Martin-Holgado, Marc-Jan van Goethem, Harry Kiewiet, Emil van der Graaf, Sytze Brandenburg, Wojtek Hajdas, Laura Sinkunaite, Miroslaw Marszalek, Heikki Kettunen, Mi
Pubblicato in:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020, Pagina/e 1-8, ISBN 978-1-6654-1532-3
Editore:
IEEE
DOI:
10.1109/redw51883.2020.9325822
Autori:
Lucas Matana Luza; Daniel Soderstrom; Andre Martins Pio de Mattos; Eduardo Augusto Bezerra; Carlo Cazzaniga; Maria Kastriotou; Christian Poivey; Luigi Dilillo
Pubblicato in:
"16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2021), Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩", Numero 5, 2021
Editore:
IEEE
DOI:
10.1109/dtis53253.2021.9505143
Autori:
Lüdeke, Sascha
Pubblicato in:
Numero 1, 2019
Editore:
zenodo
DOI:
10.5281/zenodo.2708850
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