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High Definition Electron Microscopy: Greater clarity via multidimensionality

Pubblicazioni

Investigating Direct Focused Probe Ptychography for Single Particle Analysis

Autori: Christoph Hofer, Chuang Gao, Emiliya Pogosyan, Kimmo Mustonen, Elisabeth Müller, Takashi Ishikawa, Timothy J. Pennycook
Pubblicato in: Microscopy and Microanalysis, Numero 28, 2022
Editore: Cambridge University Press
DOI: 10.1017/s143192762200527x

Addressing Thickness Induced Contrast Reversals in Focused Probe Ptychography

Autori: Chuang Gao, Christoph Hofer, Timothy J. Pennycook
Pubblicato in: Microscopy and Microanalysis, Numero 28, 2022
Editore: Cambridge University Press
DOI: 10.1017/s1431927622002185

A Hybrid Approach to Calibrate the Affine Transformation Between Scan-CameraCoordinates for 4D-STEM Datasets

Autori: Shoucong Ning, Wenhui Xu, Yinhang Ma, Leyi Loh, Timothy J Pennycook, Wu Zhou, Fucai Zhang, Michel Bosman, Stephen J Pennycook, N Duane Loh, Qian He
Pubblicato in: Microscopy and Microanalysis, Numero 28, 2022, Pagina/e 2532
Editore: Cambridge University Press
DOI: 10.1017/s1431927622009679

Few-tilt Electron Ptychotomography: A New Method to Determine the 3D Structureof 2D Materials with High-precision and Low-dose

Autori: Christoph Hofer, Kimmo Mustonen, Viera Skákalová, Timothy J. Pennycook
Pubblicato in: Microscopy and Microanalysis, Numero 28, 2022
Editore: Cambridge University Press
DOI: 10.1017/s1431927622009655

Ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction

Autori: Jacob Madsen, Christoph Hofer, Thomas C. Pekin, Marcel Schloz, Thuy An Bui, Christoph Koch, Timothy J. Pennycook and Toma Susi
Pubblicato in: Microscopy and Microanalysis, Numero 28, 2022, Pagina/e 2526-2527
Editore: Cambridge University Press
DOI: 10.1017/s143192762200229x

Direct Imaging of Charge Redistribution due to Bonding at Atomic Resolution via Electron Ptychography

Autori: Martinez, Gerardo T.; Naginey, Timothy C.; Jones, Lewys; O'Leary, Colum M.; Pennycook, Timothy J.; Nicholls, Rebecca J.; Yates, Jonathan R.; Nellist, Peter D.
Pubblicato in: Numero 1, 2019
Editore: arxiv

Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications

Autori: D. Jannis, C. Hofer, C. Gao, X. Xie, A. Béché, T.J. Pennycook, J. Verbeeck
Pubblicato in: Ultramicroscopy, Numero 233, 2022, Pagina/e 113423, ISSN 0304-3991
Editore: Elsevier BV
DOI: 10.1016/j.ultramic.2021.113423

ab initio description of bonding for transmission electron microscopy

Autori: Jacob Madsen, Timothy J. Pennycook, Toma Susi
Pubblicato in: Ultramicroscopy, 2021, Pagina/e 113253, ISSN 0304-3991
Editore: Elsevier BV
DOI: 10.1016/j.ultramic.2021.113253

Toward Exotic Layered Materials: 2D Cuprous Iodide

Autori: Kimmo Mustonen; Christoph Hofer; Peter Kotrusz; Alexander Markevich; Martin Hulman; Clemens Mangler; Toma Susi; Timothy J. Pennycook; Karol Hricovini; Christine Richter; Jannik C. Meyer; Jani Kotakoski; Viera Skákalová
Pubblicato in: Advanced Materials, Numero 34, 2021, Pagina/e 2106922, ISSN 0935-9648
Editore: United Nations Industrial Developement Organization
DOI: 10.48550/arxiv.2109.08456

Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets

Autori: Shoucong Ning, Wenhui Xu, Yinhang Ma, Leyi Loh, Timothy J Pennycook, Wu Zhou, Fucai Zhang, Michel Bosman, Stephen J Pennycook, Qian He, N Duane Loh
Pubblicato in: Microscopy and Microanalysis, Numero 28, 2022, Pagina/e 1, ISSN 1431-9276
Editore: Cambridge University Press
DOI: 10.1017/s1431927622000320

Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science

Autori: C. Gao, C. Hofer, D. Jannis, A. Béché, J. Verbeeck, and T. J. Pennycook
Pubblicato in: Applied Physics Letters, Numero 121, 2022, Pagina/e 081906, ISSN 0003-6951
Editore: American Institute of Physics
DOI: 10.1063/5.0101895

Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial

Autori: Timothy J. Pennycook, Gerardo T. Martinez, Colum M. O'Leary, Hao Yang, Peter D. Nellist
Pubblicato in: Microscopy and Microanalysis, Numero Volume 25, 2019, Pagina/e 2684-2685, ISSN 1431-9276
Editore: Cambridge University Press
DOI: 10.1017/s1431927619014156

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