Description du projet
Un microscope innovant pourrait améliorer considérablement la technologie de tests non destructifs
Les matériaux sont constitués de molécules complexes et de composés avec une variété de structures 3D qui affectent leurs propriétés. Les technologies d’optique non linéaire exploitent les modifications des propriétés optiques d’un matériau en présence de la lumière. Elles ont un fort potentiel d’utilisation dans les tests non destructifs, mais rencontrent des difficultés techniques liées aux exigences strictes en matière d’échantillonnage et aux conditions de mesure complexes. Le projet PolarNon, financé par l’UE, a mis au point un microscope non linéaire facile à utiliser, capable de prédire la structure d’un matériau à l’intérieur d’un appareil avec une résolution de l’ordre d’un pixel. L’équipe passe désormais de la phase de laboratoire à la phase de prototype industriel, ciblant en priorité les industries des semi-conducteurs et de l’aérospatial.
Objectif
The analysis of materials is a key requirement for device quality control in medical, electronic and photonic industry. Currently, fluorescence imaging, electron microscopy and photoluminescence are typical tools for quality control in research and industry. However, they suffer from several limitations: complex samples preparation, special environments, destructive and time-consuming measurements. The development of new materials and components needs innovative approaches for fast and non-destructive testing (NDT). We propose to use nonlinear optical responses that are strongly dependent on material properties like crystal structure, defects and roughness for NDT. Despite the high potential of nonlinear optics in material sciences, the existing solutions are not convenient in terms of equipment, measurements methods, sample preparation and human resources costs.
We propose the implementation and testing of a fully automated polarimetric nonlinear microscope ‘PolarNon’ as a hardware and software solution for NDT and quality control of materials or optoelectronic components in the semiconductor industry (Market segment I), and metallic or ceramic alloys in the aerospace industry (Market segment II). The PolarNon system overcomes the limitations of current methods: it does not require special sample preparation or measurement conditions, like low temperatures, vacuum or ultrathin substrates, and it can characterize materials already incorporated in a device. The PolarNon includes a method of per-pixel analysis of optical images to reconstruct the material crystalline properties down to the pixel resolution. We already successfully applied this approach to several materials for predicting samples inner structure. This project allows us to build an industrial prototype for future commercialization and secure the invention to create an engineering start-up focused on the development of nonlinear optical microscopy tools for material analysis.
Champ scientifique
- engineering and technologymaterials engineeringcrystals
- natural sciencesphysical sciencesopticsmicroscopysuper resolution microscopy
- natural sciencesphysical sciencesopticsmicroscopyelectron microscopy
- natural sciencesphysical scienceselectromagnetism and electronicssemiconductivity
- natural sciencesphysical sciencesopticsnonlinear optics
Programme(s)
Régime de financement
ERC-POC-LS - ERC Proof of Concept Lump Sum PilotInstitution d’accueil
8092 Zuerich
Suisse