Understanding The Role of the defects to Accomplish high Performance and Stable Two Dimensional Devices

Project Information

TRAPS-2D

Grant agreement ID: 895322

DOI

10.3030/895322

Project closed

EC signature date 27 February 2020

Start date 1 November 2020

End date 31 December 2022

Funded under

• EXCELLENT SCIENCE - Marie Skłodowska-Curie Actions

Total cost

€ 165 666,88

EU contribution

€ 165 666,88

Coordinated by

UNIVERSIDAD DE GRANADA
Spain

CORDIS provides links to public deliverables and publications of HORIZON projects.

Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Publications

Peer reviewed articles (7)

Performance and reliability in back-gated CVD-grown MoS2 devices

Author(s): Carlos Marquez, Norberto Salazar, Farzan Gity, Jose C. Galdon, Carlos Navarro, Ray Duffy, Paul Hurley, Francisco Gamiz
Published in: Solid-State Electronics, Issue 186, 2021, Page(s) 108173, ISSN 0038-1101
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2021.108173

Towards a DFT-based layered model for TCAD simulations of MoS2

Author(s): L. Donetti, C. Marquez, C. Navarro, C. Medina-Bailon, J.L. Padilla, C. Sampedro, F. Gamiz
Published in: Solid-State Electronics, Issue Volume 197, November 2022, 108437, 2022, ISSN 0038-1101
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108437

Improved inter-device variability in graphene liquid gate sensors by laser treatment

Author(s): Jorge Ávila, Jose C. Galdon, Maria-Isabel Recio, Norberto Salazar, Carlos Navarro, Carlos Marquez, Francisco Gamiz
Published in: Solid-state Electronics, Issue 108259, Volume 192, 2022, 2022, ISSN 0038-1101
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108259

3D-TCAD benchmark of two-gate dual-doped Reconfigurable FETs on FDSOI28 technology

Author(s): C. Navarro, L. Donetti, J.L. Padilla, C. Medina-Bailon, J.C. Galdon, C. Marquez, C. Sampedro, F. Gamiz
Published in: Solid-State Electronics, Issue Volume 200, February 2023, 108577, 2023, ISSN 0038-1101
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108577

Performance of FDSOI double-gate dual-doped reconfigurable FETs

Author(s): C. Navarro, L. Donetti, J.L Padilla, C. Medina, J. Ávila, J.C. Galdón, M. Recio, C. Márquez, C. Sampedro, F. Gámiz
Published in: Solid-State Electronics, Issue Volume 194, August 2022, 108336, 2022, ISSN 0038-1101
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108336

Hysteresis in As-Synthesized MoS2 Transistors: Origin and Sensing Perspectives

Author(s): Carlos Marquez, Norberto Salazar, Farzan Gity, Jose C. Galdon, Carlos Navarro, Carlos Sampedro, Paul K. Hurley, Edward Yi Chang, Francisco Gamiz
Published in: Micromachines, Issue 12/6, 2021, Page(s) 646, ISSN 2072-666X
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/mi12060646

DFT-based layered dielectric model of few-layer MoS2

Author(s): L. Donetti, C. Navarro, C. Marquez, C. Medina-Bailon, J.L. Padilla, F. Gamiz
Published in: Solid-State Electronics, Issue Volume 194, August 2022, 108346, 2022, ISSN 0038-1101
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108346

Other (3)

On the improvement of reliability in 2D devices for sensing

Author(s): Carlos Marquez
Published in: Graphene2022, 2022
Publisher: Phantom Foundation

Laser-induced inter-device variability improvement for liquid gated graphene sensors

Author(s): Jorge Ávila; Jose Galdon; Norberto Salazar; Maria-Isabel Recio; Carlos Marquez; Carlos Navarro; Francisco Gamiz
Published in: Graphene Week, 2021
Publisher: Graphene Flagship

MSCA contingency plan: the lifeguard during the pandemic

Author(s): Carlos Marquez
Published in: 29th MCAA NEWSLETTER, 2021
Publisher: 29th MCAA NEWSLETTER

Conference proceedings (1)

Improved inter-device variability in graphene liquid gate sensors by laser treatment

Author(s): Jorge Ávila; Jose Galdon; Norberto Salazar; Maria-Isabel Recio; Carlos Navarro; Carlos Marquez; Francisco Gamiz
Published in: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, 2021
Publisher: IEEE
DOI: 10.1109/eurosoi-ulis53016.2021.9560682