Understanding The Role of the defects to Accomplish high Performance and Stable Two Dimensional Devices

Performance and reliability in back-gated CVD-grown MoS2 devices

Auteurs: Carlos Marquez, Norberto Salazar, Farzan Gity, Jose C. Galdon, Carlos Navarro, Ray Duffy, Paul Hurley, Francisco Gamiz
Publié dans: Solid-State Electronics, Numéro 186, 2021, Page(s) 108173, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2021.108173

Towards a DFT-based layered model for TCAD simulations of MoS2

Auteurs: L. Donetti, C. Marquez, C. Navarro, C. Medina-Bailon, J.L. Padilla, C. Sampedro, F. Gamiz
Publié dans: Solid-State Electronics, Numéro Volume 197, November 2022, 108437, 2022, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108437

Improved inter-device variability in graphene liquid gate sensors by laser treatment

Auteurs: Jorge Ávila, Jose C. Galdon, Maria-Isabel Recio, Norberto Salazar, Carlos Navarro, Carlos Marquez, Francisco Gamiz
Publié dans: Solid-state Electronics, Numéro 108259, Volume 192, 2022, 2022, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108259

3D-TCAD benchmark of two-gate dual-doped Reconfigurable FETs on FDSOI28 technology

Auteurs: C. Navarro, L. Donetti, J.L. Padilla, C. Medina-Bailon, J.C. Galdon, C. Marquez, C. Sampedro, F. Gamiz
Publié dans: Solid-State Electronics, Numéro Volume 200, February 2023, 108577, 2023, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108577

Performance of FDSOI double-gate dual-doped reconfigurable FETs

Auteurs: C. Navarro, L. Donetti, J.L Padilla, C. Medina, J. Ávila, J.C. Galdón, M. Recio, C. Márquez, C. Sampedro, F. Gámiz
Publié dans: Solid-State Electronics, Numéro Volume 194, August 2022, 108336, 2022, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108336

Hysteresis in As-Synthesized MoS2 Transistors: Origin and Sensing Perspectives

Auteurs: Carlos Marquez, Norberto Salazar, Farzan Gity, Jose C. Galdon, Carlos Navarro, Carlos Sampedro, Paul K. Hurley, Edward Yi Chang, Francisco Gamiz
Publié dans: Micromachines, Numéro 12/6, 2021, Page(s) 646, ISSN 2072-666X
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/mi12060646

DFT-based layered dielectric model of few-layer MoS2

Auteurs: L. Donetti, C. Navarro, C. Marquez, C. Medina-Bailon, J.L. Padilla, F. Gamiz
Publié dans: Solid-State Electronics, Numéro Volume 194, August 2022, 108346, 2022, ISSN 0038-1101
Éditeur: Pergamon Press Ltd.
DOI: 10.1016/j.sse.2022.108346

On the improvement of reliability in 2D devices for sensing

Auteurs: Carlos Marquez
Publié dans: Graphene2022, 2022
Éditeur: Phantom Foundation

Laser-induced inter-device variability improvement for liquid gated graphene sensors

Auteurs: Jorge Ávila; Jose Galdon; Norberto Salazar; Maria-Isabel Recio; Carlos Marquez; Carlos Navarro; Francisco Gamiz
Publié dans: Graphene Week, 2021
Éditeur: Graphene Flagship

MSCA contingency plan: the lifeguard during the pandemic

Auteurs: Carlos Marquez
Publié dans: 29th MCAA NEWSLETTER, 2021
Éditeur: 29th MCAA NEWSLETTER

Improved inter-device variability in graphene liquid gate sensors by laser treatment

Auteurs: Jorge Ávila; Jose Galdon; Norberto Salazar; Maria-Isabel Recio; Carlos Navarro; Carlos Marquez; Francisco Gamiz
Publié dans: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, 2021
Éditeur: IEEE
DOI: 10.1109/eurosoi-ulis53016.2021.9560682

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