Advanced atomic force microscopy techniques V
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Author(s):
Philipp Rahe, Ilko Bald, Nadine Hauptmann, Regina Hoffmann-Vogel, Harry Mönig, Michael Reichling
Published in:
Beilstein Journal of Nanotechnology, Issue 16, 2025, Page(s) 54-56, ISSN 2190-4286
Publisher:
Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
DOI:
10.3762/bjnano.16.6
"Influence of surface relaxations on scanning probe microscopy images of the charge density wave material <mml:math xmlns:mml=""http://www.w3.org/1998/Math/MathML""><mml:mrow><mml:mn>2</mml:mn><mml:mi>H</mml:mi></mml:mrow><mml:mtext>−</mml:mtext><mml:msub><mml:mi>NbSe</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:math>"
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Author(s):
Nikhil S. Sivakumar, Joost Aretz, Sebastian Scherb, Marion van Midden Mavrič, Nora Huijgen, Umut Kamber, Daniel Wegner, Alexander A. Khajetoorians, Malte Rösner, Nadine Hauptmann
Published in:
Physical Review B, Issue 111, 2025, ISSN 2469-9950
Publisher:
APS
DOI:
10.1103/physrevb.111.075409
2024 roadmap on magnetic microscopy techniques and their applications in materials science
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Author(s):
D V Christensen, U Staub, T R Devidas, B Kalisky, K C Nowack, J L Webb, U L Andersen, A Huck, D A Broadway, K Wagner, P Maletinsky, T van der Sar, C R Du, A Yacoby, D Collomb, S Bending, A Oral, H J Hug, A-O Mandru, V Neu, H W Schumacher, S Sievers, H Saito, A A Khajetoorians, N Hauptmann, S Baumann, A Eichler, C L Degen, J McCord, M Vogel, M Fiebig, P Fischer, A Hierro-Rodriguez, S Finizio, S S D
Published in:
Journal of Physics: Materials, Issue 7, 2024, Page(s) 032501, ISSN 2515-7639
Publisher:
IOP Science
DOI:
10.1088/2515-7639/ad31b5
