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Measurement of spatial coherence of x-rays and some application

Ziel



-Methodology of determination of the partial coherence of X-rays in a beamline using Fresnel mirrors -characterization of usual filters by interferometry -applications of coherence to surface and layered model system
The characterization of the X-ray beam (i.e. the measurement of the 4-dimensional correlation function called Mutual intensity) will be performed in analysing the interference pattern created by two Fresnel mirrors acting as "Young slits".
The same apparatus but in the near field will be used for a sort of holography of surfaces: the reference beam from a "good" mirror interfering with the beam reflected by the sample will give reflectivity and phase information on the surface. Prior to application to 'real' systems of basic or technological relevance - in the fields of surfaces, multilayers etc, a first step will be undertaken using well characterized model systems: -grated surfaces (periodic or pseudoperiodic) -bilayers studies (to solve phase problem for reflectivity measurements) -superlattices in transission geometry

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Finanzierungsplan

RGI - Research grants (individual fellowships)

Koordinator

Commissariat à l'Energie Atomique
EU-Beitrag
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17,Rue des Martyrs
38054 Grenoble
Frankreich
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