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Verwertbare Ergebnisse
European laboratories will collaborate on the detailed characterization of thin films and single crystals of high temperature superconductors. The research is focused on the chemistry during the preparation of thin films and single crystals with the ultimate goal being the design of reliable methods for the manufacture of these devices. In particular the relations between the chemistry of the manufacturing, the processing steps and the physical properties and microstructure will be studied. The chemistry of the manufacture of high temperature superconductor devices determines to a large extent their performance. Therefore it requires a very precise knowledge of the effects of each of the processing steps on the quality of the various components and the interfaces between these components. The complexity of the devices demands very precise and atomic-level chemical and structural characterizations, to understand the differences in the properties of specimens, prepared under various conditions and to understand the chemical and physical processes during the deposition of the components and the subsequent processing. These characterizations should be performed on model systems (single crystals) as well as on more complicated systems (thin films, multilayered structures).The ultimate goal of the project is to attain the control of the manufacturing of microwave devices containing high temperature superconductors and to develop alternative and new chemical manufacturing techniques to enhance transport current densities. These goals require a relationship between the chemistry and physics of the manufacturing and processing of high temperature superconductors and their performance at liquid nitrogen temperature. The research contains several essential components: manufacturing of thin films; steering the growth of thin films by specific substrate morphologies; growth of high quality single crystals; and the characterization of the superconducting properties of films and single crystals, with the characterization of the microstructure; this requires advanced high resolution electron microscope facilities.
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