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Lithography to Cross the One-Tenth of a micron Resolution Node using ArF System Technology

Objective

Pushing 193 nm optical lithography to its limits, LICOTRENAS will provide IC makers with exposure tool performance necessary to manufacture ICs with 100nm (dense) and 70 nm (isolated) features. This project is part of a larger program to develop a high aperture 193 nm high throughput lithography tool, including stable materials, metrology, process, reticle know-how and to demonstrate its feasibility at 100 nm. The work in this specific project is divided in 2 workpackages: manufacturing metrology for materials and sub-systems, and integration of sub-systems plus evaluation of their performance at system level.

Call for proposal

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Coordinator

ASM LITHOGRAPHY B.V.
EU contribution
No data
Address
DE RUN 1110
5503 LA VELDHOVEN
Netherlands

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Total cost
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Participants (5)