Ziel
The aim of this project is the development of VLSI Testers SITEST 764 and SITEST 780. It is planned to develop other VLSI Testers based on similar technology in order to be able to offer to the customers a whole family of VLSI Testers.
The two VLSI Testers SITEST 764 and 780 differ quite considerably in their performance. The essential features of VLSI Testers are the bit repetition rate with the related system accuracy and the maximum number of Pins per test head. The corresponding figures are 12 MHz and 64 Pins for the SITEST 764 and 50 MHz and 256 Pins for the SITEST 780.
The users will receive prototype equipment of VLSI Tester 764 in mid 1984 and prototype equipment of VLSI 780 in mid 1985. The users' experience, obtained through the use of the equipment for testing advanced VLSI circuits, will be documented (reports). It is expected that after completion of the project the testers will be fully commercialized.
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7500 KARLSRUHE
Deutschland