Ever since the discovery of bacteria by van Leeuwenhoek in the 17th century, advances in microscopy have led to ground-breaking discoveries, that revolutionized science, technology, and medicine. Our consortium aims at introducing Optical Near-field Electron Microscopy (ONEM), a new concept for label-free imaging of interfaces with nanometric spatial resolution, and without dose-induced specimen damage.
This is achieved via a unique combination of light and electron optics: First, the specimen is illuminated with light, which is non-invasive. Very close to the sample, the resulting optical fields are converted into an electron beam using the photo-electric effect. Since the local beam current is proportional to the local light intensity, imaging the electrons yields information about the sample under study.
Our consortium sets out to build the world’s first ONEM. We aim at proof-of principle demonstrations of our new technology in electrochemistry, plasmonics, and membrane biology. A more detailed description of ONEM can be found in the following publication:
Raphaël Marchand, Radek Šachl, Martin Kalbáč, Martin Hof, Rudolf Tromp, Mariana Amaro, Sense J. van der Molen, and Thomas Juffmann, Optical Near-Field Electron Microscopy, Phys. Rev. Applied 16, 014008 (2021).