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Dynamic Properties of Ferroelectric III-V MOSFETs

Project description

High-performance ferroelectric MOSFETs for future high-frequency communications

Developing transistors with high switching speeds and high output powers is crucial for their operation at the millimetre-wave frequency spectrum. Traditional transistors can become much more efficient with the addition of a thin layer of a ferroelectric material. So far, researchers have studied the integration of ferroelectric films into metal–insulator–metal structures, silicon and 2D materials. The EU-funded DYNAMISM project plans to develop a III–V technology platform that includes ferroelectric materials. The high electron mobility in III–V materials causes a high transconductance in metal-oxide semiconductor field-effect transistors (MOSFETs). This enables three orders of magnitude higher cut-off frequencies and unity gain frequencies compared to those of competing silicon MOSFETs.

Objective

The discovery of ferroelectric characteristics in annealed HfO2–based films opens a wide range of applications not only in memory and logic, but the results will enable new scientific directions for instance in reconfigurable electronics. So far, ferroelectric films have been investigated in metal-insulator-metal structures suitable for back-end-of-line integration. They have also been introduced onto Si and two-dimensional materials. However, there is a gap of knowledge with lack of science and technology for integration of HfO2–based ferroelectric films on III-V channel materialswhere the increased permittivity will improve electrostatics. III-V transistors hold a key position for high-performance millimetre wave electronics. The high electron mobility in III-V materials contributes to a high transconductance that enables high unity-current-gain cut-off frequency and unity-power-gain cut-off frequency, fT and fmax, more than a factor 3 higher than competing Si MOSFET technologies. The wide options for heterostructure design have enabled III-V steep-slope transistors for low-power electronics operating down to 30 mV/dec without hysteresis .
To research for the first time ferroelectric films integrated on high-performance III-V devices at technology-relevant dimensions, we will use our demonstrated integration of Hf0.5Zr0.5O2 on InAs:
- Establishing the best strategy to integrate ferroelectric gate-stacks on III-V materials with strong polarization and long endurance.
- Characterizing the dynamic properties with non-volatile functionality of ferroelectric films integrated on III-V transistor channels.
- Investigating ferroelectric III-V MOSFETs for future applications including millimeter-wave devices, cryogenic electronics, Negative Capacitance FET (NC-FET) circuitry, and Ferroelectric Tunnel Junctions (FTJs).

Combined, the new science and technology will enable novel high-performance devices as well as reconfigurable millimetre-wave electronics.

Host institution

LUNDS UNIVERSITET
Net EU contribution
€ 2 500 000,00
Address
Paradisgatan 5c
22100 Lund
Sweden

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Region
Södra Sverige Sydsverige Skåne län
Activity type
Higher or Secondary Education Establishments
Links
Total cost
€ 2 500 000,00

Beneficiaries (1)