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Designing high-reliability interconnection materials for accelerated modern electrification

Periodic Reporting for period 1 - SuperSolders (Designing high-reliability interconnection materials for accelerated modern electrification)

Período documentado: 2022-01-17 hasta 2024-01-16

This project was terminated at its early stage due to the departure of the Fellow Zhaolong Ma.

This project was initially designed to explore novel solder materials for electronic interconnection applications in consumer electronics, automotive, aerospace, and power electronics industries, to address the problems of current materials, such as low performance and high costs. By the termination date of this project, we have explored the use of high entropy alloys (HEAs) and low melting temperature material (Gallium) as the substrate and interconnection materials respectively, to promote the formation of novel compositional complex intermetallics. We have carefully characterized the composed phases of the intermetallic layer and understood their formation mechanisms.

New solders and understandings generated in this study will greatly contribute to developing next-generation high-reliability/performance electronic devices in consumer electronics, power electronics, and automotive/aerospace sector.

The overall objectives are to design novel low-temperature solders, develop high-reliability solders for harsh environment applications, and explore novel TLPB (transient liquid phase bonding) solders for high-temperature applications. By the termination date of this project, we have explored Ga as a novel TLPB solder and HEAs as the TLPB substrates. This Ga/HEAs TLPB system demonstrated a good potential for industry application.
By the termination date of this project, the Fellow have performed using Ga as the interconnection material and high entropy alloys (HEAs) as the substrate material to fabricate TLPB (transient liquid phase bonding) joints, as an alternative to the traditional Sn/Cu TLPB system. The microstructure of Ga/HEAs TLPB was compared with Ga/CuNi TLPB and Ga/FeNi TLPB systems, and their phases and structure formation mechanisms were revealed. The investigations are still ongoing and will be disseminated until the result outcome is satisfactory.
New solders and understandings generated in this study will greatly contribute to developing next-generation high-reliability/performance electronic devices in consumer electronics, power electronics, and automotive/aerospace sector.
TLPB joints made with Ga interconnection material and FeCoNiCu high entropy alloy substrate