Periodic Reporting for period 1 - SILEQS (Spins Interfaced with Light for Quantum Silicon technologies)
Berichtszeitraum: 2022-10-01 bis 2025-03-31
Lately, a new type of individual quantum systems has been detected in silicon: fluorescent point defects. These systems, also called color centers, can be excited by lasers and in response emit fluorescent light, like artificial atoms trapped in the silicon crystal. They can be detected at single-defect scale using advanced microscopy technics at cryogenic temperatures, typically bellow -240°C. These color centers have the benefit of emitting single photons in the telecom band, i.e. in the range of light that can propagate over the greatest distances in optical fibers used for the Internet. Furthermore, some fluorescent defects do possess an additional quantum degree of freedom associated with a non-zero spin state that can encode quantum information. As a consequence, optically-active spin defects could combine a spin memory qubit interfaced with telecom single photons.
The goal of the SILEQS project is to explore the quantum properties of these single color centers recently detected in silicon. A first objective relates to the control of their luminescence in order to have the defects generating photons one after the other with identical properties. A second one concerns the control of their spin states, down to the single-defect level. Like other quantum systems, particular attention will be given to the impact of their environment on the defects' quantum properties.
By investigating single G centers in silicon samples adapted for integrated photonics, we do observe an optical signature of the motion of a single atom inside a macroscopic crystal. In particular, the pattern of emission lines produced by the G defects is linked to the motion dynamics of their mobile atom, which is impacted by the crystal environment. In a perfect silicon crystal, the G center's mobile atom is perfectly delocalized between 6 sites. For a G center in a strained crystal, for instance due to the presence of a silicon oxide layer below the silicon layer, the behavior is drastically different. In this case, at each optical cycle, the defect center-of-mass randomly hops between the different sites, as if it were a ball in a 6-slot roulette wheel.
These results open the way to the tuning of the G center emission lines by strain engineering of the silicon crystal. Furthermore, as the G defect is sensitive to strain, we could think of using it as an optical sensor of strain with sub-micrometer spatial resolution. In parallel, we are also investigating the control of its spin states, as well as the integration of single G centers inside photonic cavities to boost the collection and the emission of single photons.