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CORDIS - Risultati della ricerca dell’UE
CORDIS

Advanced modelling and characterization for power semiconductor materials and technologies

CORDIS fornisce collegamenti ai risultati finali pubblici e alle pubblicazioni dei progetti ORIZZONTE.

I link ai risultati e alle pubblicazioni dei progetti del 7° PQ, così come i link ad alcuni tipi di risultati specifici come dataset e software, sono recuperati dinamicamente da .OpenAIRE .

Risultati finali

In-situ tools, sample designs and protocols (si apre in una nuova finestra)

The report will contain the design of the tools and sample for in-situ experiments, the protocols, and the first results. Contributing tasks: T3.4.

Plan for dissemination and exploitation incl. communication activities (si apre in una nuova finestra)

D7.1 provides an initial plan for dissemination and exploitation incl. communication activities and training and will be periodically updated based on the project’s progress. It also constitutes an initial dissemination & communication kit for AddMorePower, as well as the launch of the project website and communication infrastructure in M03. Contributing tasks: T7.1, T7.2.

Virtual ECCI and dislocation density tensor (si apre in una nuova finestra)

This deliverable describes the data transfer for virtual ECCI simulation (to WP2), the data formats and data needs defined and communicated as well as the first successful data transfer and utilization for modelling. Dissemination of documentation and distribution of the protocols and data structure (CHADA, GitHub). Contributing task(s): T5.3.

Documentation of domain-level ontologies - CHADAs & MODAs (si apre in una nuova finestra)

The community standards CHADA and MODA describe the common understanding on describing, processing, characterizing and modelling of materials and of their properties for the applied methods in AddMorePower in a formalized way. Contributing tasks: T2.1, all tasks of WPs 3, 4, 5; T6.1, T6.2.

Cu metallization (si apre in una nuova finestra)

As-processed and aged Cu films are characterized using TEM (visualization + ACOM) and EBSD techniques. This data is transferred to WP5 for the generation of microstructure-informed models. Furthermore Cu/semiconductor materials combinations are heated in-situ in the TEM to study the deformation behaviour. Contributing tasks: T4.3.

Project quality plan (si apre in una nuova finestra)

The project quality plan (project handbook) constitutes a set of project templates and explains the project management, review, internal quality control process, and other organizational topics such as meeting organization. This handbook shall support all partners in their daily work. Contributing task: T1.1.

Imaging protocols for Lab-based Transmission X-ray Microscopy and nano-Computed Tomography (si apre in una nuova finestra)

The protocols will be established for both, Mo and Cu sources. The documents will be distributed on relevant platforms (e.g. GitHub). Contributing tasks: T3.1.

Mean field model for vacancy diffusion (si apre in una nuova finestra)

Mean Material parameters are established and linked to experiments. Numerical stability is tested under various initial, boundary and loading conditions (stress states, temperature states and vacancy concentrations). Dissemination of documentation and distribution of the model and its data structure (MODA, GitHub). Contributing task(s): T5.1

Material Science Data Repository (si apre in una nuova finestra)

A customised data portal to store and share the processed data and metadata produced by AddMorePower’s materials characterizing and modelling methods. Contributing tasks: T2.2, all tasks of WPs 3, 4, 5.

Data Management Plan (si apre in una nuova finestra)

The comprehensive Data Management Plan (DMP) outlines the type of collected data, produced research outputs, the compliance with the FAIR data principles, the way in which data will be stored and preserved throughout the lifespan of AddMorePower, ethical aspects and security issues. The DMP will be a living document which will be regularly updated. Contributing tasks: T2.1, all tasks of WPs 3, 4, 5; T6.1, T6.2, T7.1, T7.2, T7.3.

Simulation software for impurity diffusion of (H, Cl, O) (si apre in una nuova finestra)

Simulation under varying, relevant thermomechanical boundary and loading conditions and impurity concentrations. Dissemination of documentation and distribution of the model and its data structure (MODA, damask.mpie.de). Contributing task(s): T5.2

Pubblicazioni

Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illumination

Autori: C. Detlefs, N. A. Henningsson, B. Kanesalingam, A. A. W. Cret- ton, C. Corley-Wiciak, F. T. Frankus, D. Pal, S. Irvine, S. Borgi, H. F. Poulsen, C. Yildirim and L. E. Dresselhaus-Marais
Pubblicato in: Acta Crystallographica Section A, 2025
Editore: ArXiv

Advances in Characterisation Methods and Computational Modelling (si apre in una nuova finestra)

Autori: Daniel, Geoffrey; Jason, Ludovic; Ouzia, Alexandre; Clausner, Andre; Jaeken, Catharina; Laukkanen, Anssi; Pascoe, John-Alan; Sebastiani, Marco; Bolelli, Giovanni; Simperler, Alexandra
Pubblicato in: 2025
Editore: Zenodo
DOI: 10.5281/ZENODO.14608274

Estimation of Dislocation Densities With Nondestructive Scanning Electron Microscope Techniques: Application to Gallium Nitride (si apre in una nuova finestra)

Autori: Arka Mandal; Benoît Beausir; Julien Guyon; Vincent Taupin; Antoine Guitton
Pubblicato in: Microscopy and Microanalysis, 2025, ISSN 1435-8115
Editore: Microscopy and Microanalysis, Volume 31, Issue 1, February 2025
DOI: 10.1093/MAM/OZAE124

Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source (si apre in una nuova finestra)

Autori: Kristina Kutukova, Bartlomiej Lechowski, Joerg Grenzer, Peter Krueger, André Clausner, Ehrenfried Zschech
Pubblicato in: Nanomaterials, Numero 14, 2024, ISSN 2079-4991
Editore: MDPI AG
DOI: 10.3390/NANO14050448

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics (si apre in una nuova finestra)

Autori: Bartlomiej Lechowski, Kristina Kutukova, Joerg Grenzer, Iuliana Panchenko, Peter Krueger, Andre Clausner, Ehrenfried Zschech
Pubblicato in: Nanomaterials, Numero 14, 2024, ISSN 2079-4991
Editore: MDPI AG
DOI: 10.3390/NANO14020233

Depth Dependence of Electron Channeling Contrast Imaging in Gallium Nitride (si apre in una nuova finestra)

Autori: Lavallee Etienne; Guitton Antoine; Imrich Peter; Chisholm Claire
Pubblicato in: BIO Web of Conferences, 2024, ISSN 2117-4458
Editore: BIO Web of Conferences
DOI: 10.1051/BIOCONF/202412907018

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