Artificial Intelligence in Manufacturing leading to Sustainability and Industry5.0

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Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Deliverables

Exploration of HW components for the edge processing platform

First, analysis of requirements from use cases and requirements to address objectives of WP2, WP3, and use-cases. Exploring of HW components fulfilling the requirements, the compatibility with sensors of the other partners, and under consideration of economic metrics.

Reports on updated Digital Reference 2

This will especially cover the extension to sustainability for external supply chain. For example, the details for the CO2 balance of automotive supply chain (including semiconductors) and regenerative energy generation supply chain (including semiconductors) is not in yet (DR).

Development and refinement plans for AI tools methods and algorithms

Preliminary descriptions of the AI tools methods and algorithms that are the basis of refinement and tai-loring according to the automation, process engineering and industrial supply chain requirements.Note: As this report is declared public, confidential annexes will be provided within the separate, sensitive deliverable D2.5.

Reports on updated Digital Reference 1

This will especially cover the extension to sustainability for internal semiconductor supply chain. For example, the ecological operating curve is not yet in the digital reference (DR)

Guidelines incl. checklist and self-assessment of how to ap-ply AI in the European industry
Final micro service architecture requirements and architecture realization

Detailed descriptions of requirements from use cases and requirements to address WP3 objectives with concrete proposals for addressing the requirements based on the Eclipse Arrowhead architecture and its implementation platform and which extensions that so far has been addressed.

Preliminary micro service requirements and first architecture concepts

First descriptions of requirements from use cases and requirements to address WP3 objectives with indications on possibilities for addressing the requirements based on the Eclipse Arrowhead architecture and implementation platform and which extensions that will be needed.

Reports on updated Digital Reference 3

This will cover the remaining classes and characteristics missing to come up with a complete ontology allowing to generate computer based efficiently the CO2 balance (DR).

Compilation of the methods and sources evaluated for the guidelines for all industrial AI Use Cases

Publications

Efficient Gerchberg–Saxton algorithm deep unrolling for phase retrieval with a complex forward path

Author(s): Shengyuan Yan, Mike Holenderski, Nirvana Meratnia
Published in: Advanced Photonics Nexus, Issue 5, 2026, ISSN 2791-1519
Publisher: SPIE-Intl Soc Optical Eng
DOI: 10.1117/1.APN.5.2.026005

A Deep Learning Approach for Aluminum Corrosion Recognition in Semiconductor Manufacturing

Author(s): Stefano Binotto, Luca Brunelli, Manuel Barusco, Chiara Masiero, Gian Antonio Susto
Published in: IFAC-PapersOnLine, Issue 59, 2025, ISSN 2405-8963
Publisher: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.103

Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS)

Author(s): Natalie Gentner, Gian Antonio Susto
Published in: Computer & Industrial Engineering, Issue Volume 187, 2024, ISSN 1879-0550
Publisher: Elsevier
DOI: 10.1016/j.cie.2023.109821

Multi-Partner Project: Artificial Intelligence in Manufacturing Leading to Sustainability and the Consideration of Human Aspects (AIMS5.0)

Author(s): Anouar Nechi, Yasin Ghafourian, Belal Abu Naim, Thomas Gutt, George Dimitrakopoulos, Amira Moualhi, Mladen Berekovic, Pal Varga, Markus Tauber
Published in: 2025 Design, Automation &amp; Test in Europe Conference (DATE), 2025, ISSN 1558-1101
Publisher: IEEE
DOI: 10.23919/DATE64628.2025.10993208

Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study

Author(s): Manuel Barusco, Francesco Borsatti, Youssef Ben Khalifa, Davide Dalle Pezze, Gian Antonio Susto
Published in: IFAC-PapersOnLine, Issue 59, 2025, ISSN 2405-8963
Publisher: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.018

A safeness condition for minimal separators based on vertex connectivity

Author(s): Michel Medema, Alexander Lazovik
Published in: Discrete Mathematics, Issue 348, 2025, ISSN 0012-365X
Publisher: Elsevier BV
DOI: 10.1016/J.DISC.2025.114524

Limiting the memory consumption of caching for detecting subproblem dominance in constraint problems

Author(s): Michel Medema, Luc Breeman, Alexander Lazovik
Published in: Constraints, Issue 29, 2024, ISSN 1383-7133
Publisher: Springer Science and Business Media LLC
DOI: 10.1007/S10601-024-09374-7

Enhancing interpretability and generalizability in extended isolation forests

Author(s): Alessio Arcudi, Davide Frizzo, Chiara Masiero, Gian Antonio Susto
Published in: Engineering Applications of Artificial Intelligence, Issue 138, 2024, ISSN 0952-1976
Publisher: Elsevier BV
DOI: 10.1016/J.ENGAPPAI.2024.109409

International Journal of Information Security

Author(s): Tariq Bontekoe; Dimka Karastoyanova; Fatih Turkmen
Published in: International Journal of Information Security, 2025, ISSN 1615-5262
Publisher: Springer Verlag
DOI: 10.1007/S10207-025-01047-7

Pattern-based serverless data processing pipelines for Function-as-a-Service orchestration systems

Author(s): A. Mathew, V. Andrikopoulos, F. J. Blaauw, and D. Karastoyanova
Published in: Future Generation Computer Systems, Issue Volume 154, 2024, ISSN 0167-739X
Publisher: Elsevier
DOI: 10.1016/J.FUTURE.2023.12.026

Learning Priority Indices for Energy-Aware Scheduling of Jobs on Batch Processing Machines.

Author(s): Daniel Sascha Schorn, Lars Mönch
Published in: IEEE Transactions on Semiconductor Manufacturing, Issue 37(1), 2023, ISSN 1558-2345
Publisher: IEEE
DOI: 10.1109/TSM.2023.3326865

CeRULEo: Comprehensive utilitiEs for Remaining Useful Life Estimation methOds

Author(s): Luciano Lorenti, Gian Antonio Susto
Published in: The Journal of Open Source Software, Issue 8(88), 5294, 2023, ISSN 2475-9066
Publisher: Open Journals
DOI: 10.21105/joss.05294

On the Way to Realize the 5th Industrial Revolution: Achievements, Challenges and Research Areas

Author(s): """G. Dimirakopoulos, K. Karathanasopoulou, T. Gutt, H. Ehm, A. Lackner, A. Hoess, G. Schneider"""
Published in: IEEE Industrial Electronics Magazine, 2023, ISSN 2374-9709
Publisher: IEEE
DOI: 10.1109/NOMS56928.2023.10154446

On temporally bounded spatial dynamic sampling for metrology optimization

Author(s): Gian Antonio Susto, Davide Marcato, Marco Doná, Marco Maggipinto, Seán McLoone
Published in: Flexible Services and Manufacturing Journal, 2026, ISSN 1936-6582
Publisher: Springer Science and Business Media LLC
DOI: 10.1007/S10696-026-09667-4

Combining case-based reasoning and process mining for root cause analysis in complex manufacturing environments

Author(s): M.C.A. van der Pas, A.E. Akçay, R.M. Dijkman, I.J.B.F. Adan
Published in: Manufacturing Letters, Issue 46, 2025, ISSN 2213-8463
Publisher: Elsevier BV
DOI: 10.1016/J.MFGLET.2025.11.010

Workers’ Attitudes Towards Digital Transformation and Perceived Well-Being At Work: A Case Study

Author(s): Fabian Lindner, Kazimierz Adam Przybysz, Germar Schneider, Sophia Keil
Published in: ACC JOURNAL, Issue 30, 2024, ISSN 2571-0613
Publisher: Walter de Gruyter GmbH
DOI: 10.2478/ACC-2024-0006

Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing

Author(s): Adrian Poniatowski, Natalie Gentner, Manuel Barusco, Davide Dalle Pezze, Samuele Salti, Gian Antonio Susto
Published in: IEEE Transactions on Automation Science and Engineering, Issue 23, 2025, ISSN 1545-5955
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
DOI: 10.1109/TASE.2025.3621854

IRIS at LLMs4OL 2025 Tasks B, C and D: Enhancing Ontology Learning Through Data Enrichment and Type Filtering

Author(s): Insan-Aleksandr Latipov, Mike Holenderski, Nirvana Meratnia
Published in: Open Conference Proceedings, Issue 6, 2025, ISSN 2749-5841
Publisher: TIB Open Publishing
DOI: 10.52825/OCP.V6I.2895

Industry 5.0: Research Areas and Challenges With Artificial Intelligence and Human Acceptance

Author(s): """G. Dimitrakopoulos, K. Karathanasopoulou, A. Lackner, P. Varga, J. Delsing, M. Tauber, G. Schneider, H. Ehm, T. Gutt, A. Hoess"""
Published in: IEEE Industrial Electronics Magazine, 2024, ISSN 1932-4529
Publisher: IEEE
DOI: 10.1109/MIE.2024.3387068

Digitalisation & AI for Industry 5.0 Applications to Make Semiconductor Manufacturing Sustainable

Author(s): G. Schneider, F. Zoghlami, G. Luhn, F. Lindner, S .Keil
Published in: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Publisher: apcm Conference in Hamburg

Data Augmentation Based on Depth Information for Neural Radiance Fields

Author(s): Hamed Razavi Khosroshahi, Jaime Sancho, Gun Bang, Gauthier Lafruit, Eduardo Juarez, and Mehrdad Teratani
Published in: Electronic Imaging Symposium, 2024
Publisher: NA

Let's Have a Chat with the EU AI Act

Author(s): Ádám Kővári, Yasin Ghafourian, Csaba Hegedus, Belal Abu Naim, Kitti Mezei, Pál Varga, Markus Tauber
Published in: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025, ISSN 2374-9709
Publisher: IEEE
DOI: 10.1109/NOMS57970.2025.11073655

A Self-assessment Tool to Encourage the Uptake of Artificial Intelligence in Digital Workspaces

Author(s): Belal Abu Naim, Yasin Ghafourian, Markus Tauber, Fabian Lindner, Christoph Schmittner, Erwin Schoitsch, Germar Schneider, Olga Kattan, Gerald Reiner, Anna Ryabokon, Francesca Flamigni, Konstantina Karathanasopoulou, George Dimitrakopoulos
Published in: NOMS 2024-2024 IEEE Network Operations and Management Symposium, Issue 1, 2024
Publisher: IEEE
DOI: 10.1109/NOMS59830.2024.10575125

Extended B-ALIF: Improving Anomaly Detection with Human Feedback

Author(s): Valentina Zaccaria, Davide Sartor, Gian Antonio Susto
Published in: 2024 32nd Mediterranean Conference on Control and Automation (MED), 2024
Publisher: IEEE
DOI: 10.1109/MED61351.2024.10566235

Accelerated Explainable Anomaly Detection for Semiconductor Manufacturing

Author(s): Beatrice Sofia Bertipaglia, Luca Brunelli, Alessandro Peratoner, Enrico Convento, Chiara Masiero, Gian Antonio Susto, Alessandro Beghi
Published in: Proceedings of the 2026 IFAC World Congress
Publisher: Elsevier

Interpretable Data-Driven Anomaly Detection in Industrial Processes with ExIFFI

Author(s): Davide Frizzo, Francesco Borsatti, Alessio Arcudi, Antonio De Moliner, Roberto Oboe, Gian Antonio Susto
Published in: 2024 IEEE 8th Forum on Research and Technologies for Society and Industry Innovation (RTSI), 2024
Publisher: IEEE
DOI: 10.1109/RTSI61910.2024.10761374

Voxel-Based Simulation in Comparison for Path Planning of Autonomous Indoor Multicopters

Author(s): H. Kumpe, B. Küster, M. Stonis, L. Overmeyer
Published in: 2025 International Conference on Unmanned Aircraft Systems (ICUAS), 2025
Publisher: IEEE
DOI: 10.1109/ICUAS65942.2025.11007844

Enabling Efficient and Flexible Interpretability of Data-driven Anomaly Detection in Industrial Processes with AcME-AD

Author(s): V. Zaccaria, D. Dandolo, C. Masiero, G.A. Susto
Published in: 10th IEEE International Conference on Control, Decision and Information Technologies, (IEEE CODIT), 2024
Publisher: NA

Applied AI for Adaptive Robotic Conveyor-Feeding

Author(s): Guntis V. Strazds, Katrīna Viltrake, Gergely Hollósi, Laura Leja, Arnis Priedītis, Diāna Dupļevska, Makss Meiers, Christos Chronis, Iraklis Varlamis, George Dimitrakopoulos, Karlis Freivalds
Published in: IFAC-PapersOnLine, Issue 59, 2025, ISSN 2405-8963
Publisher: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.105

Making machine learning support accessible on the shop floor: visualising impeding bottlenecks in semiconductor manufacturing to induce proactive work behavior

Author(s): F. Lindner, V. Ramadasu, G. Schneider, G. Luhn
Published in: Euroma Conference, 2024
Publisher: Euroma Conference in Barcelona

Grammar-Constrained Decoding Makes Large Language Models Better Logical Parsers

Author(s): Federico Raspanti, Tanir Ozcelebi, Mike Holenderski
Published in: Proceedings of the 63rd Annual Meeting of the Association for Computational Linguistics (Volume 6: Industry Track), 2025
Publisher: Association for Computational Linguistics
DOI: 10.18653/V1/2025.ACL-INDUSTRY.34

Improving Plan Stability in Semiconductor Manufacturing Through Stochastic Optimization: A Case Study

Author(s): Eric Weijers, Nino Sluijter, Gijs Hogers, Kai Schelthoff, Ivo Adan, Willem van Jaarsveld
Published in: 2025 Winter Simulation Conference (WSC), 2026, ISSN 1558-4305
Publisher: IEEE
DOI: 10.1109/WSC68292.2025.11339055

An AI-Gym for Industry 4.0

Author(s): Belal Abu Naim, Mojtaba Zahedi Amiri, Markus Tauber
Published in: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025
Publisher: IEEE
DOI: 10.1109/NOMS57970.2025.11073648

Integrating Transport Loads in Production Planning. A Simulation Approach

Author(s): V. Betker, M. Kühn, S. Rank, G. Schneider
Published in: 22th. European Advanced Process Control and Manufacturing Conference in Hamburg, 2024
Publisher: APCM

A Generic Framework for Resource-Limited Microcontrollers Deployment in I-IoT Systems

Author(s): Belal Abu Naim, Yasin Ghafourian, Anna Ryabokon, Francesca Flamigni, Ralph Baldrian
Published in: NOMS 2024-2024 IEEE Network Operations and Management Symposium, 2024
Publisher: IEEE
DOI: 10.1109/NOMS59830.2024.10575590

Unleashing Value-driven Creativity at Universities - Enabling “Industry5.0” from R&D to the High Tech Industries

Author(s): G. Luhn S. Keil G. Schneider F. Lindner G. Reiner
Published in: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Publisher: apcm

Understanding Stakeholders of Industrial AI: Insights from a Persona-Based Questionnaire

Author(s): Yasin Ghafourian, Fabian Lindner, Olga Kattan, Konstantina Karathanasopoulou, Markus Tauber, George Dimitrakopoulos
Published in: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025, ISSN 2374-9709
Publisher: IEEE
DOI: 10.1109/NOMS57970.2025.11073619

Differentiable Physics Training Method for Robot Motion Planning

Author(s): Laura Leja, Guntis Vilnis Strazds, Christos Chronis, Iraklis Varlamis, Kārlis Freivalads
Published in: IFAC-PapersOnLine, Issue 59, 2025, ISSN 2405-8963
Publisher: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.106

Sustainability is the new normal in high-volume semiconductor frontend production: Balancing WIP flow for energy availability, cost and peak consumption

Author(s): Hajo Terbrack, Holger Brandl, Tobias Sprogies, Karlheinz Leonardi
Published in: apcm conference Hamburg, 2024
Publisher: APCM

Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation

Author(s): F. Boni, R. De Monte, Y. Yang, N. Gentner, J. K. Low, G. A. Susto
Published in: 10th IEEE International Conference on Control, Decision and Information Technologies, (IEEE CODIT), 2024
Publisher: NA

Industry 5.0 and Operations Management—the Importance of Human Factors

Author(s): Fabian Lindner, Gerald Reiner
Published in: NOMS 2023-2023 IEEE/IFIP Network Operations and Management Symposium, 2023, ISSN 2374-9709
Publisher: IEEE
DOI: 10.1109/NOMS56928.2023.10154282

Time and resourceutilization of a voxel-based simulation for indoor multicopters

Author(s): Hendrik Kumpe, Benjamin Küster, Malte Stonis, Ludger Overmeyer
Publisher: TU Dortmund

Aggregated Simulation Modeling to Assess Product-Specific Safety Stock Targets During Market Up- and Downswings: A Case Study

Author(s): Cas Rosman, Eric Weijers, Kai Schelthoff, Willem van Jaarsveld, Alp Akcay, Ivo Adan
Published in: 2024 Winter Simulation Conference (WSC), 2025
Publisher: IEEE
DOI: 10.1109/WSC63780.2024.10838984

A Life Cycle and Enabling Concepts for Green Business Process Management

Author(s): Michel Medema, Bogdan Popescu, Vasilios Andrikopoulos, Dimka Karastoyanova
Published in: 2025 11th International Conference on ICT for Sustainability (ICT4S), 2025
Publisher: IEEE
DOI: 10.1109/ICT4S68164.2025.00037

Supporting Energy Management At IFX Using Artifical Intelligence

Author(s): F. Zoghlami, N. H. Annacota, M. Ernst, G. Welde, G. Schneider, C. Kögler, M. Wiese
Published in: Smart Systems Integration Conference in Hamburg, 2024
Publisher: SSI

AcME-AD: Accelerated Model Explanations for Anomaly Detection

Author(s): Valentina Zaccaria, David Dandolo, Chiara Masiero, Gian Antonio Susto
Published in: 2nd World Conference on eXplainable Artificial Intelligence, 2024
Publisher: NA

Jointly optimizing intralogistics, WIP flow and stocker management in a segregated high-automation semiconductor font-end fab

Author(s): Charlotte Lotze, Laurens Borgmann, Holger Brandl, Germar Schneider
Published in: apcm conference Hamburg, 2024
Publisher: APCM

SOA Engineering Support for Building Autonomous Elements in Industrial Food Production

Author(s): Belal Abu Naim, Oliver Zendel, Yasin Ghafourian, Ralph Baldrian, Francesca Flamigni, Markus Tauber
Published in: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025
Publisher: IEEE
DOI: 10.1109/NOMS57970.2025.11073573

Leveraging Machine Signals for Device-Level Quality Detection and Automatic Root Cause Analysis in Semiconductor Wire Bonding

Author(s): Kenneth J. Braakman, D. Martin Knotter, Alp Akcay, Ivo Adan
Published in: 2024 Winter Simulation Conference (WSC), 2025
Publisher: IEEE
DOI: 10.1109/WSC63780.2024.10838790

Experimental Evaluation of Deep Neural Networks for Vehicle Model Identification

Author(s): Amira Moualhi, Maryam Nezami, Saleh Mulhem, Georg Schilbach
Published in: The 22nd European Control Conference (ECC), 2024
Publisher: NA

Variability reduction in semiconductor manufacturing using machine learning and explainable AI

Author(s): V. Ramadasu, F. Lindner, G. Reiner, G. Schneider, G. Luhn
Published in: 33rd European Conference on Operational Research in Copenhagen, 2024
Publisher: European Conference

Machine Learning and Explainable AI to Manage Process Variabilities and Resource Efficiencies in Semiconductor Manufacturing

Author(s): V. Ramadasu, F. Lindner, G. Reiner, G. Schneider, F. Lindner, G. Luhn
Published in: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Publisher: apcm

Terrain Issue Detection for Servitization of Autonomous Lawn Mowing

Author(s): Alan Araujo, Carl Borngrund, Ulf Bodin, Olov Schelén, Erik Zeitler
Published in: 2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA), 2025
Publisher: IEEE
DOI: 10.1109/ETFA65518.2025.11205594

Improving Plan Stability for Front-End Master Planning Using Chance-Constrained Formulations

Author(s): Lars van der Griend
Published in: 2025

Enhancing Semiconductor Supply Chain Simulation: Incorporating Demand Patterns and Lifecycle Phases

Author(s): Nino Sluijter
Published in: 2025

Grammar Constrained Large Language Models for Logical Reasoning

Author(s): Federico Raspanti
Publisher: Eindhoven University of Technology

Root Cause Analysis in a Framework on Multi-Agent Systems in a Manufacturing Process

Author(s): Mitchel M. Ouwerkerk
Published in: 2025
Publisher: Eindhoven University of Technology

Finding effective preventive maintenance policies for multiple machines in a single buffered flow line

Author(s): Frank Hartman
Published in: 2024
Publisher: NA

An aggregation model for short-term WIP forecasting in a high-mix waferfab

Author(s): Bram Smits
Published in: 2023
Publisher: NA

Interpretable Evaluation of Factual Consistency in Abstractive Summarization

Author(s): Daan Hegger
Published in: 2023
Publisher: NA

Development and analysis of a fusion of visual and point cloud SLAM algorithms with respect to applicability in the industrial production environment

Author(s): Yumao Liu
Publisher: LUH

Dataset: Large-scale multi-shape phase retrieval dataset for PBF-LB/M laser beam shaping SLM phase mask estimation

Author(s): Shengyuan Yan, Mike Holenderski, Nirvana Meratnia
Publisher: Figshare
DOI: 10.6084/M9.FIGSHARE.30131893

The power of computer vision: enhancing manufacturing quality control by automated image classification

Author(s): Corinna Kofler & Isabell Dicillia-Kowatsch
Published in: 2024
Publisher: WiDS Villach

Carinthia dataset

Author(s): Corinna Kofler, Sabrina Strauß, Anja Zernig, Ernesto Lazaro Garcia, Michael Boxleitner, Beatrix Mayr, Isabell Dicillia-Kowatsch, Claudia Anna Dohr
Published in: 2024
Publisher: Zenodo
DOI: 10.5281/zenodo.10715190

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