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CORDIS

Artificial Intelligence in Manufacturing leading to Sustainability and Industry5.0

CORDIS provides links to public deliverables and publications of HORIZON projects.

Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Deliverables

Final micro service architecture requirements and architecture realization (opens in new window)

Detailed descriptions of requirements from use cases and requirements to address WP3 objectives with concrete proposals for addressing the requirements based on the Eclipse Arrowhead architecture and its implementation platform and which extensions that so far has been addressed.

Reports on updated Digital Reference 3 (opens in new window)

This will cover the remaining classes and characteristics missing to come up with a complete ontology allowing to generate computer based efficiently the CO2 balance (DR).

Guidelines incl. checklist and self-assessment of how to ap-ply AI in the European industry (opens in new window)

Publications

Digitalisation & AI for Industry 5.0 Applications to Make Semiconductor Manufacturing Sustainable

Author(s): G. Schneider, F. Zoghlami, G. Luhn, F. Lindner, S .Keil
Published in: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Publisher: apcm Conference in Hamburg

Data Augmentation Based on Depth Information for Neural Radiance Fields

Author(s): Hamed Razavi Khosroshahi, Jaime Sancho, Gun Bang, Gauthier Lafruit, Eduardo Juarez, and Mehrdad Teratani
Published in: Electronic Imaging Symposium, 2024
Publisher: NA

A Self-assessment Tool to Encourage the Uptake of Artificial Intelligence in Digital Workspaces (opens in new window)

Author(s): Belal Abu Naim, Yasin Ghafourian, Markus Tauber, Fabian Lindner, Christoph Schmittner, Erwin Schoitsch, Germar Schneider, Olga Kattan, Gerald Reiner, Anna Ryabokon, Francesca Flamigni, Konstantina Karathanasopoulou, George Dimitrakopoulos
Published in: NOMS 2024-2024 IEEE Network Operations and Management Symposium, Issue 1, 2024
Publisher: IEEE
DOI: 10.1109/NOMS59830.2024.10575125

Enabling Efficient and Flexible Interpretability of Data-driven Anomaly Detection in Industrial Processes with AcME-AD

Author(s): V. Zaccaria, D. Dandolo, C. Masiero, G.A. Susto
Published in: 10th IEEE International Conference on Control, Decision and Information Technologies, (IEEE CODIT), 2024
Publisher: NA

Making machine learning support accessible on the shop floor: visualising impeding bottlenecks in semiconductor manufacturing to induce proactive work behavior

Author(s): F. Lindner, V. Ramadasu, G. Schneider, G. Luhn
Published in: Euroma Conference, 2024
Publisher: Euroma Conference in Barcelona

Grammar-Constrained Decoding Makes Large Language Models Better Logical Parsers (opens in new window)

Author(s): Federico Raspanti, Tanir Ozcelebi, Mike Holenderski
Published in: Proceedings of the 63rd Annual Meeting of the Association for Computational Linguistics (Volume 6: Industry Track), 2025
Publisher: Association for Computational Linguistics
DOI: 10.18653/V1/2025.ACL-INDUSTRY.34

Integrating Transport Loads in Production Planning. A Simulation Approach

Author(s): V. Betker, M. Kühn, S. Rank, G. Schneider
Published in: 22th. European Advanced Process Control and Manufacturing Conference in Hamburg, 2024
Publisher: APCM

Unleashing Value-driven Creativity at Universities - Enabling “Industry5.0” from R&D to the High Tech Industries

Author(s): G. Luhn S. Keil G. Schneider F. Lindner G. Reiner
Published in: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Publisher: apcm

Sustainability is the new normal in high-volume semiconductor frontend production: Balancing WIP flow for energy availability, cost and peak consumption

Author(s): Hajo Terbrack, Holger Brandl, Tobias Sprogies, Karlheinz Leonardi
Published in: apcm conference Hamburg, 2024
Publisher: APCM

Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation

Author(s): F. Boni, R. De Monte, Y. Yang, N. Gentner, J. K. Low, G. A. Susto
Published in: 10th IEEE International Conference on Control, Decision and Information Technologies, (IEEE CODIT), 2024
Publisher: NA

Industry 5.0 and Operations Management—the Importance of Human Factors (opens in new window)

Author(s): Fabian Lindner, Gerald Reiner
Published in: NOMS 2023-2023 IEEE/IFIP Network Operations and Management Symposium, 2023, ISSN 2374-9709
Publisher: IEEE
DOI: 10.1109/NOMS56928.2023.10154282

Aggregated Simulation Modeling to Assess Product-Specific Safety Stock Targets During Market Up- and Downswings: A Case Study (opens in new window)

Author(s): Cas Rosman, Eric Weijers, Kai Schelthoff, Willem van Jaarsveld, Alp Akcay, Ivo Adan
Published in: 2024 Winter Simulation Conference (WSC), 2025
Publisher: IEEE
DOI: 10.1109/WSC63780.2024.10838984

A Life Cycle and Enabling Concepts for Green Business Process Management (opens in new window)

Author(s): Michel Medema, Bogdan Popescu, Vasilios Andrikopoulos, Dimka Karastoyanova
Published in: 2025 11th International Conference on ICT for Sustainability (ICT4S), 2025
Publisher: IEEE
DOI: 10.1109/ICT4S68164.2025.00037

Supporting Energy Management At IFX Using Artifical Intelligence

Author(s): F. Zoghlami, N. H. Annacota, M. Ernst, G. Welde, G. Schneider, C. Kögler, M. Wiese
Published in: Smart Systems Integration Conference in Hamburg, 2024
Publisher: SSI

AcME-AD: Accelerated Model Explanations for Anomaly Detection

Author(s): Valentina Zaccaria, David Dandolo, Chiara Masiero, Gian Antonio Susto
Published in: 2nd World Conference on eXplainable Artificial Intelligence, 2024
Publisher: NA

Jointly optimizing intralogistics, WIP flow and stocker management in a segregated high-automation semiconductor font-end fab

Author(s): Charlotte Lotze, Laurens Borgmann, Holger Brandl, Germar Schneider
Published in: apcm conference Hamburg, 2024
Publisher: APCM

Leveraging Machine Signals for Device-Level Quality Detection and Automatic Root Cause Analysis in Semiconductor Wire Bonding (opens in new window)

Author(s): Kenneth J. Braakman, D. Martin Knotter, Alp Akcay, Ivo Adan
Published in: 2024 Winter Simulation Conference (WSC), 2025
Publisher: IEEE
DOI: 10.1109/WSC63780.2024.10838790

Experimental Evaluation of Deep Neural Networks for Vehicle Model Identification

Author(s): Amira Moualhi, Maryam Nezami, Saleh Mulhem, Georg Schilbach
Published in: The 22nd European Control Conference (ECC), 2024
Publisher: NA

Variability reduction in semiconductor manufacturing using machine learning and explainable AI

Author(s): V. Ramadasu, F. Lindner, G. Reiner, G. Schneider, G. Luhn
Published in: 33rd European Conference on Operational Research in Copenhagen, 2024
Publisher: European Conference

Machine Learning and Explainable AI to Manage Process Variabilities and Resource Efficiencies in Semiconductor Manufacturing

Author(s): V. Ramadasu, F. Lindner, G. Reiner, G. Schneider, F. Lindner, G. Luhn
Published in: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Publisher: apcm

Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS) (opens in new window)

Author(s): Natalie Gentner, Gian Antonio Susto
Published in: Computer & Industrial Engineering, Issue Volume 187, 2024, ISSN 1879-0550
Publisher: Elsevier
DOI: 10.1016/j.cie.2023.109821

Constraints (opens in new window)

Author(s): Michel Medema; Luc Breeman; Alexander Lazovik
Published in: Constraints, 2024, ISSN 1383-7133
Publisher: Kluwer Academic Publishers
DOI: 10.1007/S10601-024-09374-7

A safeness condition for minimal separators based on vertex connectivity (opens in new window)

Author(s): Michel Medema, Alexander Lazovik
Published in: Discrete Mathematics, Issue 348, 2025, ISSN 0012-365X
Publisher: Elsevier BV
DOI: 10.1016/J.DISC.2025.114524

Limiting the memory consumption of caching for detecting subproblem dominance in constraint problems (opens in new window)

Author(s): Michel Medema, Luc Breeman, Alexander Lazovik
Published in: Constraints, Issue 29, 2024, ISSN 1383-7133
Publisher: Springer Science and Business Media LLC
DOI: 10.1007/S10601-024-09374-7

International Journal of Information Security (opens in new window)

Author(s): Tariq Bontekoe; Dimka Karastoyanova; Fatih Turkmen
Published in: International Journal of Information Security, 2025, ISSN 1615-5262
Publisher: Springer Verlag
DOI: 10.1007/S10207-025-01047-7

Pattern-based serverless data processing pipelines for Function-as-a-Service orchestration systems (opens in new window)

Author(s): A. Mathew, V. Andrikopoulos, F. J. Blaauw, and D. Karastoyanova
Published in: Future Generation Computer Systems, Issue Volume 154, 2024, ISSN 0167-739X
Publisher: Elsevier
DOI: 10.1016/J.FUTURE.2023.12.026

Learning Priority Indices for Energy-Aware Scheduling of Jobs on Batch Processing Machines. (opens in new window)

Author(s): Daniel Sascha Schorn, Lars Mönch
Published in: IEEE Transactions on Semiconductor Manufacturing, Issue 37(1), 2023, ISSN 1558-2345
Publisher: IEEE
DOI: 10.1109/TSM.2023.3326865

CeRULEo: Comprehensive utilitiEs for Remaining Useful Life Estimation methOds (opens in new window)

Author(s): Luciano Lorenti, Gian Antonio Susto
Published in: The Journal of Open Source Software, Issue 8(88), 5294, 2023, ISSN 2475-9066
Publisher: Open Journals
DOI: 10.21105/joss.05294

On the Way to Realize the 5th Industrial Revolution: Achievements, Challenges and Research Areas (opens in new window)

Author(s): """G. Dimirakopoulos, K. Karathanasopoulou, T. Gutt, H. Ehm, A. Lackner, A. Hoess, G. Schneider"""
Published in: IEEE Industrial Electronics Magazine, 2023, ISSN 2374-9709
Publisher: IEEE
DOI: 10.1109/NOMS56928.2023.10154446

Combining case-based reasoning and process mining for root cause analysis in complex manufacturing environments (opens in new window)

Author(s): M.C.A. van der Pas, A.E. Akçay, R.M. Dijkman, I.J.B.F. Adan
Published in: Manufacturing Letters, Issue 46, 2025, ISSN 2213-8463
Publisher: Elsevier BV
DOI: 10.1016/J.MFGLET.2025.11.010

IRIS at LLMs4OL 2025 Tasks B, C and D: Enhancing Ontology Learning Through Data Enrichment and Type Filtering (opens in new window)

Author(s): Insan-Aleksandr Latipov, Mike Holenderski, Nirvana Meratnia
Published in: Open Conference Proceedings, Issue 6, 2025, ISSN 2749-5841
Publisher: TIB Open Publishing
DOI: 10.52825/OCP.V6I.2895

Industry 5.0: Research Areas and Challenges With Artificial Intelligence and Human Acceptance (opens in new window)

Author(s): """G. Dimitrakopoulos, K. Karathanasopoulou, A. Lackner, P. Varga, J. Delsing, M. Tauber, G. Schneider, H. Ehm, T. Gutt, A. Hoess"""
Published in: IEEE Industrial Electronics Magazine, 2024, ISSN 1932-4529
Publisher: IEEE
DOI: 10.1109/MIE.2024.3387068

Root Cause Analysis in a Framework on Multi-Agent Systems in a Manufacturing Process

Author(s): Mitchel M. Ouwerkerk
Published in: 2025
Publisher: Eindhoven University of Technology

Finding effective preventive maintenance policies for multiple machines in a single buffered flow line

Author(s): Frank Hartman
Published in: 2024
Publisher: NA

An aggregation model for short-term WIP forecasting in a high-mix waferfab

Author(s): Bram Smits
Published in: 2023
Publisher: NA

Interpretable Evaluation of Factual Consistency in Abstractive Summarization

Author(s): Daan Hegger
Published in: 2023
Publisher: NA

The power of computer vision: enhancing manufacturing quality control by automated image classification

Author(s): Corinna Kofler & Isabell Dicillia-Kowatsch
Published in: 2024
Publisher: WiDS Villach

Carinthia dataset (opens in new window)

Author(s): Corinna Kofler, Sabrina Strauß, Anja Zernig, Ernesto Lazaro Garcia, Michael Boxleitner, Beatrix Mayr, Isabell Dicillia-Kowatsch, Claudia Anna Dohr
Published in: 2024
Publisher: Zenodo
DOI: 10.5281/zenodo.10715190

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