Artificial Intelligence in Manufacturing leading to Sustainability and Industry5.0

Información del proyecto

AIMS5.0

Identificador del acuerdo de subvención: 101112089

DOI

10.3030/101112089

Fecha de la firma de la CE 10 Mayo 2023

Fecha de inicio 1 Mayo 2023

Fecha de finalización 30 Septiembre 2026

Financiado con arreglo a

• Digital, Industry and Space

Coste total

€ 70 677 402,17

Aportación de la UE

€ 17 845 276,84

Coordinado por

INFINEON TECHNOLOGIES AG
Germany

CORDIS proporciona enlaces a los documentos públicos y las publicaciones de los proyectos de los programas marco HORIZONTE.

Los enlaces a los documentos y las publicaciones de los proyectos del Séptimo Programa Marco, así como los enlaces a algunos tipos de resultados específicos, como conjuntos de datos y «software», se obtienen dinámicamente de OpenAIRE .

Resultado final

Documents, reports (9)

Exploration of HW components for the edge processing platform

First, analysis of requirements from use cases and requirements to address objectives of WP2, WP3, and use-cases. Exploring of HW components fulfilling the requirements, the compatibility with sensors of the other partners, and under consideration of economic metrics.

Reports on updated Digital Reference 2

This will especially cover the extension to sustainability for external supply chain. For example, the details for the CO2 balance of automotive supply chain (including semiconductors) and regenerative energy generation supply chain (including semiconductors) is not in yet (DR).

Development and refinement plans for AI tools methods and algorithms

Preliminary descriptions of the AI tools methods and algorithms that are the basis of refinement and tai-loring according to the automation, process engineering and industrial supply chain requirements.Note: As this report is declared public, confidential annexes will be provided within the separate, sensitive deliverable D2.5.

Reports on updated Digital Reference 1

This will especially cover the extension to sustainability for internal semiconductor supply chain. For example, the ecological operating curve is not yet in the digital reference (DR)

Guidelines incl. checklist and self-assessment of how to ap-ply AI in the European industry
Final micro service architecture requirements and architecture realization

Detailed descriptions of requirements from use cases and requirements to address WP3 objectives with concrete proposals for addressing the requirements based on the Eclipse Arrowhead architecture and its implementation platform and which extensions that so far has been addressed.

Preliminary micro service requirements and first architecture concepts

First descriptions of requirements from use cases and requirements to address WP3 objectives with indications on possibilities for addressing the requirements based on the Eclipse Arrowhead architecture and implementation platform and which extensions that will be needed.

Reports on updated Digital Reference 3

This will cover the remaining classes and characteristics missing to come up with a complete ontology allowing to generate computer based efficiently the CO2 balance (DR).

Compilation of the methods and sources evaluated for the guidelines for all industrial AI Use Cases

Publicaciones

Peer reviewed articles (19)

Efficient Gerchberg–Saxton algorithm deep unrolling for phase retrieval with a complex forward path

Autores: Shengyuan Yan, Mike Holenderski, Nirvana Meratnia
Publicado en: Advanced Photonics Nexus, Edición 5, 2026, ISSN 2791-1519
Editor: SPIE-Intl Soc Optical Eng
DOI: 10.1117/1.APN.5.2.026005

A Deep Learning Approach for Aluminum Corrosion Recognition in Semiconductor Manufacturing

Autores: Stefano Binotto, Luca Brunelli, Manuel Barusco, Chiara Masiero, Gian Antonio Susto
Publicado en: IFAC-PapersOnLine, Edición 59, 2025, ISSN 2405-8963
Editor: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.103

Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS)

Autores: Natalie Gentner, Gian Antonio Susto
Publicado en: Computer & Industrial Engineering, Edición Volume 187, 2024, ISSN 1879-0550
Editor: Elsevier
DOI: 10.1016/j.cie.2023.109821

Multi-Partner Project: Artificial Intelligence in Manufacturing Leading to Sustainability and the Consideration of Human Aspects (AIMS5.0)

Autores: Anouar Nechi, Yasin Ghafourian, Belal Abu Naim, Thomas Gutt, George Dimitrakopoulos, Amira Moualhi, Mladen Berekovic, Pal Varga, Markus Tauber
Publicado en: 2025 Design, Automation & Test in Europe Conference (DATE), 2025, ISSN 1558-1101
Editor: IEEE
DOI: 10.23919/DATE64628.2025.10993208

Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study

Autores: Manuel Barusco, Francesco Borsatti, Youssef Ben Khalifa, Davide Dalle Pezze, Gian Antonio Susto
Publicado en: IFAC-PapersOnLine, Edición 59, 2025, ISSN 2405-8963
Editor: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.018

A safeness condition for minimal separators based on vertex connectivity

Autores: Michel Medema, Alexander Lazovik
Publicado en: Discrete Mathematics, Edición 348, 2025, ISSN 0012-365X
Editor: Elsevier BV
DOI: 10.1016/J.DISC.2025.114524

Limiting the memory consumption of caching for detecting subproblem dominance in constraint problems

Autores: Michel Medema, Luc Breeman, Alexander Lazovik
Publicado en: Constraints, Edición 29, 2024, ISSN 1383-7133
Editor: Springer Science and Business Media LLC
DOI: 10.1007/S10601-024-09374-7

Enhancing interpretability and generalizability in extended isolation forests

Autores: Alessio Arcudi, Davide Frizzo, Chiara Masiero, Gian Antonio Susto
Publicado en: Engineering Applications of Artificial Intelligence, Edición 138, 2024, ISSN 0952-1976
Editor: Elsevier BV
DOI: 10.1016/J.ENGAPPAI.2024.109409

International Journal of Information Security

Autores: Tariq Bontekoe; Dimka Karastoyanova; Fatih Turkmen
Publicado en: International Journal of Information Security, 2025, ISSN 1615-5262
Editor: Springer Verlag
DOI: 10.1007/S10207-025-01047-7

Pattern-based serverless data processing pipelines for Function-as-a-Service orchestration systems

Autores: A. Mathew, V. Andrikopoulos, F. J. Blaauw, and D. Karastoyanova
Publicado en: Future Generation Computer Systems, Edición Volume 154, 2024, ISSN 0167-739X
Editor: Elsevier
DOI: 10.1016/J.FUTURE.2023.12.026

Learning Priority Indices for Energy-Aware Scheduling of Jobs on Batch Processing Machines.

Autores: Daniel Sascha Schorn, Lars Mönch
Publicado en: IEEE Transactions on Semiconductor Manufacturing, Edición 37(1), 2023, ISSN 1558-2345
Editor: IEEE
DOI: 10.1109/TSM.2023.3326865

CeRULEo: Comprehensive utilitiEs for Remaining Useful Life Estimation methOds

Autores: Luciano Lorenti, Gian Antonio Susto
Publicado en: The Journal of Open Source Software, Edición 8(88), 5294, 2023, ISSN 2475-9066
Editor: Open Journals
DOI: 10.21105/joss.05294

On the Way to Realize the 5th Industrial Revolution: Achievements, Challenges and Research Areas

Autores: """G. Dimirakopoulos, K. Karathanasopoulou, T. Gutt, H. Ehm, A. Lackner, A. Hoess, G. Schneider"""
Publicado en: IEEE Industrial Electronics Magazine, 2023, ISSN 2374-9709
Editor: IEEE
DOI: 10.1109/NOMS56928.2023.10154446

On temporally bounded spatial dynamic sampling for metrology optimization

Autores: Gian Antonio Susto, Davide Marcato, Marco Doná, Marco Maggipinto, Seán McLoone
Publicado en: Flexible Services and Manufacturing Journal, 2026, ISSN 1936-6582
Editor: Springer Science and Business Media LLC
DOI: 10.1007/S10696-026-09667-4

Combining case-based reasoning and process mining for root cause analysis in complex manufacturing environments

Autores: M.C.A. van der Pas, A.E. Akçay, R.M. Dijkman, I.J.B.F. Adan
Publicado en: Manufacturing Letters, Edición 46, 2025, ISSN 2213-8463
Editor: Elsevier BV
DOI: 10.1016/J.MFGLET.2025.11.010

Workers’ Attitudes Towards Digital Transformation and Perceived Well-Being At Work: A Case Study

Autores: Fabian Lindner, Kazimierz Adam Przybysz, Germar Schneider, Sophia Keil
Publicado en: ACC JOURNAL, Edición 30, 2024, ISSN 2571-0613
Editor: Walter de Gruyter GmbH
DOI: 10.2478/ACC-2024-0006

Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing

Autores: Adrian Poniatowski, Natalie Gentner, Manuel Barusco, Davide Dalle Pezze, Samuele Salti, Gian Antonio Susto
Publicado en: IEEE Transactions on Automation Science and Engineering, Edición 23, 2025, ISSN 1545-5955
Editor: Institute of Electrical and Electronics Engineers (IEEE)
DOI: 10.1109/TASE.2025.3621854

IRIS at LLMs4OL 2025 Tasks B, C and D: Enhancing Ontology Learning Through Data Enrichment and Type Filtering

Autores: Insan-Aleksandr Latipov, Mike Holenderski, Nirvana Meratnia
Publicado en: Open Conference Proceedings, Edición 6, 2025, ISSN 2749-5841
Editor: TIB Open Publishing
DOI: 10.52825/OCP.V6I.2895

Industry 5.0: Research Areas and Challenges With Artificial Intelligence and Human Acceptance

Autores: """G. Dimitrakopoulos, K. Karathanasopoulou, A. Lackner, P. Varga, J. Delsing, M. Tauber, G. Schneider, H. Ehm, T. Gutt, A. Hoess"""
Publicado en: IEEE Industrial Electronics Magazine, 2024, ISSN 1932-4529
Editor: IEEE
DOI: 10.1109/MIE.2024.3387068

Conference proceedings (34)

Digitalisation & AI for Industry 5.0 Applications to Make Semiconductor Manufacturing Sustainable

Autores: G. Schneider, F. Zoghlami, G. Luhn, F. Lindner, S .Keil
Publicado en: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Editor: apcm Conference in Hamburg

Data Augmentation Based on Depth Information for Neural Radiance Fields

Autores: Hamed Razavi Khosroshahi, Jaime Sancho, Gun Bang, Gauthier Lafruit, Eduardo Juarez, and Mehrdad Teratani
Publicado en: Electronic Imaging Symposium, 2024
Editor: NA

Let's Have a Chat with the EU AI Act

Autores: Ádám Kővári, Yasin Ghafourian, Csaba Hegedus, Belal Abu Naim, Kitti Mezei, Pál Varga, Markus Tauber
Publicado en: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025, ISSN 2374-9709
Editor: IEEE
DOI: 10.1109/NOMS57970.2025.11073655

A Self-assessment Tool to Encourage the Uptake of Artificial Intelligence in Digital Workspaces

Autores: Belal Abu Naim, Yasin Ghafourian, Markus Tauber, Fabian Lindner, Christoph Schmittner, Erwin Schoitsch, Germar Schneider, Olga Kattan, Gerald Reiner, Anna Ryabokon, Francesca Flamigni, Konstantina Karathanasopoulou, George Dimitrakopoulos
Publicado en: NOMS 2024-2024 IEEE Network Operations and Management Symposium, Edición 1, 2024
Editor: IEEE
DOI: 10.1109/NOMS59830.2024.10575125

Extended B-ALIF: Improving Anomaly Detection with Human Feedback

Autores: Valentina Zaccaria, Davide Sartor, Gian Antonio Susto
Publicado en: 2024 32nd Mediterranean Conference on Control and Automation (MED), 2024
Editor: IEEE
DOI: 10.1109/MED61351.2024.10566235

Accelerated Explainable Anomaly Detection for Semiconductor Manufacturing

Autores: Beatrice Sofia Bertipaglia, Luca Brunelli, Alessandro Peratoner, Enrico Convento, Chiara Masiero, Gian Antonio Susto, Alessandro Beghi
Publicado en: Proceedings of the 2026 IFAC World Congress
Editor: Elsevier

Interpretable Data-Driven Anomaly Detection in Industrial Processes with ExIFFI

Autores: Davide Frizzo, Francesco Borsatti, Alessio Arcudi, Antonio De Moliner, Roberto Oboe, Gian Antonio Susto
Publicado en: 2024 IEEE 8th Forum on Research and Technologies for Society and Industry Innovation (RTSI), 2024
Editor: IEEE
DOI: 10.1109/RTSI61910.2024.10761374

Voxel-Based Simulation in Comparison for Path Planning of Autonomous Indoor Multicopters

Autores: H. Kumpe, B. Küster, M. Stonis, L. Overmeyer
Publicado en: 2025 International Conference on Unmanned Aircraft Systems (ICUAS), 2025
Editor: IEEE
DOI: 10.1109/ICUAS65942.2025.11007844

Enabling Efficient and Flexible Interpretability of Data-driven Anomaly Detection in Industrial Processes with AcME-AD

Autores: V. Zaccaria, D. Dandolo, C. Masiero, G.A. Susto
Publicado en: 10th IEEE International Conference on Control, Decision and Information Technologies, (IEEE CODIT), 2024
Editor: NA

Applied AI for Adaptive Robotic Conveyor-Feeding

Autores: Guntis V. Strazds, Katrīna Viltrake, Gergely Hollósi, Laura Leja, Arnis Priedītis, Diāna Dupļevska, Makss Meiers, Christos Chronis, Iraklis Varlamis, George Dimitrakopoulos, Karlis Freivalds
Publicado en: IFAC-PapersOnLine, Edición 59, 2025, ISSN 2405-8963
Editor: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.105

Making machine learning support accessible on the shop floor: visualising impeding bottlenecks in semiconductor manufacturing to induce proactive work behavior

Autores: F. Lindner, V. Ramadasu, G. Schneider, G. Luhn
Publicado en: Euroma Conference, 2024
Editor: Euroma Conference in Barcelona

Grammar-Constrained Decoding Makes Large Language Models Better Logical Parsers

Autores: Federico Raspanti, Tanir Ozcelebi, Mike Holenderski
Publicado en: Proceedings of the 63rd Annual Meeting of the Association for Computational Linguistics (Volume 6: Industry Track), 2025
Editor: Association for Computational Linguistics
DOI: 10.18653/V1/2025.ACL-INDUSTRY.34

Improving Plan Stability in Semiconductor Manufacturing Through Stochastic Optimization: A Case Study

Autores: Eric Weijers, Nino Sluijter, Gijs Hogers, Kai Schelthoff, Ivo Adan, Willem van Jaarsveld
Publicado en: 2025 Winter Simulation Conference (WSC), 2026, ISSN 1558-4305
Editor: IEEE
DOI: 10.1109/WSC68292.2025.11339055

An AI-Gym for Industry 4.0

Autores: Belal Abu Naim, Mojtaba Zahedi Amiri, Markus Tauber
Publicado en: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025
Editor: IEEE
DOI: 10.1109/NOMS57970.2025.11073648

Integrating Transport Loads in Production Planning. A Simulation Approach

Autores: V. Betker, M. Kühn, S. Rank, G. Schneider
Publicado en: 22th. European Advanced Process Control and Manufacturing Conference in Hamburg, 2024
Editor: APCM

A Generic Framework for Resource-Limited Microcontrollers Deployment in I-IoT Systems

Autores: Belal Abu Naim, Yasin Ghafourian, Anna Ryabokon, Francesca Flamigni, Ralph Baldrian
Publicado en: NOMS 2024-2024 IEEE Network Operations and Management Symposium, 2024
Editor: IEEE
DOI: 10.1109/NOMS59830.2024.10575590

Unleashing Value-driven Creativity at Universities - Enabling “Industry5.0” from R&D to the High Tech Industries

Autores: G. Luhn S. Keil G. Schneider F. Lindner G. Reiner
Publicado en: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Editor: apcm

Understanding Stakeholders of Industrial AI: Insights from a Persona-Based Questionnaire

Autores: Yasin Ghafourian, Fabian Lindner, Olga Kattan, Konstantina Karathanasopoulou, Markus Tauber, George Dimitrakopoulos
Publicado en: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025, ISSN 2374-9709
Editor: IEEE
DOI: 10.1109/NOMS57970.2025.11073619

Differentiable Physics Training Method for Robot Motion Planning

Autores: Laura Leja, Guntis Vilnis Strazds, Christos Chronis, Iraklis Varlamis, Kārlis Freivalads
Publicado en: IFAC-PapersOnLine, Edición 59, 2025, ISSN 2405-8963
Editor: Elsevier BV
DOI: 10.1016/J.IFACOL.2025.12.106

Sustainability is the new normal in high-volume semiconductor frontend production: Balancing WIP flow for energy availability, cost and peak consumption

Autores: Hajo Terbrack, Holger Brandl, Tobias Sprogies, Karlheinz Leonardi
Publicado en: apcm conference Hamburg, 2024
Editor: APCM

Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation

Autores: F. Boni, R. De Monte, Y. Yang, N. Gentner, J. K. Low, G. A. Susto
Publicado en: 10th IEEE International Conference on Control, Decision and Information Technologies, (IEEE CODIT), 2024
Editor: NA

Industry 5.0 and Operations Management—the Importance of Human Factors

Autores: Fabian Lindner, Gerald Reiner
Publicado en: NOMS 2023-2023 IEEE/IFIP Network Operations and Management Symposium, 2023, ISSN 2374-9709
Editor: IEEE
DOI: 10.1109/NOMS56928.2023.10154282

Time and resourceutilization of a voxel-based simulation for indoor multicopters

Autores: Hendrik Kumpe, Benjamin Küster, Malte Stonis, Ludger Overmeyer
Editor: TU Dortmund

Aggregated Simulation Modeling to Assess Product-Specific Safety Stock Targets During Market Up- and Downswings: A Case Study

Autores: Cas Rosman, Eric Weijers, Kai Schelthoff, Willem van Jaarsveld, Alp Akcay, Ivo Adan
Publicado en: 2024 Winter Simulation Conference (WSC), 2025
Editor: IEEE
DOI: 10.1109/WSC63780.2024.10838984

A Life Cycle and Enabling Concepts for Green Business Process Management

Autores: Michel Medema, Bogdan Popescu, Vasilios Andrikopoulos, Dimka Karastoyanova
Publicado en: 2025 11th International Conference on ICT for Sustainability (ICT4S), 2025
Editor: IEEE
DOI: 10.1109/ICT4S68164.2025.00037

Supporting Energy Management At IFX Using Artifical Intelligence

Autores: F. Zoghlami, N. H. Annacota, M. Ernst, G. Welde, G. Schneider, C. Kögler, M. Wiese
Publicado en: Smart Systems Integration Conference in Hamburg, 2024
Editor: SSI

AcME-AD: Accelerated Model Explanations for Anomaly Detection

Autores: Valentina Zaccaria, David Dandolo, Chiara Masiero, Gian Antonio Susto
Publicado en: 2nd World Conference on eXplainable Artificial Intelligence, 2024
Editor: NA

Jointly optimizing intralogistics, WIP flow and stocker management in a segregated high-automation semiconductor font-end fab

Autores: Charlotte Lotze, Laurens Borgmann, Holger Brandl, Germar Schneider
Publicado en: apcm conference Hamburg, 2024
Editor: APCM

SOA Engineering Support for Building Autonomous Elements in Industrial Food Production

Autores: Belal Abu Naim, Oliver Zendel, Yasin Ghafourian, Ralph Baldrian, Francesca Flamigni, Markus Tauber
Publicado en: NOMS 2025-2025 IEEE Network Operations and Management Symposium, 2025
Editor: IEEE
DOI: 10.1109/NOMS57970.2025.11073573

Leveraging Machine Signals for Device-Level Quality Detection and Automatic Root Cause Analysis in Semiconductor Wire Bonding

Autores: Kenneth J. Braakman, D. Martin Knotter, Alp Akcay, Ivo Adan
Publicado en: 2024 Winter Simulation Conference (WSC), 2025
Editor: IEEE
DOI: 10.1109/WSC63780.2024.10838790

Experimental Evaluation of Deep Neural Networks for Vehicle Model Identification

Autores: Amira Moualhi, Maryam Nezami, Saleh Mulhem, Georg Schilbach
Publicado en: The 22nd European Control Conference (ECC), 2024
Editor: NA

Variability reduction in semiconductor manufacturing using machine learning and explainable AI

Autores: V. Ramadasu, F. Lindner, G. Reiner, G. Schneider, G. Luhn
Publicado en: 33rd European Conference on Operational Research in Copenhagen, 2024
Editor: European Conference

Machine Learning and Explainable AI to Manage Process Variabilities and Resource Efficiencies in Semiconductor Manufacturing

Autores: V. Ramadasu, F. Lindner, G. Reiner, G. Schneider, F. Lindner, G. Luhn
Publicado en: 22th. European Advanced Process Control and Manufacturing Conference, 2024
Editor: apcm

Terrain Issue Detection for Servitization of Autonomous Lawn Mowing

Autores: Alan Araujo, Carl Borngrund, Ulf Bodin, Olov Schelén, Erik Zeitler
Publicado en: 2025 IEEE 30th International Conference on Emerging Technologies and Factory Automation (ETFA), 2025
Editor: IEEE
DOI: 10.1109/ETFA65518.2025.11205594

Thesis and dissertations (8)

Improving Plan Stability for Front-End Master Planning Using Chance-Constrained Formulations

Autores: Lars van der Griend
Publicado en: 2025

Enhancing Semiconductor Supply Chain Simulation: Incorporating Demand Patterns and Lifecycle Phases

Autores: Nino Sluijter
Publicado en: 2025

Grammar Constrained Large Language Models for Logical Reasoning

Autores: Federico Raspanti
Editor: Eindhoven University of Technology

Root Cause Analysis in a Framework on Multi-Agent Systems in a Manufacturing Process

Autores: Mitchel M. Ouwerkerk
Publicado en: 2025
Editor: Eindhoven University of Technology

Finding effective preventive maintenance policies for multiple machines in a single buffered flow line

Autores: Frank Hartman
Publicado en: 2024
Editor: NA

An aggregation model for short-term WIP forecasting in a high-mix waferfab

Autores: Bram Smits
Publicado en: 2023
Editor: NA

Interpretable Evaluation of Factual Consistency in Abstractive Summarization

Autores: Daan Hegger
Publicado en: 2023
Editor: NA

Development and analysis of a fusion of visual and point cloud SLAM algorithms with respect to applicability in the industrial production environment

Autores: Yumao Liu
Editor: LUH

Other (3)

Dataset: Large-scale multi-shape phase retrieval dataset for PBF-LB/M laser beam shaping SLM phase mask estimation

Autores: Shengyuan Yan, Mike Holenderski, Nirvana Meratnia
Editor: Figshare
DOI: 10.6084/M9.FIGSHARE.30131893

The power of computer vision: enhancing manufacturing quality control by automated image classification

Autores: Corinna Kofler & Isabell Dicillia-Kowatsch
Publicado en: 2024
Editor: WiDS Villach

Carinthia dataset

Autores: Corinna Kofler, Sabrina Strauß, Anja Zernig, Ernesto Lazaro Garcia, Michael Boxleitner, Beatrix Mayr, Isabell Dicillia-Kowatsch, Claudia Anna Dohr
Publicado en: 2024
Editor: Zenodo
DOI: 10.5281/zenodo.10715190