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NEXT GENENRATION OF X-RAY METROLOGY

Project description

Compact advanced X-ray metrology instrument

The demand for semiconductor devices, low-power electronics, electric vehicles, sensors and the Internet of Things has driven the development of new thin film materials. Scientists employ X-rays, studying their crystal properties and establishing correlations with their electronic characteristics. Recently, Sirius X-ray Solutions introduced XRS SEMI, a compact, advanced X-ray metrology instrument featuring a newly developed X-ray optic and a state-of-the-art detector. The EU-funded Next Gen XRM project will use XRS SEMI for evaluating the crystalline structure of thin film materials. As part of the WomenTechEU programme, Sirius X-ray Solutions will finalise and integrate a software toolbox based on machine learning and theoretical model simulation into the Sirius XRS platform to enhance its analytical performance.

Objective

Due to increased demand for semiconductor devices, low-power electronics, electric vehicles, sensors, IoT (Internet of things), new complex thin film materials are constantly engineered by sophisticated MBE (molecular beam epitaxy), PVD (physical vapour deposition) or ALD (atomic layer deposition). X-rays are well suited to assess the crystalline structure of new thin film materials due to the intrinsic properties of X-rays to probe material on the sub-nanometer scale. These crystal properties (film thickness, composition, strain, stress, interdiffusion and epitaxial relation) are then correlated to the electronic properties.
Sirius X-ray Solutions is an innovative German SME with the mission to develop and manufacture high-performance customised X-ray instrumentation for semiconductor and material characterisation applications.
After years of R&D, it has developed XRS SEMI, a compact (1m x 1m) advanced X-ray metrology instrument, which combines a newly developed X-ray optic, state-of-the-art detector, fast control software and fast, accurate data analysis software. XRS SEMI is used to assess the crystalline structure of new thin film materials due to the intrinsic properties of X-rays to probe material on the sub-nanometer scale. XRS SEMI has been sold and validated to prestigious research institutions and innovative SMEs such as the Fraunhofer Institute for Photonic Microsystems, the University of Leuven, Lumiphase AG and Soitec. The X-ray metrology instrument, developed by SIRIUS, can measure at least 10 times faster than the competition, with a selling price 2 times lower. It addresses the growing niche market (200mm wafers) within the semiconductor market of X-ray metrology for MEMS, photonics and sensors.
Within the WomenTechEU programme Sirius X-ray Solutions will finalise and integrate the software toolbox, based on machine learning and theoretical models' simulation, into the Sirius XRS platform to optimise the software's analytical performance.

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HORIZON-CSA - HORIZON Coordination and Support Actions

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Call for proposal

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(opens in new window) HORIZON-EIE-2022-SCALEUP-02

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Coordinator

SIRIUS X-RAY SOLUTIONS GMBH
Net EU contribution

Net EU financial contribution. The sum of money that the participant receives, deducted by the EU contribution to its linked third party. It considers the distribution of the EU financial contribution between direct beneficiaries of the project and other types of participants, like third-party participants.

€ 75 000,00
Address
NEUE STR. 95
73230 Kirchheim Unter Teck
Germany

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Region
Baden-Württemberg Stuttgart Esslingen
Activity type
Private for-profit entities (excluding Higher or Secondary Education Establishments)
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Total cost

The total costs incurred by this organisation to participate in the project, including direct and indirect costs. This amount is a subset of the overall project budget.

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