Twinning for Excellence in Reliable Electronics

Project Information

TWIN-RELECT

Grant agreement ID: 101160314

DOI

10.3030/101160314

EC signature date 29 April 2024

Start date 1 October 2024

End date 30 September 2027

Funded under

• Widening participation and spreading excellence

Total cost

No data

EU contribution

€ 1 197 976,25

Coordinated by

PANEPISTIMIO THESSALIAS
Greece

CORDIS provides links to public deliverables and publications of HORIZON projects.

Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Publications

Conference proceedings (12)

A Synthesis Toolflow for the Predictable Implementation of High-Performance Bundled-Data Asynchronous NoCs on FPGA

Author(s): Giuseppe Chessa; Elena Bellodi; Michele Favalli; Davide Zoni; Davide Bertozzi
Published in: 2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC), 2025, ISSN 2643-1483
Publisher: IEEE
DOI: 10.1109/ASYNC65240.2025.00013

Prediction of Single Event Transient Propagation Using Machine Learning Models

Author(s): Marko Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Christos Sotiriou, Fabian Vargas
Published in: 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), 2025
Publisher: IEEE
DOI: 10.1109/SMACD65553.2025.11092057

Compact SER Models via Model Order Reduction of Diffusion-Based Charge Collection

Author(s): Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, George Floros
Published in: 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), 2025
Publisher: IEEE
DOI: 10.1109/SMACD65553.2025.11092292

Design and Reliability Analysis of a Pipeline RISC-V Processor Core

Author(s): Thiago H. Rausch, Wesley Grignani, Luigi Dilillo, and Douglas R. Melo
Published in: IEEE Latin-American Test Symp. (LATS), 2026, 2026
Publisher: IEEE

Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension

Author(s): Carolina Imianosky, Douglas A. Santos, Luigi Dilillo
Published in: 2025 10th International Workshop on Advances in Sensors and Interfaces (IWASI), 2025
Publisher: IEEE
DOI: 10.1109/IWASI66786.2025.11121981

Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT)

Author(s): Andjelkovic, Marko; Vargas, Fabian; Krstic, Milos; Dilillo, Luigi; Michez, Alain; Wrobel, Frederic; Bertozzi, Davide; Luján, Mikel; Georgakidis, Christos; Chatzivangelis, Nikolaos; Tsilingiri, Katerina; Zazatis, Nikolaos Zazatis; Paliaroutis, Georgios Ioanis; Tsoumanis, Pelopidas; Sotiriou, Christos
Published in: 2025 Design, Automation & Test in Europe Conference (DATE), 2025, ISSN 1558-1101
Publisher: IEEE
DOI: 10.23919/DATE64628.2025.10992721

Post-Placement Timing Optimisations on Asynchronous Designs

Author(s): Dimitrios Tsalapatas, Nikolaos Chatzivangelis, Christos P. Sotiriou, Nikolaos Sketopoulos
Published in: 2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC), 2025
Publisher: IEEE
DOI: 10.1109/ASYNC65240.2025.00025

Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments

Author(s): Nikoloas Chatzivangelis, Nikoloas Zazatis, Wesley Grignani, Georgios-Ioannis Paliaroutis, Douglas A. Santos, Carolina Imianosky, Maria Kastriotou, Carlo Cazzaniga, Frédéric Wrobel, Alessandro Veronesi, Christos Sotiriou, Marko Andjelkovic, Fabian L. Vargas, Davide Bertozzi, Luigi Dilillo
Published in: 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2025
Publisher: IEEE
DOI: 10.1109/DFT66274.2025.11257502

Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction

Author(s): Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros
Published in: 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2025
Publisher: IEEE
DOI: 10.1109/DFT66274.2025.11257486

Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-Based FPGA under Proton Irradiation

Author(s): Wesley Grignani, Douglas A. Santos, Carolina Imianosky, Douglas R. Melo, Frédéric Wrobel, and Luigi Dilillo
Published in: IEEE Latin-American Test Symp. (LATS), 2026, 2026
Publisher: IEEE

Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture under SEU Fault Injection

Author(s): Douglas A. Santos, Wesley Grignani, Carolina Imianosky, Douglas R. Melo, and Luigi Dilillo
Published in: IEEE Latin-American Test Symp. (LATS), 2025, 2025
Publisher: IEEE

Fault Injection Attacks Based on Layout-Driven SER Analysis

Author(s): Alexandra Takou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Nestor Evmorfopoulos, George Stamoulis
Published in: 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), 2025
Publisher: IEEE
DOI: 10.1109/SMACD65553.2025.11092174

Peer reviewed articles (3)

UPSET: A Comprehensive Probabilistic Single Event Transient Analysis Flow for VLSI Circuits Using Static Timing Analysis

Author(s): Christos Georgakidis, Dimitris Valiantzas, Nikolaos Chatzivangelis, Marko Andjelkovic, Christos Sotiriou, Milos Krstic
Published in: Electronics, Issue 15, 2026, ISSN 2079-9292
Publisher: MDPI AG
DOI: 10.3390/ELECTRONICS15040818

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Author(s): Su, Zhe; Ramini, Simone; Coffen Marcolin, Demetra; Veronesi, Alessandro; Krstic, Milos; Indiveri, Giacomo; Bertozzi, Davide; Nowick, Steven M
Published in: IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 2024, ISSN 2156-3357
Publisher: IEEE
DOI: 10.5167/UZH-268876

Efficient Reliability-Aware Hardware Trojan Design and Insertion for SET-Induced Soft Error Attacks

Author(s): Alexandra Takou, Georgios-Ioannis Paliaroutis, Pelopidas Tsoumanis, Marko Andjelkovic, Fabian Vargas, Nestor Evmorfopoulos, George Stamoulis
Published in: Electronics, Issue 15, 2026, ISSN 2079-9292
Publisher: MDPI AG
DOI: 10.3390/ELECTRONICS15020425