NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Resultado final

Health monitoring guideline
List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).
Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Internal training package available for operators and maintenance engineers inside the consortium.
Training package available for safety professionals to conduct risk banding, risk assessments and monitoring.

Website

Report about the Stakeholder Workshop

Workshop report

Publicaciones

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autores: Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Publicado en: Edición 1, 2019
Editor: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Autores: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Publicado en: Edición 2, 2017
Editor: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Autores: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Publicado en: Edición 3, 2018
Editor: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Autores: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Publicado en: Edición 3, 2017
Editor: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Autores: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Publicado en: Edición 1, 2016
Editor: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autores: Michael Jank; Marc Heyns
Publicado en: Edición 2, 2017
Editor: -
DOI: 10.5281/zenodo.557082

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Autores: Dimiter Prodanov
Publicado en: Entropy, Edición 20/7, 2018, Página(s) 492, ISSN 1099-4300
Editor: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Autores: Dimiter Prodanov
Publicado en: Biomedical Reviews, Edición 28/0, 2018, Página(s) 100, ISSN 1310-392X
Editor: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Autores: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Publicado en: Journal of Physics: Conference Series, Edición 838, 2017, Página(s) 012017, ISSN 1742-6588
Editor: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Autores: Jank, Michael; Bauer, Anton; Frey, Lothar
Publicado en: Fraunhofer IISB, Edición 3, 2016
Editor: -

Buscando datos de OpenAIRE...

Resultado final

Publicaciones

Compartir esta página

Descargar