NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Leistungen

Health monitoring guideline
List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).
Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Internal training package available for operators and maintenance engineers inside the consortium.
Training package available for safety professionals to conduct risk banding, risk assessments and monitoring.

Website

Report about the Stakeholder Workshop

Workshop report

Veröffentlichungen

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autoren: Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Veröffentlicht in: Ausgabe 1, 2019
Herausgeber: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Autoren: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Veröffentlicht in: Ausgabe 2, 2017
Herausgeber: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Autoren: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Veröffentlicht in: Ausgabe 3, 2018
Herausgeber: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Autoren: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Veröffentlicht in: Ausgabe 3, 2017
Herausgeber: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Autoren: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Veröffentlicht in: Ausgabe 1, 2016
Herausgeber: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Autoren: Michael Jank; Marc Heyns
Veröffentlicht in: Ausgabe 2, 2017
Herausgeber: -
DOI: 10.5281/zenodo.557082

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Autoren: Dimiter Prodanov
Veröffentlicht in: Entropy, Ausgabe 20/7, 2018, Seite(n) 492, ISSN 1099-4300
Herausgeber: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Autoren: Dimiter Prodanov
Veröffentlicht in: Biomedical Reviews, Ausgabe 28/0, 2018, Seite(n) 100, ISSN 1310-392X
Herausgeber: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Autoren: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Veröffentlicht in: Journal of Physics: Conference Series, Ausgabe 838, 2017, Seite(n) 012017, ISSN 1742-6588
Herausgeber: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Autoren: Jank, Michael; Bauer, Anton; Frey, Lothar
Veröffentlicht in: Fraunhofer IISB, Ausgabe 3, 2016
Herausgeber: -

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