NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Livrables

List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).

Assessment report: gaps identified about water and wastewater characterization

A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM

Comparison of occupational exposure values

Recommendations for use of emission monitoring as a complement to risk banding

Report on establishment NanoStreeM Safety Community

Public Project factsheet

List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry

For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.

Public final project report

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Internal training package available for operators and maintenance engineers inside the consortium.

Training package available for safety professionals to conduct risk banding, risk assessments and monitoring.

Website

Report about the Stakeholder Workshop

Workshop report

Publications

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Auteurs: Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Publié dans: 1, 2019
Éditeur: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Auteurs: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Publié dans: 2, 2017
Éditeur: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Auteurs: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Publié dans: 3, 2018
Éditeur: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Auteurs: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Publié dans: 3, 2017
Éditeur: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Auteurs: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Publié dans: 1, 2016
Éditeur: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Auteurs: Michael Jank; Marc Heyns
Publié dans: 2, 2017
Éditeur: -
DOI: 10.5281/zenodo.557082

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Auteurs: Dimiter Prodanov
Publié dans: Entropy, 20/7, 2018, Page(s) 492, ISSN 1099-4300
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Auteurs: Dimiter Prodanov
Publié dans: Biomedical Reviews, 28/0, 2018, Page(s) 100, ISSN 1310-392X
Éditeur: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Auteurs: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Publié dans: Journal of Physics: Conference Series, 838, 2017, Page(s) 012017, ISSN 1742-6588
Éditeur: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Auteurs: Jank, Michael; Bauer, Anton; Frey, Lothar
Publié dans: Fraunhofer IISB, 3, 2016
Éditeur: -

Ensemble de données

Cole Hopf Transformations in Maxima

Auteurs: Dimiter Prodanov
Publié dans: Zenodo

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry (dataset)

Auteurs: Prodanov, Dimiter; Moclair, Fiona; Belde, Peter
Publié dans: Zenodo

Livrables

Publications

Ensemble de données

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