NANOmaterials: STRategies for Safety Assessments in advanced Integrated Circuits Manufacturing

Informations projet

NanoStreeM

N° de convention de subvention: 688194

DOI

10.3030/688194

Projet clôturé

Date de signature de la CE 3 Decembre 2015

Date de début 1 Janvier 2016

Date de fin 31 Decembre 2018

Financé au titre de

• INDUSTRIAL LEADERSHIP - Leadership in enabling and industrial technologies - Information and Communication Technologies (ICT)

Coût total

€ 1 157 621,25

Contribution de l’UE

€ 1 157 621,25

Coordonné par

INTERUNIVERSITAIR MICRO-ELECTRONICA CENTRUM
Belgium

CORDIS fournit des liens vers les livrables publics et les publications des projets HORIZON.

Les liens vers les livrables et les publications des projets du 7e PC, ainsi que les liens vers certains types de résultats spécifiques tels que les jeux de données et les logiciels, sont récupérés dynamiquement sur OpenAIRE .

Livrables

Documents, reports (15)

Health monitoring guideline
List of air sampling equipments & List of environmental and individual monitoring devices

. List of air sampling equipments . List of environmental and individual monitoring devices

Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2).
Assessment report: gaps identified about water and wastewater characterization
A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM
Comparison of occupational exposure values
Recommendations for use of emission monitoring as a complement to risk banding
Report on establishment NanoStreeM Safety Community
Public Project factsheet
List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified

. List of standards for air sampling, as applicable in semiconductor activity . Gaps identified

Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry

Gap analysis on information and data for NP exposure scenarios in semiconductor industry

A set of typical relevant exposure scenarios for NP’s in semiconductor industry
For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur.
Public final project report
A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Other (2)

Internal training package available for operators and maintenance engineers inside the consortium.
Training package available for safety professionals to conduct risk banding, risk assessments and monitoring.

Websites, patent fillings, videos etc. (1)

Website

Open Research Data Pilot (1)

Report about the Stakeholder Workshop

Workshop report

Publications

Other (6)

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Auteurs: Jank, Michael; Heyns, Marc; Prodanov Dimiter,
Publié dans: Numéro 1, 2019
Éditeur: -
DOI: 10.5281/zenodo.2538649

Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry

Auteurs: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric
Publié dans: Numéro 2, 2017
Éditeur: -
DOI: 10.5281/zenodo.1188143

A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry

Auteurs: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona
Publié dans: Numéro 3, 2018
Éditeur: -
DOI: 10.5281/zenodo.2538388

A list of associated tasks, activities and operations where exposure might occur

Auteurs: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal
Publié dans: Numéro 3, 2017
Éditeur: -
DOI: 10.5281/zenodo.804441

A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM

Auteurs: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal
Publié dans: Numéro 1, 2016
Éditeur: -
DOI: 10.5281/zenodo.804436

A list of nanomaterials that are of strategic importance for the semiconductor sector in the future

Auteurs: Michael Jank; Marc Heyns
Publié dans: Numéro 2, 2017
Éditeur: -
DOI: 10.5281/zenodo.557082

Peer reviewed articles (3)

Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation

Auteurs: Dimiter Prodanov
Publié dans: Entropy, Numéro 20/7, 2018, Page(s) 492, ISSN 1099-4300
Éditeur: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e20070492

Management of health risk related to use of engineered nanomaterials. An analogy with biosafety

Auteurs: Dimiter Prodanov
Publié dans: Biomedical Reviews, Numéro 28/0, 2018, Page(s) 100, ISSN 1310-392X
Éditeur: Bulgarian-American Center
DOI: 10.14748/bmr.v28.4455

Banding approach for engineered nanomaterial risk assessment and control

Auteurs: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon
Publié dans: Journal of Physics: Conference Series, Numéro 838, 2017, Page(s) 012017, ISSN 1742-6588
Éditeur: Institute of Physics
DOI: 10.1088/1742-6596/838/1/012017

Conference proceedings (1)

Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA

Auteurs: Jank, Michael; Bauer, Anton; Frey, Lothar
Publié dans: Fraunhofer IISB, Numéro 3, 2016
Éditeur: -