Livrables Documents, reports (15) Health monitoring guideline List of air sampling equipments & List of environmental and individual monitoring devices . List of air sampling equipments . List of environmental and individual monitoring devices Identification of the most appropriate risk assessment methodologies (including gap analysis) for use in the semiconductor industry. Guidance on the use of risk assessment methodology for semiconductor industry (Combined deliverable T3.1 and T3.2). Assessment report: gaps identified about water and wastewater characterization A list of nanomaterials currently used in the semiconductor sector to be considered within NANOSTREEM Comparison of occupational exposure values Recommendations for use of emission monitoring as a complement to risk banding Report on establishment NanoStreeM Safety Community Public Project factsheet List of standards for air sampling, as applicable in semiconductor activity ; Gaps identified . List of standards for air sampling, as applicable in semiconductor activity . Gaps identified Gap analysis on information and data for NP exposure scenarios in semiconductor industryGap analysis on information and data for NP exposure scenarios in semiconductor industry Gap analysis on information and data for NP exposure scenarios in semiconductor industry A set of typical relevant exposure scenarios for NP’s in semiconductor industry For nanomaterials listed in D1.1, a list of associated tasks, activities and operations where exposure might occur. Public final project report A list of nanomaterials that are of strategic importance for the semiconductor sector in the future Other (2) Internal training package available for operators and maintenance engineers inside the consortium. Training package available for safety professionals to conduct risk banding, risk assessments and monitoring. Websites, patent fillings, videos etc. (1) Website Open Research Data Pilot (1) Report about the Stakeholder Workshop Workshop report Publications Other (6) A list of nanomaterials that are of strategic importance for the semiconductor sector in the future Auteurs: Jank, Michael; Heyns, Marc; Prodanov Dimiter, Publié dans: Issue 1, 2019 Éditeur: - DOI: 10.5281/zenodo.2538649 Identification of the most appropriate risk assessment methodologies for use in the semiconductor industry Auteurs: Le Feber, Maaike; Prodanov, Dimiter; Zimmermann, Eric Publié dans: Issue 2, 2017 Éditeur: - DOI: 10.5281/zenodo.1188143 A set of typical relevant exposure scenarios for nanoparticles in semiconductor industry Auteurs: Prodanov, Dimiter; Belde, Peter; Moclair, Fiona Publié dans: Issue 3, 2018 Éditeur: - DOI: 10.5281/zenodo.2538388 A list of associated tasks, activities and operations where exposure might occur Auteurs: Belde, Peter; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Prodanov, Dimiter; Roquet, Pascal Publié dans: Issue 3, 2017 Éditeur: - DOI: 10.5281/zenodo.804441 A list of nanomaterials currently used in the semiconductor sector to be considered within NanoStreeM Auteurs: Belde, Peter; Durand, Catherine; Jank, Michael; Maillet, Jean-Christophe; Moclair, Fiona; Morelli, Atillio; Pook, Beatrix; Prodanov, Dimiter; Roquet, Pascal Publié dans: Issue 1, 2016 Éditeur: - DOI: 10.5281/zenodo.804436 A list of nanomaterials that are of strategic importance for the semiconductor sector in the future Auteurs: Michael Jank; Marc Heyns Publié dans: Issue 2, 2017 Éditeur: - DOI: 10.5281/zenodo.557082 Peer reviewed articles (3) Analytical and Numerical Treatments of Conservative Diffusions and the Burgers Equation Auteurs: Dimiter Prodanov Publié dans: Entropy, Issue 20/7, 2018, Page(s) 492, ISSN 1099-4300 Éditeur: Multidisciplinary Digital Publishing Institute (MDPI) DOI: 10.3390/e20070492 Management of health risk related to use of engineered nanomaterials. An analogy with biosafety Auteurs: Dimiter Prodanov Publié dans: Biomedical Reviews, Issue 28/0, 2018, Page(s) 100, ISSN 1310-392X Éditeur: Bulgarian-American Center DOI: 10.14748/bmr.v28.4455 Banding approach for engineered nanomaterial risk assessment and control Auteurs: Nausikaä Van Hoornick, Dimiter Prodanov, Alain Pardon Publié dans: Journal of Physics: Conference Series, Issue 838, 2017, Page(s) 012017, ISSN 1742-6588 Éditeur: Institute of Physics DOI: 10.1088/1742-6596/838/1/012017 Conference proceedings (1) Prospects and issues of nanomaterials use in microelectronics: Poster presented at Materials Research Society Spring Meeting 2016, Phoenix, Arizona, USA Auteurs: Jank, Michael; Bauer, Anton; Frey, Lothar Publié dans: Fraunhofer IISB, Issue 3, 2016 Éditeur: - Recherche de données OpenAIRE... Une erreur s’est produite lors de la recherche de données OpenAIRE Aucun résultat disponible