Deliverables
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Publications
Author(s): F. Chan Wai Po, R. Abdaoui, A. Giry
Published in: 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2016, Page(s) 492-495, ISBN 978-1-5090-6113-6
Publisher: IEEE
DOI: 10.1109/ICECS.2016.7841246
Author(s): Pierre Ferris, Gauthier Tant, Alexandre Giry, J. D. Arnould, J. M. Fournier
Published in: 2016 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2016, Page(s) 254-257, ISBN 978-1-4673-8651-7
Publisher: IEEE
DOI: 10.1109/RFIC.2016.7508299
Author(s): Dominique Nicolas, Alexandre Giry, Essia Ben Abdallah, Serge Bories, Thierry Parra, Christophe Delaveaud, Pierre Vincent
Published in: 2016 IEEE MTT-S International Microwave Symposium (IMS), 2016, Page(s) 1-4, ISBN 978-1-5090-0698-4
Publisher: IEEE
DOI: 10.1109/MWSYM.2016.7538835
Author(s): D. Nicolas, A. Serhan , P. Ferris, A. Giry, T. Parra
Published in: Journées Nationales Micro-ondes, Mai, 2017
Publisher: Journées Nationales Micro-ondes
Author(s): D. Nicolas, A. Serhan, A. Giry, T. Parra, E. Mercier
Published in: 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2017, Page(s) 15-18, ISBN 978-1-5090-4626-3
Publisher: IEEE
DOI: 10.1109/RFIC.2017.7969005
Author(s): A. Giry, A. Serhan, P. Ferris
Published in: 2017
Publisher: IEEE
Author(s): Saad Boutayeb, Alexandre Giry, Ayssar Serhan, Jean-Daniel Arnould, Estelle Lauga-Larroze
Published in: 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), 2017, Page(s) 41-44, ISBN 978-1-5090-6508-0
Publisher: IEEE
DOI: 10.1109/PRIME.2017.7974102
Author(s): A. Giry
Published in: Mars, 2017
Publisher: GDR Ondes - GT4
Author(s): S. Boutayeb
Published in: Mars, 2017
Publisher: GDR Ondes - GT4
Author(s): Ayssar Serhan, Pierre Ferris, Alexandre Giry
Published in: 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2016, Page(s) 488-491, ISBN 978-1-5090-6113-6
Publisher: IEEE
DOI: 10.1109/ICECS.2016.7841245
Author(s): Yeghoyan Taguhi, Alassaad Kassem, McMitchell Sean R.C., Gutierrez Marina, Souliere Véronique, Araujo Daniel, Ferro Gabriel
Published in: Materials Science Forum, Vol. 924, 2018, Page(s) 128-131
Publisher: Trans Tech Publications
Author(s): T. YEGHOYAN, K. ALASSAAD, V. SOULIERE, G. FERRO
Published in: Materials Science Forum, Vol. 897, 2017, Page(s) 87-90
Publisher: Trans tech publications
Author(s): Lei Zhu, Shuangke Liu, F. Allibert, E. Desbonnets, I. Radu, Xinen Zhu, Yumin Lu
Published in: 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2016, Page(s) 1-2, ISBN 978-1-4673-9478-9
Publisher: IEEE
DOI: 10.1109/VLSI-TSA.2016.7480530
Author(s): Yao Liu, Giovanni Mangraviti, Shinya Hitomi, Khaled Khalaf, Bjorn Debaillie, Piet Wambacq
Published in: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Date of Conference: 15-18 Oct. 2018, 2018, Page(s) 1-3, ISBN 978-1-5386-7627-1
Publisher: IEEE
DOI: 10.1109/s3s.2018.8640209
Author(s): Ionut Radu, Eric Desbonnets, Manuel Sellier, Christophe Didier
Published in: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), Date of Conference: 30 April-3 May 2018, 2018, Page(s) 143-147, ISBN 978-1-5386-3748-7
Publisher: IEEE
DOI: 10.1109/asmc.2018.8373174
Author(s): Oleg Kononchuk, Didier Landru, Damien Massy, Nadia Ben Mohamed, Youngpil Kim, Pablo Acosta-Alba and François Rieutord
Published in: 236th ECS meetings, Oct 3rd 2018, 2018
Publisher: © 2018 ECS - The Electrochemical Society
Author(s): Manuel Sellier
Published in: ECS Transactions, 85/8, 2018, Page(s) 3-13, ISSN 1938-5862
Publisher: Electrochemical Society, Inc.
DOI: 10.1149/08508.0003ecst
Author(s): Lei Zhu, Shuangke Liu, Frederic Allibert, Ionut Radu, Xinen Zhu, Yumin Lu, Xi Wang
Published in: IEEE Microwave and Wireless Components Letters, 28/5, 2018, Page(s) 377-379, ISSN 1531-1309
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/lmwc.2018.2813884
Author(s): Babak Kazemi Esfeh, Martin Rack, Khaled Ben Ali, Frederic Allibert, Jean-Pierre Raskin
Published in: IEEE Transactions on Electron Devices, 65/8, 2018, Page(s) 3120-3126, ISSN 0018-9383
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/ted.2018.2845679