Pubblicazioni
Autori:
Koen Goetschalckx, Bert Moons, Steven Lauwereins, Martin Andraud, Marian Verhelst
Pubblicato in:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems, Numero 8/4, 2018, Pagina/e 884-894, ISSN 2156-3357
Editore:
IEEE Circuits and Systems Society
DOI:
10.1109/jetcas.2018.2839347
Autori:
Juan Sebastian P. Giraldo, Steven Lauwereins, Komail Badami, Marian Verhelst
Pubblicato in:
IEEE Journal of Solid-State Circuits, Numero 55/4, 2020, Pagina/e 868-878, ISSN 0018-9200
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/jssc.2020.2968800
Autori:
Nimish Shah, Wannes Meert, and Marian Verhelst
Pubblicato in:
IEEE Transactions on Parallel and Distributed Systems, 2022, ISSN 1045-9219
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tpds.2022.3151194
Autori:
Thomas Bos, Komail Badami, Wim Dehaene, Marian Verhelst
Pubblicato in:
Analog Integrated Circuits and Signal Processing, Numero 97/3, 2018, Pagina/e 437-448, ISSN 0925-1030
Editore:
Kluwer Academic Publishers
DOI:
10.1007/s10470-018-1235-0
Autori:
Marian Verhelst, Bert Moons
Pubblicato in:
IEEE Solid-State Circuits Magazine, Numero 9/4, 2017, Pagina/e 55-65, ISSN 1943-0582
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/mssc.2017.2745818
Autori:
Steven Colleman, Marian Verhelst
Pubblicato in:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Numero 29/3, 2021, Pagina/e 461-471, ISSN 1063-8210
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tvlsi.2020.3046125
Autori:
Fernando de la Hucha Arce, Panagiotis Patrinos, Marian Verhelst, Alexander Bertrand
Pubblicato in:
IEEE Signal Processing Letters, Numero 27, 2020, Pagina/e 291-295, ISSN 1070-9908
Editore:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/lsp.2020.2967592
Autori:
Laura Galindez, Komail Badami, Jonas Vlasselaer, Wannes Meert, Marian Verhelst
Pubblicato in:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems, Numero 8/4, 2018, Pagina/e 858-872, ISSN 2156-3357
Editore:
IEEE Circuits and Systems Society
DOI:
10.1109/jetcas.2018.2850451
Autori:
Nimish Shah, Laura I. Galindez Olascoaga, Wannes Meert, Marian Verhelst
Pubblicato in:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, Pagina/e 322-325, ISBN 978-3-9819263-4-7
Editore:
IEEE
DOI:
10.23919/date48585.2020.9116326
Autori:
Shirui Zhao, Nimish Shah, Wannes Meert, and Marian Verhelst
Pubblicato in:
2022
Editore:
IEEE
Autori:
O. Laura I. Galindez, Komail Badami, V. Rajesh Pamula, Steven Lauwereins, Wannes Meert, Marian Verhelst
Pubblicato in:
2016 50th Asilomar Conference on Signals, Systems and Computers, 2016, Pagina/e 1027-1031, ISBN 978-1-5386-3954-2
Editore:
IEEE
DOI:
10.1109/acssc.2016.7869524
Autori:
Laura I. Galindez Olascoaga, Wannes Meert, Nimish Shah, Marian Verhelst, Guy Van den Broeck
Pubblicato in:
Accepted for Publication at Proceedings of the Thirty-third Conference on Neural Information Processing Systems (NeurIPS 2019)., 2019
Editore:
NeurIPS
Autori:
Nimish Shah ; Laura I. Galindez Olascoaga ; Wannes Meert ; Marian Verhelst
Pubblicato in:
DAC '19 Proceedings of the 56th Annual Design Automation Conference 2019, 2019
Editore:
DAC
DOI:
10.1145/3316781.3317885
Autori:
Komail Badami, Juan-Carlos Pena Ramos, Steven Lauwereins, Marian Verhelst
Pubblicato in:
2018 IEEE International Solid - State Circuits Conference - (ISSCC), 2018, Pagina/e 344-346, ISBN 978-1-5090-4940-0
Editore:
IEEE
DOI:
10.1109/isscc.2018.8310325
Autori:
L Galindez Olascoaga, W. Meert, M. Verhelst, G. Van den Broeck
Pubblicato in:
3rd Tractable Probabilistic Modeling Workshop colocated with the 36th International Conference on Machine Learning (TPM-ICML 2019), 2019
Editore:
TPM-ICML 2019
Autori:
Martin Andraud, Laura Galindez, Yichuan Lu, Yiorgos Makris, Marian Verhelst
Pubblicato in:
2018 IEEE International Test Conference (ITC), 2018, Pagina/e 1-10, ISBN 978-1-5386-8382-8
Editore:
IEEE
DOI:
10.1109/test.2018.8624893
Autori:
Laura Isabel Galindez Olascoaga, Wannes Meert, Nimish Shah, Guy Van den Broeck, Marian Verhelst
Pubblicato in:
Advances in Intelligent Data Analysis XVIII - 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27–29, 2020, Proceedings, Numero 12080, 2020, Pagina/e 184-196, ISBN 978-3-030-44583-6
Editore:
Springer International Publishing
DOI:
10.1007/978-3-030-44584-3_15
Autori:
Laura I. Galindez Olascoaga, Wannes Meert, Nimish Shah, Marian Verhelst
Pubblicato in:
IoT Streams for Data-Driven Predictive Maintenance and IoT, Edge, and Mobile for Embedded Machine Learning - Second International Workshop, IoT Streams 2020, and First International Workshop, ITEM 2020, Co-located with ECML/PKDD 2020, Ghent, Belgium, September 14-18, 2020, Revised Selected Papers, Numero 1325, 2020, Pagina/e 283-295, ISBN 978-3-030-66769-6
Editore:
Springer International Publishing
DOI:
10.1007/978-3-030-66770-2_21
Autori:
Jonas Vlasselaer, Wannes Meert, Marian Verhelst
Pubblicato in:
Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2018, Dublin, Ireland, September 10–14, 2018, Proceedings, Part III, Numero 11053, 2019, Pagina/e 305-321, ISBN 978-3-030-10996-7
Editore:
Springer International Publishing
DOI:
10.1007/978-3-030-10997-4_19
Autori:
Nimish Shah, Laura I. Galindez Olascoaga, Wannes Meert and Marian Verhelst
Pubblicato in:
HotChips, 2019
Editore:
HotChips
È in corso la ricerca di dati su OpenAIRE...
Si è verificato un errore durante la ricerca dei dati su OpenAIRE
Nessun risultato disponibile