Resultado final
"D4.1 reports on progress of WP4 IRP ""EDA tools and methodologies for reliable nanoelectronic systems"" corresponding to task T4.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR4.3 IRP Open-source EDA tools for design quality and reliability using zamiaCAD"D4.3 reports on progress of WP4 IRP ""Open-source EDA tools for design quality and reliability using zamiaCAD"" corresponding to task T4.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR3.2 IRP Design approaches for tamper resistant crypto implementations"D3.2 reports on progress of WP3 IRP ""Design approaches for tamper resistant crypto implementations"" corresponding to task T3.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.3 IRP HW/SW fault tolerance methods driven by reliability and timing constraints"D1.3 reports on progress of WP1 IRP ""HW/SW fault tolerance methods driven by reliability and timing constraints"" corresponding to task T1.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR3.3 IRP Side-channel and Fault Attack resistant security primitives design"D3.3 reports on progress of WP3 IRP ""Side-channel and Fault Attack resistant security primitives design"" corresponding to task T3.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Comprehensive Communication PlanComprehensive Communication Plan to map main target groups and dissemination plan.
ESR2.2 IRP Innovative real-time operating system for error management for single- and multi-core units"D2.2 reports on progress of WP2 IRP ""Innovative real-time operating system for error management for single- and multi-core units"" corresponding to task T2.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR4.2 IRP EDA tools and methodologies for high quality nanoelectronic systems"D4.2 reports on progress of WP4 IRP ""EDA tools and methodologies for high quality nanoelectronic systems"" corresponding to task T4.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.5 IRP Reliable operation infrastructure for dynamic, high-dependability applications"D1.1 reports on progress of WP1 IRP ""Reliable operation infrastructure for dynamic, high-dependability applications"" corresponding to task T1.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.4 IRP Techniques for detecting permanent faults during the operational phase"D1.4 reports on progress of WP1 IRP ""Techniques for detecting permanent faults during the operational phase"" corresponding to task T1.4. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Report on Dissemination and Communication activitiesReport on dissemination and Communication activities throughout the whole project.
ESR3.1 IRP A novel Physical Unclonable Functions technology"D3.1 reports on progress of WP3 IRP ""A novel Physical Unclonable Functions technology"" corresponding to task T3.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.2 IRP Adaptive methods for fault tolerant embedded systems"D1.2 reports on progress of WP1 IRP ""Adaptive methods for fault tolerant embedded systems"" corresponding to task T1.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Reports on training eventsBrief reports presenting the main training outcomes. Intermediate versions of the deliverable are due by M18 and M30.
ESR2.1 IRP Effective techniques for secure and reliable systems validation"D2.1 reports on progress of WP2 IRP ""Effective techniques for secure and reliable systems validation"" corresponding to task T2.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Report on recruitment processReport on recruitment process and the recruited fellows enrolment in PhD programme
ESR1.1 IRP Reliability analysis methods and models of memory devices"D1.1 reports on progress of WP1 IRP ""Reliability analysis and modelling of memory devices"" corresponding to task T1.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Supervisory board of the networkEstablish the Supervisory board of the network.
ESR2.3 IRP A synthetic, hierarchical abstraction approach for modelling and managing complex systems quality and reliability"D2.3 reports on progress of WP2 IRP ""A synthetic, hierarchical abstraction approach for modelling and managing complex systems quality and reliability"" corresponding to task T2.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR2.4 IRP Design errors verification and debug methods for complex nanoelectronic systems"D2.4 reports on progress of WP2 IRP ""Design errors verification and debug methods for complex nanoelectronic systems"" corresponding to task T2.4. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Website, project logo and wiki-type online collaboration tool as for main dissemination.
Articles published40 scientific articles, 10 technical reports and 4 popular science articles will be published.
Publicaciones
Autores:
C. Gursoy, M. Jenihhin, A. S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar
Publicado en:
2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019, Página(s) 1-4, ISBN 978-1-7281-0073-9
Editor:
IEEE
DOI:
10.1109/ddecs.2019.8724642
Autores:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer
Publicado en:
2020 IEEE European Test Symposium (ETS), 2020, Página(s) 1-6, ISBN 978-1-7281-4312-5
Editor:
IEEE
DOI:
10.1109/ets48528.2020.9131568
Autores:
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Publicado en:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Página(s) 1-7, ISBN 978-1-7281-8187-5
Editor:
IEEE
DOI:
10.1109/iolts50870.2020.9159751
Autores:
R. Segabinazzi Ferreira, N. George, J. Chen, M. Hübner, M. Krstic, J. Nolte, and H. T. Vierhaus
Publicado en:
2019
Editor:
DSD
DOI:
10.26127/btuopen-5050
Autores:
Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
Publicado en:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, Página(s) 792-797, ISBN 978-3-9819263-4-7
Editor:
IEEE
DOI:
10.23919/date48585.2020.9116278
Autores:
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Publicado en:
2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2019, Página(s) 1-6, ISBN 978-1-7281-3424-6
Editor:
IEEE
DOI:
10.1109/dtis.2019.8735052
Autores:
Josie E. Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda
Publicado en:
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Página(s) 570-573, ISBN 978-1-7281-0996-1
Editor:
IEEE
DOI:
10.1109/icecs46596.2019.8964677
Autores:
Stefano di Carlo, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publicado en:
2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019, Página(s) 1-6, ISBN 978-1-7281-0073-9
Editor:
IEEE
DOI:
10.1109/ddecs.2019.8724672
Autores:
Randolf Rotta, Raphael Segabinazzi Ferreira, Jorg Nolte
Publicado en:
2020 IEEE 23rd International Symposium on Real-Time Distributed Computing (ISORC), 2020, Página(s) 154-155, ISBN 978-1-7281-6958-3
Editor:
IEEE
DOI:
10.1109/isorc49007.2020.00035
Autores:
T. Lange, A. Balakrishnan, M. Glorieux, D. Alexandrescu, L. Sterpone
Publicado en:
2019
Editor:
SEÖSE
Autores:
J. E. Rodriguez Condia, B. Du, M. Sonza Reorda, L. Sterpone
Publicado en:
2018
Editor:
Harwell Campus
DOI:
10.5281/zenodo.4662619
Autores:
Dmytro Petryk, Zoya Dyka, Jens Katzer, Peter Langendorfer
Publicado en:
2020 IEEE East-West Design & Test Symposium (EWDTS), 2020, Página(s) 1-6, ISBN 978-1-7281-9899-6
Editor:
IEEE
DOI:
10.1109/ewdts50664.2020.9225092
Autores:
Xinhui Lai, Maksim Jenihhin, Georgios Selimis, Sven Goossens, Roel Maes, Kolin Paul
Publicado en:
2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC), 2020, Página(s) 16-21, ISBN 978-1-7281-5409-1
Editor:
IEEE
DOI:
10.1109/vlsi-soc46417.2020.9344071
Autores:
D. Petryk, Z. Dyka, P. Langendörfer
Publicado en:
2021
Editor:
in32. Krypto-Tag 1st Digital Summit
DOI:
10.18420/cdm-2021-32-22
Autores:
G. C. Medeiros, M. Fieback, M. Taouil, L. B. Poehls, and S. Hamdioui
Publicado en:
2021
Editor:
IEEE
Autores:
M. Jenihhin, S. Hamdioui, M. Sonza Reorda, M. Krstic, P. Langendorfer, C. Sauer, A. Klotz, M. Huebner, J. Nolte, H. T. Vierhaus, G. Selimis, D. Alexandrescu, M. Taouil, G. J. Schrijen, J. Raik, L. Sterpone, G. Squillero, Z. Dyka
Publicado en:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, Página(s) 388-393, ISBN 978-3-9819263-4-7
Editor:
IEEE
DOI:
10.23919/date48585.2020.9116558
Autores:
T. Copetti, G. C. Medeiros, M. Taouil, S. Hamdioui, L. B. Poehls and T. Balen
Publicado en:
2020
Editor:
2020 IEEE Latin-American Test Symposium (LATS)
DOI:
10.1109/lats49555.2020.9093667
Autores:
J. Chen, T. Lange, M. Andjelkovic, A. Simevski, M. Krstic
Publicado en:
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, Página(s) 1-6, ISBN 978-1-7281-9457-8
Editor:
IEEE
DOI:
10.1109/dft50435.2020.9250856
Autores:
Josie E Rodriguez Condia, M. Sonza Reorda
Publicado en:
2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC), 2020, Página(s) 153-158, ISBN 978-1-7281-5409-1
Editor:
IEEE
DOI:
10.1109/vlsi-soc46417.2020.9344088
Autores:
Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Cristhian-Fernando Moreno-Manrique, Matteo Sonza Reorda
Publicado en:
2020 17th Biennial Baltic Electronics Conference (BEC), 2020, Página(s) 1-6, ISBN 978-1-7281-9444-8
Editor:
IEEE
DOI:
10.1109/bec49624.2020.9276748
Autores:
Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publicado en:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Página(s) 1-6, ISBN 978-1-7281-8187-5
Editor:
IEEE
DOI:
10.1109/iolts50870.2020.9159711
Autores:
J. Chen, M. Andjelkovic, A. Simevski, Y. Li, P. Skoncej and M. Krstic
Publicado en:
2019
Editor:
DSD
DOI:
10.1109/dsd.2019.00080
Autores:
Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer
Publicado en:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Página(s) 52-53, ISBN 978-1-7281-2490-2
Editor:
IEEE
DOI:
10.1109/iolts.2019.8854419
Autores:
Marcio M. Goncalves, Jose Rodrigo Azambuja, Josie E. R. Condia, Matteo Sonza Reorda, Luca Sterpone
Publicado en:
2020 IEEE Latin-American Test Symposium (LATS), 2020, Página(s) 1-6, ISBN 978-1-7281-8731-0
Editor:
IEEE
DOI:
10.1109/lats49555.2020.9093682
Autores:
Josie E. Rodriguez Condia, Pierpaolo Narducci, M. Sonza Reorda, L. Sterpone
Publicado en:
2020 IEEE 38th VLSI Test Symposium (VTS), 2020, Página(s) 1-6, ISBN 978-1-7281-5359-9
Editor:
IEEE
DOI:
10.1109/vts48691.2020.9107572
Autores:
Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Guursoy, Maksim Jenihhin
Publicado en:
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019, Página(s) 335-340, ISBN 978-1-7281-3915-9
Editor:
IEEE
DOI:
10.1109/vlsi-soc.2019.8920313
Autores:
Raphael Segabinazzi Ferreira, Jorg Nolte, Fabian Vargas, Nevin George, Michael Hubner
Publicado en:
2020 IEEE Latin-American Test Symposium (LATS), 2020, Página(s) 1-6, ISBN 978-1-7281-8731-0
Editor:
IEEE
DOI:
10.1109/lats49555.2020.9093692
Autores:
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
Publicado en:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Página(s) 1-6, ISBN 978-1-7281-8187-5
Editor:
IEEE
DOI:
10.1109/iolts50870.2020.9159750
Autores:
Josie E. Rodriguez Condia, Pierpaolo Narducci, M. Sonza Reorda, L. Sterpone
Publicado en:
2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2020, Página(s) 1-6, ISBN 978-1-7281-9938-2
Editor:
IEEE
DOI:
10.1109/ddecs50862.2020.9095665
Autores:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer
Publicado en:
2019 IEEE 28th Asian Test Symposium (ATS), 2019, Página(s) 129-1295, ISBN 978-1-7281-2695-1
Editor:
IEEE
DOI:
10.1109/ats47505.2019.00024
Autores:
Josie E. Rodriguez Condia, Marcio M. Goncalves, Jose Rodrigo Azambuja, Matteo Sonza Reorda, Luca Sterpone
Publicado en:
2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2020, Página(s) 380-385, ISBN 978-1-7281-5775-7
Editor:
IEEE
DOI:
10.1109/isvlsi49217.2020.00076
Autores:
M. M. Goncalves; Josie E. Rodriguez Condia; M. Sonza Reorda, L. Sterpone and J. R. Azambuja
Publicado en:
2020
Editor:
ESREF
DOI:
10.5281/zenodo.4662676
Autores:
S. Masoumian, G. Selimis, R. Maes, G. Schrijen, S. Hamdioui and M. Taouil
Publicado en:
2020 IEEE European Test Symposium (ETS), 2020, Página(s) pp. 1-6.
Editor:
IEEE
DOI:
10.1109/ets48528.2020.9131583
Autores:
T. Lange, A. Balakrishnan, M. Glorieux, D. Alexandrescu and L. Sterpone,
Publicado en:
2019
Editor:
IEEE
DOI:
10.1109/dsn-s.2019.00021
Autores:
Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publicado en:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Página(s) 97-102, ISBN 978-1-7281-2490-2
Editor:
IEEE
DOI:
10.1109/iolts.2019.8854463
Autores:
M. Andjelkovic, A. Simevski, J. Chen, M. Krstic, et al.
Publicado en:
23rd Euromicro Conference on Digital System Design (DSD), 2020
Editor:
IEEE
DOI:
10.1109/dsd51259.2020.00082
Autores:
Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer
Publicado en:
2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2019, Página(s) 1-7, ISBN 978-1-7281-2769-9
Editor:
IEEE
DOI:
10.1109/norchip.2019.8906932
Autores:
B. Du; J. E. Rodriguez Condia; M. Sonza Reorda; L. Sterpone
Publicado en:
2019
Editor:
RADECS
DOI:
10.5281/zenodo.4662662
Autores:
Aleksa Damljanovic, Annachiara Ruospo, Ernesto Sanchez, Giovanni Squillero
Publicado en:
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2021, Página(s) 51-56, ISBN 978-1-6654-3595-6
Editor:
IEEE
DOI:
10.1109/ddecs52668.2021.9417061
Autores:
B. Du, Josie E. Rodriguez Condia, M. Sonza Reorda, L. Sterpone
Publicado en:
2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), Edición Hotel Cap Roig, Platja d’Aro, Costa Brava, Spain, July 2-4, 2018, 2018, Página(s) 85-90, ISBN 978-1-5386-5992-2
Editor:
IEEE
DOI:
10.1109/IOLTS.2018.8474174
Autores:
Josie E. Rodriguez Condia, B. Du, M. Sonza Reorda, L. Sterpone
Publicado en:
A workshop on Self-driving Cars and Reliability, Rutherford Appleton Laboratory, Harwell Campus, 2018
Editor:
A workshop on Self-driving Cars and Reliability, Rutherford Appleton Laboratory, Harwell Campus
Autores:
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Publicado en:
2018 IEEE International Test Conference in Asia (ITC-Asia), 2018, Página(s) 55-60, ISBN 978-1-5386-5180-3
Editor:
IEEE
DOI:
10.1109/ITC-Asia.2018.00020
Autores:
D. Petryk, Z. Dyka, P. Langendörfer
Publicado en:
Proc. 29th Crypto-Day 2018, 2018
Editor:
29. Krypto-Tag / Proc. 29th Crypto-Day 2018
DOI:
10.18420/cdm-2018-29-11
Autores:
F. Augusto da Silva, A. C. Bagbaba, S. Hamdioui and C. Sauer
Publicado en:
2018 Design and Verification conference Europe (DVCON-Europe), 2018
Editor:
2018 Design and Verification Conference and Exhibition (DVCon) Europe
DOI:
10.5281/zenodo.3361533
Autores:
A. C. Bagbaba, F. Augusto da Silva, C. Sauer
Publicado en:
2018 Design and Verification conference Europe (DVCON-Europe), 2018
Editor:
2018 Design and Verification Conference and Exhibition (DVCon) Europe
DOI:
10.5281/zenodo.3361607
Autores:
Thomas Lange, Maximilien Glorieux, Adrian Evans, A-Duong In, Dan Alexandrescu, Cesar Boatella-Polo, Carlos Urbina Ortega, Véronique Ferlet-Cavrois, Maris Tali, Rubén Garcı́a Alı́a
Publicado en:
2018 ESA/ESTEC Space FPGA Users Workshop (SEFUW), 2018
Editor:
2018 ESA/ESTEC Space FPGA Users Workshop (SEFUW)
Autores:
Luca Sterpone, Sarah Azimi, Ludovica Bozzoli, Boyang Du, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Cesar Boatella Polo, David Merodio Codinachs
Publicado en:
2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 2018, Página(s) 120-126, ISBN 978-1-5386-7753-7
Editor:
IEEE
DOI:
10.1109/AHS.2018.8541474
Autores:
Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
Publicado en:
2019 IEEE European Test Symposium (ETS), 2019, Página(s) 1-2, ISBN 978-1-7281-1173-5
Editor:
IEEE
DOI:
10.1109/ets.2019.8791517
Autores:
B. Du, Josie E. Rodriguez Condia, M. Sonza Reorda, L. Sterpone
Publicado en:
2019 IEEE Latin American Test Symposium (LATS), 2019, Página(s) 1-6, ISBN 978-1-7281-1756-0
Editor:
IEEE
DOI:
10.1109/latw.2019.8704643
Autores:
Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publicado en:
SELSE-15: The 15th Workshop on Silicon Errors in Logic – System Effects, Edición 27-28 March 2019, Stanford, California, USA, 2019
Editor:
SELSE-15
Autores:
B. Du, Josie E. Rodriguez Condia, M. Sonza Reorda, L. Sterpone
Publicado en:
NVIDIA GPU Tecnology Conference (GTC Europe 2018), Edición 23-25 October, 2018, Munich, Germany, 2018
Editor:
GTC Europe 2018
Autores:
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Publicado en:
2018 IEEE International Test Conference (ITC), 2018, Página(s) 1-9, ISBN 978-1-5386-8382-8
Editor:
IEEE
DOI:
10.1109/test.2018.8624742
Autores:
A. Damljanovic, A. Jutman, G. Squillero and A. Tsertov
Publicado en:
Proc. IEEE European Test Symposium 2019 (in press), 2019
Editor:
IEEE
DOI:
10.5281/zenodo.3362602
Autores:
R. Cantoro, A.Damljanovic. M. Sonza Reorda and G. Squillero
Publicado en:
2018 3rd International Test Standards Application Workshop (TESTA), 2018
Editor:
2018 3rd International Test Standards Application Workshop (TESTA)
Autores:
Maximilien Glorieux, Adrian Evans, Thomas Lange, A-Duong In, Dan Alexandrescu, Cesar Boatella-Polo, Ruben Garcia Alia, Maris Tali, Carlos Urbina Ortega, Maria Kastriotou, Pablo Fernandez-Martinez, Veronique Ferlet-Cavrois
Publicado en:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, Página(s) 1-5, ISBN 978-1-5386-8263-0
Editor:
IEEE
DOI:
10.1109/nsrec.2018.8584296
Autores:
Maksim Jenihhin, Xinhui Lai, Tara Ghasempouri, Jaan Raik
Publicado en:
2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2018, Página(s) 1-7, ISBN 978-1-5386-7656-1
Editor:
IEEE
DOI:
10.1109/norchip.2018.8573495
Autores:
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik
Publicado en:
2019 IEEE Latin American Test Symposium (LATS), 2019, Página(s) 1-6, ISBN 978-1-7281-1756-0
Editor:
IEEE
DOI:
10.1109/latw.2019.8704591
Autores:
D.H.P. Kraak, C.C. Gursoy, I.O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui
Publicado en:
2019 IEEE Latin American Test Symposium (LATS), 2019, Página(s) 1-6, ISBN 978-1-7281-1756-0
Editor:
IEEE
DOI:
10.1109/latw.2019.8704595
Autores:
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Publicado en:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Página(s) 7-14, ISBN 978-1-7281-2490-2
Editor:
IEEE
DOI:
10.1109/iolts.2019.8854423
Autores:
C. C. Gürsoy, G. Medeiros, J. Chen, N. George, J. E. Rodriguez Condia, T. Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S. Hamdioui, M. Taouil, M. Krstic, P. Langendörfer, Z. Dyka, M. Huebner, J. Nolte, H. T. Vierhaus,M. Sonza Reorda, G. Squillero, L. Sterpone, J. Raik, D. Alexandrescu, M. Glorieux, G. Selimis
Publicado en:
University Booth - Design, Automation & Test in Europe Conference & Exhibition (Univerity Booth DATE 2019), Edición 25-29 March 2019, 2019
Editor:
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
DOI:
10.5281/zenodo.3362529
Autores:
Adeboye Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik
Publicado en:
Proc. IEEE European Test Symposium 2019 (in press), 2019
Editor:
IEEE
Autores:
Heinrich Theodor Vierhaus, Maksim Jenihhin, Matteo Sonza Reorda
Publicado en:
2018 12th European Workshop on Microelectronics Education (EWME), 2018, Página(s) 45-50, ISBN 978-1-5386-9114-4
Editor:
IEEE
DOI:
10.1109/ewme.2018.8629465
Autores:
Marko Andjelkovic, Mitko Veleski, Junchao Chen, Aleksandar Simevski, Milos Krstic, Rolf Kraemer
Publicado en:
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Página(s) 594-597, ISBN 978-1-7281-0996-1
Editor:
IEEE
DOI:
10.1109/icecs46596.2019.8964644
Autores:
T. Lange; M. Glorieux; D. Alexandrescu; L. Sterpone
Publicado en:
2020
Editor:
SEE/MAPLD
Autores:
Aleksa Damljanovic, Artur Jutman, Michele Portolan, Ernesto Sanchez, Giovanni Squillero, Anton Tsertov
Publicado en:
2019 IEEE International Test Conference (ITC), 2019, Página(s) 1-8, ISBN 978-1-7281-4823-6
Editor:
IEEE
DOI:
10.1109/itc44170.2019.9000181
Autores:
Troya Cagail Koylu, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil
Publicado en:
2020 IEEE International Symposium on Circuits and Systems (ISCAS), 2020, Página(s) 1-5, ISBN 978-1-7281-3320-1
Editor:
IEEE
DOI:
10.1109/iscas45731.2020.9180708
Autores:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer
Publicado en:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Página(s) 255-256, ISBN 978-1-7281-2490-2
Editor:
IEEE
DOI:
10.1109/iolts.2019.8854449
Autores:
Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer
Publicado en:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Página(s) 1-6, ISBN 978-1-7281-8187-5
Editor:
IEEE
DOI:
10.1109/iolts50870.2020.9159715
Autores:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Sanchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer
Publicado en:
2020 IEEE 38th VLSI Test Symposium (VTS), 2020, Página(s) 1-9, ISBN 978-1-7281-5359-9
Editor:
IEEE
DOI:
10.1109/vts48691.2020.9107599
Autores:
Dmytro Petryk, Zoya Dyka, Eduardo Perez, Mamathamba Kalishettyhalli Mahadevaiaha, Ievgen Kabin, Christian Wenger, Peter Langendorfer
Publicado en:
2020 23rd Euromicro Conference on Digital System Design (DSD), 2020, Página(s) 238-245, ISBN 978-1-7281-9535-3
Editor:
IEEE
DOI:
10.1109/dsd51259.2020.00047
Autores:
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Publicado en:
2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 2019, Página(s) 72-78, ISBN 978-1-7281-4650-8
Editor:
IEEE
DOI:
10.1109/ahs.2019.00007
Autores:
Xinhui Lai, Maksim Jenihhin, Jaan Raik, Kolin Paul
Publicado en:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Página(s) 239-242, ISBN 978-1-7281-2490-2
Editor:
IEEE
DOI:
10.1109/iolts.2019.8854458
Autores:
M. Andjelkovic, J. Chen, A. Simevski, Z. Stamenkovic, M. Krstic, R. Kraemer
Publicado en:
Proc. 31st European Conference on Radiation and its Effects on Components and Systems, 2020
Editor:
IEEE
Autores:
Raphael Segabinazzi Ferreira, Jorg Nolte
Publicado en:
2019 IEEE Latin American Test Symposium (LATS), 2019, Página(s) 1-6, ISBN 978-1-7281-1756-0
Editor:
IEEE
DOI:
10.1109/latw.2019.8704560
Autores:
Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
Publicado en:
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019, Página(s) 1-6, ISBN 978-1-7281-2260-1
Editor:
IEEE
DOI:
10.1109/dft.2019.8875379
Autores:
Dmytro Petryk, Zoya Dyka, Peter Langendorfer
Publicado en:
2020 9th Mediterranean Conference on Embedded Computing (MECO), 2020, Página(s) 1-4, ISBN 978-1-7281-6949-1
Editor:
IEEE
DOI:
10.1109/meco49872.2020.9134146
Autores:
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Publicado en:
2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2019, Página(s) 1-7, ISBN 978-1-7281-2769-9
Editor:
IEEE
DOI:
10.1109/norchip.2019.8906974
Autores:
B. Du, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Publicado en:
2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2019, Página(s) 1-6, ISBN 978-1-7281-3424-6
Editor:
IEEE
DOI:
10.1109/dtis.2019.8735047
Autores:
T. Lange; A. Balakrishnan; M. Glorieux; D. Alexandrescu; L. Sterpone
Publicado en:
2020
Editor:
No
Autores:
C.C. Gursoy, G. Medeiros, J. Chen, N. George, J.E. Rodriguez Condia, T. Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S.Hamdioui, M.Taouil, M.Krstic, P.Langend ̈orfer, Z.Dyka, M.Brandalero, M.H ̈ubner, J.N ̈olte, H.T.Vierhaus, M.Sonza Reorda, G.Squillero, L.Sterpone, J.Raik, D.Alexandrescu, M.Glorieux, G.Seli
Publicado en:
2020
Editor:
DATE
Autores:
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Publicado en:
Journal of Circuits, Systems and Computers, Edición 28/supp01, 2019, Página(s) 1940007, ISSN 0218-1266
Editor:
World Scientific Publishing Co
DOI:
10.1142/s0218126619400073
Autores:
Xinhui Lai, Aneesh Balakrishnan, Thomas Lange, Maksim Jenihhin, Tara Ghasempouri, Jaan Raik, Dan Alexandrescu
Publicado en:
Microprocessors and Microsystems, Edición 71, 2019, Página(s) 102867, ISSN 0141-9331
Editor:
Elsevier BV
DOI:
10.1016/j.micpro.2019.102867
Autores:
Josie E. RodriguezCondia, Boyang Du, Matteo Sonza Reorda, Luca Sterpone
Publicado en:
Microelectronics Reliability, 2020, ISSN 0026-2714
Editor:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113660
Autores:
M. M. Goncalves; Josie E. Rodriguez Condia; M. Sonza Reorda, L. Sterpone and J. R. Azambuja
Publicado en:
Microelectronics Reliability, Edición Volume 114, November 2020 113768, 2020, ISSN 0026-2714
Editor:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113768
Autores:
J. Chen, T. Lange, M. Andjelkovic, A. Simevski, M. Krstic
Publicado en:
Microelectronics Reliability, Edición 114, 2020, Página(s) 113799, ISSN 0026-2714
Editor:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113799
Autores:
Josie E. Rodriguez Condia, Pierpaolo Narducci, Matteo Sonza Reorda, Luca Sterpone
Publicado en:
The Journal of Supercomputing, 2021, ISSN 0920-8542
Editor:
Kluwer Academic Publishers
DOI:
10.1007/s11227-021-03751-2
Autores:
S. Di Carlo, J. E. Rodriguez Condia and M. Sonza Reorda
Publicado en:
IEEE Access, 2020, ISSN 2169-3536
Editor:
Institute of Electrical and Electronics Engineers Inc.
DOI:
10.1109/access.2020.2968139
Autores:
G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui
Publicado en:
Microelectronics Reliability, Edición 88-90, 2018, Página(s) 355-359, ISSN 0026-2714
Editor:
Elsevier BV
DOI:
10.1016/j.microrel.2018.07.092
Autores:
Yuanqing Li, Anselm Breitenreiter, Marko Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic
Publicado en:
Microelectronics Journal, Edición 96, 2020, Página(s) 104683, ISSN 0026-2692
Editor:
Mackintosh Publications
DOI:
10.1016/j.mejo.2019.104683
Autores:
A. Bosio; S. Di Carlo; G. Di Natale; M. Sonza Reorda and Josie E. Rodriguez Condia
Publicado en:
Cross-Layer Reliability of Computing Systems, 2020
Editor:
Cross-Layer Reliability of Computing Systems
DOI:
10.5281/zenodo.4664277
Derechos de propiedad intelectual
Número de solicitud/publicación:
19
179081
Fecha:
2019-06-07
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