Risultati finali
"D4.1 reports on progress of WP4 IRP ""EDA tools and methodologies for reliable nanoelectronic systems"" corresponding to task T4.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR4.3 IRP Open-source EDA tools for design quality and reliability using zamiaCAD"D4.3 reports on progress of WP4 IRP ""Open-source EDA tools for design quality and reliability using zamiaCAD"" corresponding to task T4.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR3.2 IRP Design approaches for tamper resistant crypto implementations"D3.2 reports on progress of WP3 IRP ""Design approaches for tamper resistant crypto implementations"" corresponding to task T3.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.3 IRP HW/SW fault tolerance methods driven by reliability and timing constraints"D1.3 reports on progress of WP1 IRP ""HW/SW fault tolerance methods driven by reliability and timing constraints"" corresponding to task T1.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR3.3 IRP Side-channel and Fault Attack resistant security primitives design"D3.3 reports on progress of WP3 IRP ""Side-channel and Fault Attack resistant security primitives design"" corresponding to task T3.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Comprehensive Communication PlanComprehensive Communication Plan to map main target groups and dissemination plan.
ESR2.2 IRP Innovative real-time operating system for error management for single- and multi-core units"D2.2 reports on progress of WP2 IRP ""Innovative real-time operating system for error management for single- and multi-core units"" corresponding to task T2.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR4.2 IRP EDA tools and methodologies for high quality nanoelectronic systems"D4.2 reports on progress of WP4 IRP ""EDA tools and methodologies for high quality nanoelectronic systems"" corresponding to task T4.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.5 IRP Reliable operation infrastructure for dynamic, high-dependability applications"D1.1 reports on progress of WP1 IRP ""Reliable operation infrastructure for dynamic, high-dependability applications"" corresponding to task T1.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.4 IRP Techniques for detecting permanent faults during the operational phase"D1.4 reports on progress of WP1 IRP ""Techniques for detecting permanent faults during the operational phase"" corresponding to task T1.4. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Report on Dissemination and Communication activitiesReport on dissemination and Communication activities throughout the whole project.
ESR3.1 IRP A novel Physical Unclonable Functions technology"D3.1 reports on progress of WP3 IRP ""A novel Physical Unclonable Functions technology"" corresponding to task T3.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR1.2 IRP Adaptive methods for fault tolerant embedded systems"D1.2 reports on progress of WP1 IRP ""Adaptive methods for fault tolerant embedded systems"" corresponding to task T1.2. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Reports on training eventsBrief reports presenting the main training outcomes. Intermediate versions of the deliverable are due by M18 and M30.
ESR2.1 IRP Effective techniques for secure and reliable systems validation"D2.1 reports on progress of WP2 IRP ""Effective techniques for secure and reliable systems validation"" corresponding to task T2.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Report on recruitment processReport on recruitment process and the recruited fellows enrolment in PhD programme
ESR1.1 IRP Reliability analysis methods and models of memory devices"D1.1 reports on progress of WP1 IRP ""Reliability analysis and modelling of memory devices"" corresponding to task T1.1. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Supervisory board of the networkEstablish the Supervisory board of the network.
ESR2.3 IRP A synthetic, hierarchical abstraction approach for modelling and managing complex systems quality and reliability"D2.3 reports on progress of WP2 IRP ""A synthetic, hierarchical abstraction approach for modelling and managing complex systems quality and reliability"" corresponding to task T2.3. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
ESR2.4 IRP Design errors verification and debug methods for complex nanoelectronic systems"D2.4 reports on progress of WP2 IRP ""Design errors verification and debug methods for complex nanoelectronic systems"" corresponding to task T2.4. To monitor the progress of the IRP implementation, the deliverable has 3 deadlines for intermediate versions at M15, M27 and M41 corresponding to milestones MS5, MS7, MS10."
Website, project logo and wiki-type online collaboration tool as for main dissemination.
Articles published40 scientific articles, 10 technical reports and 4 popular science articles will be published.
Pubblicazioni
Autori:
C. Gursoy, M. Jenihhin, A. S. Oyeniran, D. Piumatti, J. Raik, M. Sonza Reorda, R. Ubar
Pubblicato in:
2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019, Pagina/e 1-4, ISBN 978-1-7281-0073-9
Editore:
IEEE
DOI:
10.1109/ddecs.2019.8724642
Autori:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer
Pubblicato in:
2020 IEEE European Test Symposium (ETS), 2020, Pagina/e 1-6, ISBN 978-1-7281-4312-5
Editore:
IEEE
DOI:
10.1109/ets48528.2020.9131568
Autori:
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Pubblicato in:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Pagina/e 1-7, ISBN 978-1-7281-8187-5
Editore:
IEEE
DOI:
10.1109/iolts50870.2020.9159751
Autori:
R. Segabinazzi Ferreira, N. George, J. Chen, M. Hübner, M. Krstic, J. Nolte, and H. T. Vierhaus
Pubblicato in:
2019
Editore:
DSD
DOI:
10.26127/btuopen-5050
Autori:
Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
Pubblicato in:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, Pagina/e 792-797, ISBN 978-3-9819263-4-7
Editore:
IEEE
DOI:
10.23919/date48585.2020.9116278
Autori:
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Pubblicato in:
2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2019, Pagina/e 1-6, ISBN 978-1-7281-3424-6
Editore:
IEEE
DOI:
10.1109/dtis.2019.8735052
Autori:
Josie E. Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda
Pubblicato in:
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Pagina/e 570-573, ISBN 978-1-7281-0996-1
Editore:
IEEE
DOI:
10.1109/icecs46596.2019.8964677
Autori:
Stefano di Carlo, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Pubblicato in:
2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019, Pagina/e 1-6, ISBN 978-1-7281-0073-9
Editore:
IEEE
DOI:
10.1109/ddecs.2019.8724672
Autori:
Randolf Rotta, Raphael Segabinazzi Ferreira, Jorg Nolte
Pubblicato in:
2020 IEEE 23rd International Symposium on Real-Time Distributed Computing (ISORC), 2020, Pagina/e 154-155, ISBN 978-1-7281-6958-3
Editore:
IEEE
DOI:
10.1109/isorc49007.2020.00035
Autori:
T. Lange, A. Balakrishnan, M. Glorieux, D. Alexandrescu, L. Sterpone
Pubblicato in:
2019
Editore:
SEÖSE
Autori:
J. E. Rodriguez Condia, B. Du, M. Sonza Reorda, L. Sterpone
Pubblicato in:
2018
Editore:
Harwell Campus
DOI:
10.5281/zenodo.4662619
Autori:
Dmytro Petryk, Zoya Dyka, Jens Katzer, Peter Langendorfer
Pubblicato in:
2020 IEEE East-West Design & Test Symposium (EWDTS), 2020, Pagina/e 1-6, ISBN 978-1-7281-9899-6
Editore:
IEEE
DOI:
10.1109/ewdts50664.2020.9225092
Autori:
Xinhui Lai, Maksim Jenihhin, Georgios Selimis, Sven Goossens, Roel Maes, Kolin Paul
Pubblicato in:
2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC), 2020, Pagina/e 16-21, ISBN 978-1-7281-5409-1
Editore:
IEEE
DOI:
10.1109/vlsi-soc46417.2020.9344071
Autori:
D. Petryk, Z. Dyka, P. Langendörfer
Pubblicato in:
2021
Editore:
in32. Krypto-Tag 1st Digital Summit
DOI:
10.18420/cdm-2021-32-22
Autori:
G. C. Medeiros, M. Fieback, M. Taouil, L. B. Poehls, and S. Hamdioui
Pubblicato in:
2021
Editore:
IEEE
Autori:
M. Jenihhin, S. Hamdioui, M. Sonza Reorda, M. Krstic, P. Langendorfer, C. Sauer, A. Klotz, M. Huebner, J. Nolte, H. T. Vierhaus, G. Selimis, D. Alexandrescu, M. Taouil, G. J. Schrijen, J. Raik, L. Sterpone, G. Squillero, Z. Dyka
Pubblicato in:
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, Pagina/e 388-393, ISBN 978-3-9819263-4-7
Editore:
IEEE
DOI:
10.23919/date48585.2020.9116558
Autori:
T. Copetti, G. C. Medeiros, M. Taouil, S. Hamdioui, L. B. Poehls and T. Balen
Pubblicato in:
2020
Editore:
2020 IEEE Latin-American Test Symposium (LATS)
DOI:
10.1109/lats49555.2020.9093667
Autori:
J. Chen, T. Lange, M. Andjelkovic, A. Simevski, M. Krstic
Pubblicato in:
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, Pagina/e 1-6, ISBN 978-1-7281-9457-8
Editore:
IEEE
DOI:
10.1109/dft50435.2020.9250856
Autori:
Josie E Rodriguez Condia, M. Sonza Reorda
Pubblicato in:
2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC), 2020, Pagina/e 153-158, ISBN 978-1-7281-5409-1
Editore:
IEEE
DOI:
10.1109/vlsi-soc46417.2020.9344088
Autori:
Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Cristhian-Fernando Moreno-Manrique, Matteo Sonza Reorda
Pubblicato in:
2020 17th Biennial Baltic Electronics Conference (BEC), 2020, Pagina/e 1-6, ISBN 978-1-7281-9444-8
Editore:
IEEE
DOI:
10.1109/bec49624.2020.9276748
Autori:
Josie E. Rodriguez Condia, Matteo Sonza Reorda
Pubblicato in:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Pagina/e 1-6, ISBN 978-1-7281-8187-5
Editore:
IEEE
DOI:
10.1109/iolts50870.2020.9159711
Autori:
J. Chen, M. Andjelkovic, A. Simevski, Y. Li, P. Skoncej and M. Krstic
Pubblicato in:
2019
Editore:
DSD
DOI:
10.1109/dsd.2019.00080
Autori:
Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer
Pubblicato in:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Pagina/e 52-53, ISBN 978-1-7281-2490-2
Editore:
IEEE
DOI:
10.1109/iolts.2019.8854419
Autori:
Marcio M. Goncalves, Jose Rodrigo Azambuja, Josie E. R. Condia, Matteo Sonza Reorda, Luca Sterpone
Pubblicato in:
2020 IEEE Latin-American Test Symposium (LATS), 2020, Pagina/e 1-6, ISBN 978-1-7281-8731-0
Editore:
IEEE
DOI:
10.1109/lats49555.2020.9093682
Autori:
Josie E. Rodriguez Condia, Pierpaolo Narducci, M. Sonza Reorda, L. Sterpone
Pubblicato in:
2020 IEEE 38th VLSI Test Symposium (VTS), 2020, Pagina/e 1-6, ISBN 978-1-7281-5359-9
Editore:
IEEE
DOI:
10.1109/vts48691.2020.9107572
Autori:
Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Guursoy, Maksim Jenihhin
Pubblicato in:
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019, Pagina/e 335-340, ISBN 978-1-7281-3915-9
Editore:
IEEE
DOI:
10.1109/vlsi-soc.2019.8920313
Autori:
Raphael Segabinazzi Ferreira, Jorg Nolte, Fabian Vargas, Nevin George, Michael Hubner
Pubblicato in:
2020 IEEE Latin-American Test Symposium (LATS), 2020, Pagina/e 1-6, ISBN 978-1-7281-8731-0
Editore:
IEEE
DOI:
10.1109/lats49555.2020.9093692
Autori:
Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux
Pubblicato in:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Pagina/e 1-6, ISBN 978-1-7281-8187-5
Editore:
IEEE
DOI:
10.1109/iolts50870.2020.9159750
Autori:
Josie E. Rodriguez Condia, Pierpaolo Narducci, M. Sonza Reorda, L. Sterpone
Pubblicato in:
2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2020, Pagina/e 1-6, ISBN 978-1-7281-9938-2
Editore:
IEEE
DOI:
10.1109/ddecs50862.2020.9095665
Autori:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer
Pubblicato in:
2019 IEEE 28th Asian Test Symposium (ATS), 2019, Pagina/e 129-1295, ISBN 978-1-7281-2695-1
Editore:
IEEE
DOI:
10.1109/ats47505.2019.00024
Autori:
Josie E. Rodriguez Condia, Marcio M. Goncalves, Jose Rodrigo Azambuja, Matteo Sonza Reorda, Luca Sterpone
Pubblicato in:
2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2020, Pagina/e 380-385, ISBN 978-1-7281-5775-7
Editore:
IEEE
DOI:
10.1109/isvlsi49217.2020.00076
Autori:
M. M. Goncalves; Josie E. Rodriguez Condia; M. Sonza Reorda, L. Sterpone and J. R. Azambuja
Pubblicato in:
2020
Editore:
ESREF
DOI:
10.5281/zenodo.4662676
Autori:
S. Masoumian, G. Selimis, R. Maes, G. Schrijen, S. Hamdioui and M. Taouil
Pubblicato in:
2020 IEEE European Test Symposium (ETS), 2020, Pagina/e pp. 1-6.
Editore:
IEEE
DOI:
10.1109/ets48528.2020.9131583
Autori:
T. Lange, A. Balakrishnan, M. Glorieux, D. Alexandrescu and L. Sterpone,
Pubblicato in:
2019
Editore:
IEEE
DOI:
10.1109/dsn-s.2019.00021
Autori:
Josie E. Rodriguez Condia, Matteo Sonza Reorda
Pubblicato in:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Pagina/e 97-102, ISBN 978-1-7281-2490-2
Editore:
IEEE
DOI:
10.1109/iolts.2019.8854463
Autori:
M. Andjelkovic, A. Simevski, J. Chen, M. Krstic, et al.
Pubblicato in:
23rd Euromicro Conference on Digital System Design (DSD), 2020
Editore:
IEEE
DOI:
10.1109/dsd51259.2020.00082
Autori:
Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer
Pubblicato in:
2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2019, Pagina/e 1-7, ISBN 978-1-7281-2769-9
Editore:
IEEE
DOI:
10.1109/norchip.2019.8906932
Autori:
B. Du; J. E. Rodriguez Condia; M. Sonza Reorda; L. Sterpone
Pubblicato in:
2019
Editore:
RADECS
DOI:
10.5281/zenodo.4662662
Autori:
Aleksa Damljanovic, Annachiara Ruospo, Ernesto Sanchez, Giovanni Squillero
Pubblicato in:
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2021, Pagina/e 51-56, ISBN 978-1-6654-3595-6
Editore:
IEEE
DOI:
10.1109/ddecs52668.2021.9417061
Autori:
B. Du, Josie E. Rodriguez Condia, M. Sonza Reorda, L. Sterpone
Pubblicato in:
2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), Numero Hotel Cap Roig, Platja d’Aro, Costa Brava, Spain, July 2-4, 2018, 2018, Pagina/e 85-90, ISBN 978-1-5386-5992-2
Editore:
IEEE
DOI:
10.1109/IOLTS.2018.8474174
Autori:
Josie E. Rodriguez Condia, B. Du, M. Sonza Reorda, L. Sterpone
Pubblicato in:
A workshop on Self-driving Cars and Reliability, Rutherford Appleton Laboratory, Harwell Campus, 2018
Editore:
A workshop on Self-driving Cars and Reliability, Rutherford Appleton Laboratory, Harwell Campus
Autori:
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Pubblicato in:
2018 IEEE International Test Conference in Asia (ITC-Asia), 2018, Pagina/e 55-60, ISBN 978-1-5386-5180-3
Editore:
IEEE
DOI:
10.1109/ITC-Asia.2018.00020
Autori:
D. Petryk, Z. Dyka, P. Langendörfer
Pubblicato in:
Proc. 29th Crypto-Day 2018, 2018
Editore:
29. Krypto-Tag / Proc. 29th Crypto-Day 2018
DOI:
10.18420/cdm-2018-29-11
Autori:
F. Augusto da Silva, A. C. Bagbaba, S. Hamdioui and C. Sauer
Pubblicato in:
2018 Design and Verification conference Europe (DVCON-Europe), 2018
Editore:
2018 Design and Verification Conference and Exhibition (DVCon) Europe
DOI:
10.5281/zenodo.3361533
Autori:
A. C. Bagbaba, F. Augusto da Silva, C. Sauer
Pubblicato in:
2018 Design and Verification conference Europe (DVCON-Europe), 2018
Editore:
2018 Design and Verification Conference and Exhibition (DVCon) Europe
DOI:
10.5281/zenodo.3361607
Autori:
Thomas Lange, Maximilien Glorieux, Adrian Evans, A-Duong In, Dan Alexandrescu, Cesar Boatella-Polo, Carlos Urbina Ortega, Véronique Ferlet-Cavrois, Maris Tali, Rubén Garcı́a Alı́a
Pubblicato in:
2018 ESA/ESTEC Space FPGA Users Workshop (SEFUW), 2018
Editore:
2018 ESA/ESTEC Space FPGA Users Workshop (SEFUW)
Autori:
Luca Sterpone, Sarah Azimi, Ludovica Bozzoli, Boyang Du, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Cesar Boatella Polo, David Merodio Codinachs
Pubblicato in:
2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 2018, Pagina/e 120-126, ISBN 978-1-5386-7753-7
Editore:
IEEE
DOI:
10.1109/AHS.2018.8541474
Autori:
Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
Pubblicato in:
2019 IEEE European Test Symposium (ETS), 2019, Pagina/e 1-2, ISBN 978-1-7281-1173-5
Editore:
IEEE
DOI:
10.1109/ets.2019.8791517
Autori:
B. Du, Josie E. Rodriguez Condia, M. Sonza Reorda, L. Sterpone
Pubblicato in:
2019 IEEE Latin American Test Symposium (LATS), 2019, Pagina/e 1-6, ISBN 978-1-7281-1756-0
Editore:
IEEE
DOI:
10.1109/latw.2019.8704643
Autori:
Josie E. Rodriguez Condia, Matteo Sonza Reorda
Pubblicato in:
SELSE-15: The 15th Workshop on Silicon Errors in Logic – System Effects, Numero 27-28 March 2019, Stanford, California, USA, 2019
Editore:
SELSE-15
Autori:
B. Du, Josie E. Rodriguez Condia, M. Sonza Reorda, L. Sterpone
Pubblicato in:
NVIDIA GPU Tecnology Conference (GTC Europe 2018), Numero 23-25 October, 2018, Munich, Germany, 2018
Editore:
GTC Europe 2018
Autori:
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Pubblicato in:
2018 IEEE International Test Conference (ITC), 2018, Pagina/e 1-9, ISBN 978-1-5386-8382-8
Editore:
IEEE
DOI:
10.1109/test.2018.8624742
Autori:
A. Damljanovic, A. Jutman, G. Squillero and A. Tsertov
Pubblicato in:
Proc. IEEE European Test Symposium 2019 (in press), 2019
Editore:
IEEE
DOI:
10.5281/zenodo.3362602
Autori:
R. Cantoro, A.Damljanovic. M. Sonza Reorda and G. Squillero
Pubblicato in:
2018 3rd International Test Standards Application Workshop (TESTA), 2018
Editore:
2018 3rd International Test Standards Application Workshop (TESTA)
Autori:
Maximilien Glorieux, Adrian Evans, Thomas Lange, A-Duong In, Dan Alexandrescu, Cesar Boatella-Polo, Ruben Garcia Alia, Maris Tali, Carlos Urbina Ortega, Maria Kastriotou, Pablo Fernandez-Martinez, Veronique Ferlet-Cavrois
Pubblicato in:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, Pagina/e 1-5, ISBN 978-1-5386-8263-0
Editore:
IEEE
DOI:
10.1109/nsrec.2018.8584296
Autori:
Maksim Jenihhin, Xinhui Lai, Tara Ghasempouri, Jaan Raik
Pubblicato in:
2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2018, Pagina/e 1-7, ISBN 978-1-5386-7656-1
Editore:
IEEE
DOI:
10.1109/norchip.2018.8573495
Autori:
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik
Pubblicato in:
2019 IEEE Latin American Test Symposium (LATS), 2019, Pagina/e 1-6, ISBN 978-1-7281-1756-0
Editore:
IEEE
DOI:
10.1109/latw.2019.8704591
Autori:
D.H.P. Kraak, C.C. Gursoy, I.O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui
Pubblicato in:
2019 IEEE Latin American Test Symposium (LATS), 2019, Pagina/e 1-6, ISBN 978-1-7281-1756-0
Editore:
IEEE
DOI:
10.1109/latw.2019.8704595
Autori:
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
Pubblicato in:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Pagina/e 7-14, ISBN 978-1-7281-2490-2
Editore:
IEEE
DOI:
10.1109/iolts.2019.8854423
Autori:
C. C. Gürsoy, G. Medeiros, J. Chen, N. George, J. E. Rodriguez Condia, T. Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S. Hamdioui, M. Taouil, M. Krstic, P. Langendörfer, Z. Dyka, M. Huebner, J. Nolte, H. T. Vierhaus,M. Sonza Reorda, G. Squillero, L. Sterpone, J. Raik, D. Alexandrescu, M. Glorieux, G. Selimis
Pubblicato in:
University Booth - Design, Automation & Test in Europe Conference & Exhibition (Univerity Booth DATE 2019), Numero 25-29 March 2019, 2019
Editore:
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
DOI:
10.5281/zenodo.3362529
Autori:
Adeboye Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gursoy, Jaan Raik
Pubblicato in:
Proc. IEEE European Test Symposium 2019 (in press), 2019
Editore:
IEEE
Autori:
Heinrich Theodor Vierhaus, Maksim Jenihhin, Matteo Sonza Reorda
Pubblicato in:
2018 12th European Workshop on Microelectronics Education (EWME), 2018, Pagina/e 45-50, ISBN 978-1-5386-9114-4
Editore:
IEEE
DOI:
10.1109/ewme.2018.8629465
Autori:
Marko Andjelkovic, Mitko Veleski, Junchao Chen, Aleksandar Simevski, Milos Krstic, Rolf Kraemer
Pubblicato in:
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Pagina/e 594-597, ISBN 978-1-7281-0996-1
Editore:
IEEE
DOI:
10.1109/icecs46596.2019.8964644
Autori:
T. Lange; M. Glorieux; D. Alexandrescu; L. Sterpone
Pubblicato in:
2020
Editore:
SEE/MAPLD
Autori:
Aleksa Damljanovic, Artur Jutman, Michele Portolan, Ernesto Sanchez, Giovanni Squillero, Anton Tsertov
Pubblicato in:
2019 IEEE International Test Conference (ITC), 2019, Pagina/e 1-8, ISBN 978-1-7281-4823-6
Editore:
IEEE
DOI:
10.1109/itc44170.2019.9000181
Autori:
Troya Cagail Koylu, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil
Pubblicato in:
2020 IEEE International Symposium on Circuits and Systems (ISCAS), 2020, Pagina/e 1-5, ISBN 978-1-7281-3320-1
Editore:
IEEE
DOI:
10.1109/iscas45731.2020.9180708
Autori:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer
Pubblicato in:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Pagina/e 255-256, ISBN 978-1-7281-2490-2
Editore:
IEEE
DOI:
10.1109/iolts.2019.8854449
Autori:
Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer
Pubblicato in:
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, Pagina/e 1-6, ISBN 978-1-7281-8187-5
Editore:
IEEE
DOI:
10.1109/iolts50870.2020.9159715
Autori:
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Sanchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer
Pubblicato in:
2020 IEEE 38th VLSI Test Symposium (VTS), 2020, Pagina/e 1-9, ISBN 978-1-7281-5359-9
Editore:
IEEE
DOI:
10.1109/vts48691.2020.9107599
Autori:
Dmytro Petryk, Zoya Dyka, Eduardo Perez, Mamathamba Kalishettyhalli Mahadevaiaha, Ievgen Kabin, Christian Wenger, Peter Langendorfer
Pubblicato in:
2020 23rd Euromicro Conference on Digital System Design (DSD), 2020, Pagina/e 238-245, ISBN 978-1-7281-9535-3
Editore:
IEEE
DOI:
10.1109/dsd51259.2020.00047
Autori:
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Pubblicato in:
2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 2019, Pagina/e 72-78, ISBN 978-1-7281-4650-8
Editore:
IEEE
DOI:
10.1109/ahs.2019.00007
Autori:
Xinhui Lai, Maksim Jenihhin, Jaan Raik, Kolin Paul
Pubblicato in:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, Pagina/e 239-242, ISBN 978-1-7281-2490-2
Editore:
IEEE
DOI:
10.1109/iolts.2019.8854458
Autori:
M. Andjelkovic, J. Chen, A. Simevski, Z. Stamenkovic, M. Krstic, R. Kraemer
Pubblicato in:
Proc. 31st European Conference on Radiation and its Effects on Components and Systems, 2020
Editore:
IEEE
Autori:
Raphael Segabinazzi Ferreira, Jorg Nolte
Pubblicato in:
2019 IEEE Latin American Test Symposium (LATS), 2019, Pagina/e 1-6, ISBN 978-1-7281-1756-0
Editore:
IEEE
DOI:
10.1109/latw.2019.8704560
Autori:
Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu
Pubblicato in:
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019, Pagina/e 1-6, ISBN 978-1-7281-2260-1
Editore:
IEEE
DOI:
10.1109/dft.2019.8875379
Autori:
Dmytro Petryk, Zoya Dyka, Peter Langendorfer
Pubblicato in:
2020 9th Mediterranean Conference on Embedded Computing (MECO), 2020, Pagina/e 1-4, ISBN 978-1-7281-6949-1
Editore:
IEEE
DOI:
10.1109/meco49872.2020.9134146
Autori:
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
Pubblicato in:
2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC), 2019, Pagina/e 1-7, ISBN 978-1-7281-2769-9
Editore:
IEEE
DOI:
10.1109/norchip.2019.8906974
Autori:
B. Du, Josie E. Rodriguez Condia, Matteo Sonza Reorda
Pubblicato in:
2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2019, Pagina/e 1-6, ISBN 978-1-7281-3424-6
Editore:
IEEE
DOI:
10.1109/dtis.2019.8735047
Autori:
T. Lange; A. Balakrishnan; M. Glorieux; D. Alexandrescu; L. Sterpone
Pubblicato in:
2020
Editore:
No
Autori:
C.C. Gursoy, G. Medeiros, J. Chen, N. George, J.E. Rodriguez Condia, T. Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S.Hamdioui, M.Taouil, M.Krstic, P.Langend ̈orfer, Z.Dyka, M.Brandalero, M.H ̈ubner, J.N ̈olte, H.T.Vierhaus, M.Sonza Reorda, G.Squillero, L.Sterpone, J.Raik, D.Alexandrescu, M.Glorieux, G.Seli
Pubblicato in:
2020
Editore:
DATE
Autori:
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero
Pubblicato in:
Journal of Circuits, Systems and Computers, Numero 28/supp01, 2019, Pagina/e 1940007, ISSN 0218-1266
Editore:
World Scientific Publishing Co
DOI:
10.1142/s0218126619400073
Autori:
Xinhui Lai, Aneesh Balakrishnan, Thomas Lange, Maksim Jenihhin, Tara Ghasempouri, Jaan Raik, Dan Alexandrescu
Pubblicato in:
Microprocessors and Microsystems, Numero 71, 2019, Pagina/e 102867, ISSN 0141-9331
Editore:
Elsevier BV
DOI:
10.1016/j.micpro.2019.102867
Autori:
Josie E. RodriguezCondia, Boyang Du, Matteo Sonza Reorda, Luca Sterpone
Pubblicato in:
Microelectronics Reliability, 2020, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113660
Autori:
M. M. Goncalves; Josie E. Rodriguez Condia; M. Sonza Reorda, L. Sterpone and J. R. Azambuja
Pubblicato in:
Microelectronics Reliability, Numero Volume 114, November 2020 113768, 2020, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113768
Autori:
J. Chen, T. Lange, M. Andjelkovic, A. Simevski, M. Krstic
Pubblicato in:
Microelectronics Reliability, Numero 114, 2020, Pagina/e 113799, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2020.113799
Autori:
Josie E. Rodriguez Condia, Pierpaolo Narducci, Matteo Sonza Reorda, Luca Sterpone
Pubblicato in:
The Journal of Supercomputing, 2021, ISSN 0920-8542
Editore:
Kluwer Academic Publishers
DOI:
10.1007/s11227-021-03751-2
Autori:
S. Di Carlo, J. E. Rodriguez Condia and M. Sonza Reorda
Pubblicato in:
IEEE Access, 2020, ISSN 2169-3536
Editore:
Institute of Electrical and Electronics Engineers Inc.
DOI:
10.1109/access.2020.2968139
Autori:
G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui
Pubblicato in:
Microelectronics Reliability, Numero 88-90, 2018, Pagina/e 355-359, ISSN 0026-2714
Editore:
Elsevier BV
DOI:
10.1016/j.microrel.2018.07.092
Autori:
Yuanqing Li, Anselm Breitenreiter, Marko Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic
Pubblicato in:
Microelectronics Journal, Numero 96, 2020, Pagina/e 104683, ISSN 0026-2692
Editore:
Mackintosh Publications
DOI:
10.1016/j.mejo.2019.104683
Autori:
A. Bosio; S. Di Carlo; G. Di Natale; M. Sonza Reorda and Josie E. Rodriguez Condia
Pubblicato in:
Cross-Layer Reliability of Computing Systems, 2020
Editore:
Cross-Layer Reliability of Computing Systems
DOI:
10.5281/zenodo.4664277
Diritti di proprietà intellettuale
Numero candidatura/pubblicazione:
19
179081
Data:
2019-06-07
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