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Integrated Development 4.0

Deliverables

4.3.2.1 Report on Zero-Failur Culture

The report deals with the developed and verified model to analyze the effects of process improvements and analyze its dynamic behavior for manufacturing and the supply chain

D5.1.3.1 Publishable Use Case Report

Publishable descriptions of the industrial Use Cases defined

D7.1.3.1 Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

Report on signal preprocessing for Machine Learning/Deep Leaning data analysis and feature extraction

D7.2.1.1 Efficient modelling of electro-thermo-mechanical stress during fast power cycling operation of an IC

The deliverable reports on proposed techniques for an efficient modelling of electro-thermo-mechanical stress during fast power cycling Operation.

D7.1.3.2 Report on classification algorithms

Report on classification algorithms

D4.1.2.1 Concept for digitally augmenting human work

A holistic concept for digitally augmenting human work is presented and agreed on with the stakeholders.

D4.2.2.1 Report on socio-organizational implications of digtial twins

Socioorganizational implications of digital twin Use Cases are investigated and documented

D4.1.3.2 Final Report of Documentation and verification of smart knowledge management in different applications

Documentation and verification of smart knowledge management in different applications take place

D7.6: D7.2.2.1 Yield estimation and prediction figures of merit and yield detracting factors’ determination

The deliverable reports advanced methods for multifactor pre- and post-silicon yield estimation and prediction, detection of yield detractors and root cause discovery.

D7.1.2.1 Report on virtual prototyping rules for DFM Optimization

Virtual prototyping rules for DFM Optimization

D6.1.1.1 Press Release: Launching the iDev40 project

A Press Release about the launch of iDev40 is published.

D4.3.1.1 Demonstrator and report of decision support system (for complexity management)

A demonstrator about the analysis of complex demands in work systems for decision and planning support on the shop floor and management level is presented

Publications

Wie innovative Logistik die zukunftssichere und nachhaltige Gestaltung der Automatisierung und Digitalisierung der Halbleiterindustrie unterstützt

Author(s): Germar Schneider; Jacob Lohmer
Published in: Logistik in Wissenschaft und Praxis, 2, 2021
Publisher: Gabler Verlag
DOI: 10.5281/zenodo.4687042

RTAMT: Online Robustness Monitors from STL

Author(s): Dejan Ničković, Tomoya Yamaguchi
Published in: Automated Technology for Verification and Analysis - 18th International Symposium, ATVA 2020, Hanoi, Vietnam, October 19–23, 2020, Proceedings, 12302, 2020, Page(s) 564-571, ISBN 978-3-030-59151-9
Publisher: Springer International Publishing
DOI: 10.1007/978-3-030-59152-6_34

Rückwärtssimulation als Instrument zur Produktionsplanung – Erkenntnisse aus einer praxisbezogenen Fallstudie

Author(s): Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Published in: Simulation in Produktion und Logistik 2021, 2021
Publisher: Jörg Franke, Peter Schuderer

A Text Extraction-Based Smart Knowledge Graph Composition for Integrating Lessons Learned During the Microchip Design

Author(s): Hasan Abu Rasheed, Christian Weber, Johannes Zenkert, Peter Czerner, Roland Krumm, Madjid Fathi
Published in: Intelligent Systems and Applications - Proceedings of the 2020 Intelligent Systems Conference (IntelliSys) Volume 2, 1251, 2021, Page(s) 594-610, ISBN 978-3-030-55186-5
Publisher: Springer International Publishing
DOI: 10.1007/978-3-030-55187-2_43

Trustworthy Smart Autonomous Systems-of-Systems - Resilient Technology, Economy and Society

Author(s): Schoitsch Erwin
Published in: IDIMT-2021 - 29th Interdisciplinary Information Management Talks, 2021
Publisher: Trauner Verlag - Universität
DOI: 10.5281/zenodo.5828352

Control of heterogenous AMHS in semiconductor industry under consideration of dynamic transport carrier transfers

Author(s): Wagner, T., Seitz, J., Schneider, G.
Published in: International Conference on Industrial Technology, 2021
Publisher: IEEE

Adversarial Training is Not Ready for Robot Learning

Author(s): Mathias Lechner, Ramin Hasani, Radu Grosu, Daniela Rus, Thomas A. Henzinger
Published in: IEEE 2021 International Conference on Robotics and Automation (ICRA), 2021, 2021
Publisher: IEEE

AIT Cyber Range - Flexible Cyber Security Environment for Exercises, Training and Research

Author(s): Maria Leitner, Maximilian Frank, Wolfgang Hotwagner, Gregor Langner, Oliver Maurhart, Timea Pahi, Lenhard Reuter, Florian Skopik, Paul Smith, Manuel Warum
Published in: Proceedings of the European Interdisciplinary Cybersecurity Conference, 2020, Page(s) 1-6, ISBN 9781450375993
Publisher: ACM
DOI: 10.1145/3424954.3424959

Digital Reference: a quasi-standard for digitalization in the domain of semiconductor supply chains

Author(s): Hans Ehm, Erwin Schoitsch, Jan Wytze van der Weit, Nour Ramzy, Lanyingzhu Luo, Daniel Louis Gruetzner
Published in: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS), 2020, Page(s) 563-570, ISBN 978-1-7281-6389-5
Publisher: IEEE
DOI: 10.1109/icps48405.2020.9274750

Smart Collaboration - Mitarbeiter-zentrierte Informationssysteme in der Produktentstehung

Author(s): Rosenberger, Manfred, Fellmann Michael, Richter Alexander, Stocker Alexander, Schmeja Michael, Damalas Stelios Andreas
Published in: Mensch und Computer 2020 - Workshopband, 2020
Publisher: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116

The Sound of Silence - Mining Security Vulnerabilities from Secret Integration Channels in Open-Source Projects

Author(s): Ralf Ramsauer, Lukas Bulwahn, Daniel Lohmann, Wolfgang Mauerer
Published in: Proceedings of the 2020 ACM SIGSAC Conference on Cloud Computing Security Workshop, 2020, Page(s) 147-157, ISBN 9781450380843
Publisher: ACM
DOI: 10.1145/3411495.3421360

The Impact of Intelligent Process Automation on Purchasing and Supply Management – Initial Insights from a Multiple Case Study

Author(s): Flechsig, Christian
Published in: Logistics Management, 2021
Publisher: Springer
DOI: 10.1007/978-3-030-85843-8_5

Human-Robot Assembly: Methodical Design and Assessment of an Immersive Virtual Environment for Real-World Significance

Author(s): Johannes Hocherl, Andreas Adam, Thomas Schlegl, Britta Wrede
Published in: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020, Page(s) 549-556, ISBN 978-1-7281-8956-7
Publisher: IEEE
DOI: 10.1109/etfa46521.2020.9212039

A Review of the Key Success Factors for the Implementation of Digital Technologies in the Context of Industry 4.0

Author(s): Alexander Stocker, Manfred Rosenberger, Michael Schmeja, Germar Schneider
Published in: IFIP/IEEE IM 2021 Workshop: 2nd Workshop on Management for Industry 4.0 (MFI4.0), 2021
Publisher: IEEE

Silentium! Run-Analyse-Eradicate the Noise out of the DB/OS Stack

Author(s): Mauerer, Wolfgang; Ramsauer, Ralf; Lucas, Edson R. F.; Scherzinger, Stefanie
Published in: Lecture Notes in Informatics (LNI), 1, 2021
Publisher: Gesellschaft für Informatik

HEURISTICS FOR ORDER-LOT PEGGING IN MULTI-FAB SETTINGS

Author(s): Lars Mönch, Liji Shen, John W. Fowler
Published in: Proceedings of the 2020 Winter Simulation Conference, 2020
Publisher: IEEE

Using accuracy measurements to evaluate simulation model simplification

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: Proceedings of the 2020 Winter Simulation Conference, 2020
Publisher: IEEE

An unsupervised methodology for online drift detection in multivariate industrial datasets

Author(s): Sarah Klein, Mathias Verbeke
Published in: 2020 International Conference on Data Mining Workshops (ICDMW), 2020, Page(s) 392-399, ISBN 978-1-7281-9012-9
Publisher: IEEE
DOI: 10.1109/icdmw51313.2020.00061

On-Off Center-Surround Receptive Fields for Accurate and Robust Image Classification

Author(s): Zahra Babaiee, Ramin Hasani, Mathias Lechner, Daniela Rus, Radu Grosu
Published in: 2021 2nd International Conference on Leadership and Management, 2021
Publisher: ICLM

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification

Author(s): Andrei Gaita, Georgian Nicolae, Emilian C. David, Andi Buzo, Corneliu Burileanu, Georg Pelz
Published in: 2020 IEEE European Test Symposium (ETS), 2020, Page(s) 1-2, ISBN 978-1-7281-4312-5
Publisher: IEEE
DOI: 10.1109/ets48528.2020.9131599

Multi-factory Job Shop Scheduling With Due Date Objective

Author(s): Jacob Lohmer, Daniel Spengler, Rainer Lasch
Published in: 2020 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020, Page(s) 79-84, ISBN 978-1-5386-7220-4
Publisher: IEEE
DOI: 10.1109/ieem45057.2020.9309905

Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry

Author(s): Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert, Roland Krumm, Madjid Fathi
Published in: Computing Conference 2021, 2021
Publisher: Computing Conference

Key Expansion in Cryptographic Systems

Author(s): Sorin Chiţu, Daniel Ciprian Vasile, Ionuţ Daniel Trămândan, Paul Svasta
Published in: 2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME), 2020
Publisher: IEEE
DOI: 10.1109/siitme50350.2020.9292242

Benefits of Digitalization for Business Processes in Semiconductor Manufacturing

Author(s): Germar Schneider, Sophia Keil, Fabian Lindner
Published in: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Page(s) 1027-1033, ISBN 978-1-7281-5730-6
Publisher: IEEE
DOI: 10.1109/icit46573.2021.9453611

An Industry 4.0 Production Workplace Enhanced by Using Mixed Reality Assembly Instructions with Microsoft HoloLens

Author(s): Hebenstreit M., Spitzer M., Eder M., Ramsauer C.
Published in: Mensch und Computer 2020 - Workshopband, 2020
Publisher: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-005

Learning Long-Term Dependencies in Irregularly-Sampled Time Series

Author(s): Lechner, Mathias; Hasani, Ramin
Published in: Neural Information Processing Systems (NIPS), 2, 2020
Publisher: Neural Information Processing Systems Foundation

Order Release Methods in Semiconductor Manufacturing: State-of-the-Art in Science and Lessons from Industry

Author(s): Jacob Lohmer, Christian Flechsig, Rainer Lasch, Konstantin Schmidt, Benjamin Zettler, Germar Schneider
Published in: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020, Page(s) 1-6, ISBN 978-1-7281-5876-1
Publisher: IEEE
DOI: 10.1109/ASMC49169.2020.9185201

1MHz Gate Driver in Power Technology for Fast Switching Applications

Author(s): Roberto Di Lorenzo, Andrea Baschirotto, Albino Pidutti, Paolo Del Croce
Published in: IEEE 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES), 2020
Publisher: IEEE

On The Verification of Neural ODEs with Stochastic Guarantees

Author(s): Gruenbacher, Sophie; Hasani, Ramin; Lechner, Mathias; Cyranka, Jacek; Smolka, Scott A.; Grosu, Radu
Published in: Thirty-Fifth AAAI Conference on Artificial Intelligence, 4, 2021
Publisher: AAAI

Liquid Time-constant Networks

Author(s): Hasani, Ramin; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Published in: Proceedings of the AAAI Conference on Artificial Intelligence, 2021
Publisher: AAAI

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions

Author(s): Peter Stich, Rebecca Busch, Michael Wahl, Christian Weber, Madjid Fathi
Published in: 2021 IEEE International Conference on Electro Information Technology (EIT), 2021, Page(s) 1-6, ISBN 978-1-6654-1846-1
Publisher: IEEE
DOI: 10.1109/eit51626.2021.9491836

Correlating electrical and process parameters for yield detractors’ detection

Author(s): Ingrid Kovacs, Marina Topa, Ciprian Pop, Elena-Diana Sandru, Andi Buzo, Georg Pelz
Published in: 2020 International Symposium on Electronics and Telecommunications (ISETC), 2020, Page(s) 1-4, ISBN 978-1-7281-9513-1
Publisher: IEEE
DOI: 10.1109/isetc50328.2020.9301121

Backward Simulation for Production Planning - Recent Advances in a Real-World Use-Case

Author(s): Christoph Laroque, Madlene Leißau, Wolfgang Scholl, Germar Schneider
Published in: 2021 Winter Simulation Conference (WSC), 2021
Publisher: IEEE

Electro-Thermal Simulation of Power DMOS Devices Operating under Fast Thermal Cycling

Author(s): Ciprian Florea, Vasile Ţopa, Dan Simon
Published in: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Publisher: IEEE
DOI: 10.1109/siitme50350.2020.9292143

Smart Platform for Rapid Prototyping: Solutions in the dilemma of flexibility and standardization

Author(s): Sabrina Anger, Felix Klingert, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Published in: International Conference on Industrial Technology, 2021
Publisher: IEEE

Simulation-based Evaluation of Lot Release Policies in a Power Semiconductor Facility - A Case Study

Author(s): Allgeier, Henriette; Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer; Schneider, Germar; Zettler, Benjamin
Published in: Proceedings of the 2020 Winter Simulation Conference, 2020
Publisher: IEEE
DOI: 10.5281/zenodo.4011587

Investigation of Predictive Maintenance for Semiconductor Manufacturing and its Impacts on the Supply Chain

Author(s): Daniel Fischer, Patrick Moder, Hans Ehm
Published in: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), 2021, Page(s) 1409-1416, ISBN 978-1-7281-5730-6
Publisher: IEEE
DOI: 10.1109/icit46573.2021.9453481

Service-based Semiconductor Manufacturing using the Digital Reference Ontology for Global Service Discovery

Author(s): Hartwig Baumgaertel Patrick Moder Nour Ramzy Hans Ehm
Published in: IEEE IECON 2020 conference special session on IoT Automation Technologies, Tools and Applications, 2020
Publisher: IEEE

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Author(s): Ramin Hasani, Mathias Lechner, Alexander Amini,Daniela Rus, Radu Grosu
Published in: International Conference on Machine Learning (ICML), 2020
Publisher: ICML

Cryptographic Key Derivation from an Anti-Tamper Solution

Author(s): Daniel-Ciprian Vasile, Sorin Chitu, Paul Svasta
Published in: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC), 2020, Page(s) 1-6, ISBN 978-1-7281-6293-5
Publisher: IEEE
DOI: 10.1109/estc48849.2020.9229844

Strategic Approaches for Further Development of SiC Rapid Prototype Production

Author(s): Sabrina Anger, Volker Häublein, Markus Pfeffer, Martin Schellenberger
Published in: European Advanced Process Control and Manufacturing Conference (apc|m), 2022
Publisher: apc|m

Smart Systems Everywhere – Intelligence, Autonomy, Technology and Society

Author(s): Schoitsch Erwin
Published in: Proceedings of IDIMT 2018, Strategic Modeling in Management, Economy and Society, 2018, Page(s) 153-165, ISBN 978-3-99062-339-8
Publisher: Trauner Verlag
DOI: 10.5281/zenodo.2590948

A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Author(s): Sophia Keil, Fabian Lindner, Germar Schneider, Tobias Jakubowitz
Published in: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2019, Page(s) 1-6, ISBN 978-1-5386-7601-1
Publisher: IEEE
DOI: 10.1109/asmc.2019.8791830

Response Characterization for Auditing Cell Dynamics in Long Short-term Memory Networks

Author(s): Ramin Hasani, Alexander Amini, Mathias Lechner, Felix Naser, Radu Grosu, Daniela Rus
Published in: 2019 International Joint Conference on Neural Networks (IJCNN), 2019, Page(s) 1-8, ISBN 978-1-7281-1985-4
Publisher: IEEE
DOI: 10.1109/ijcnn.2019.8851954

The List is the Process: Reliable Pre-Integration Tracking of Commits on Mailing Lists

Author(s): Ralf Ramsauer, Daniel Lohmann, Wolfgang Mauerer
Published in: 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), 2019, Page(s) 807-818, ISBN 978-1-7281-0869-8
Publisher: IEEE
DOI: 10.1109/icse.2019.00088

Novel challenges for root cause investigation in semiconductor manufacturing

Author(s): Pleschberger, Martin; Zernig, Anja; Kaestner, Andre
Published in: 19th European Advanced Process Control and Manufacturing Conference (apc/m), 3, 2019
Publisher: European Advanced Process Control and manufacturing Conference
DOI: 10.5281/zenodo.3247340

A Formally Robust Time Series Distance Metric

Author(s): Maximilian Toller, Berhard C. Geiger, Roman Kern
Published in: MileTS'19: 5th KDD Workshop on Mining and Learning from Time Series, 2019
Publisher: ACM

A Machine Learning Suite for Machine Components’ Health-Monitoring

Author(s): Ramin Hasani, Guodong Wang, Radu Grosu
Published in: Proceedings of the AAAI Conference on Artificial Intelligence, 33, 2019, Page(s) 9472-9477, ISSN 2374-3468
Publisher: Association for the Advancement of Artificial Intelligence
DOI: 10.1609/aaai.v33i01.33019472

Realizing the full potential of Robotic Process Automation through a combination with BPM

Author(s): Flechsig, Christian; Lohmer, Jacob; Lasch, Rainer
Published in: Logistics Management, 1, 2019, Page(s) 104-119
Publisher: Springer
DOI: 10.1007/978-3-030-29821-0_8

A Research Agenda to Deploy Technology Enhanced Learning with Augmented Reality in Industry

Author(s): Spitzer, Michael; Gsellmann, Inge; Hebenstreit, Matthias; Damalas, Stelios; Ebner, Martin
Published in: Mensch und Computer 2019 - Workshopband, 2019
Publisher: Gesellschaft für Informatik e.V

Smart Collaboration - Mitarbeiter-zentriete Informationssysteme in der Produktentstehung

Author(s): Manfred Rosenberger, Michael Fellmann, Alexander Richter, Alexander Stocker, Michael Schmeja, Christian Kaiser
Published in: Mensch und Computer 2019 - Workshopband, 2019
Publisher: Gesellschaft für Informatik e.V

Human Work Activity Recognition for Working Cells in Industrial Production Contexts

Author(s): Clemens Pohlt, Thomas Schlegl, Sven Wachsmuth
Published in: 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC), 2019, Page(s) 4225-4230, ISBN 978-1-7281-4569-3
Publisher: IEEE
DOI: 10.1109/smc.2019.8913873

Designing Worm-inspired Neural Networks for Interpretable Robotic Control

Author(s): Mathias Lechner, Ramin Hasani, Manuel Zimmer, Thomas A. Henzinger, Radu Grosu
Published in: 2019 International Conference on Robotics and Automation (ICRA), 2019, Page(s) 87-94, ISBN 978-1-5386-6027-0
Publisher: IEEE
DOI: 10.1109/icra.2019.8793840

Security Chain Tool for IoT Secure Applications

Author(s): Schmittner C., Abdelkader M.S.,
Published in: 2nd International Workshop on Embedded Software for Industrial IoT, 2019, Page(s) 27-29
Publisher: ESIIT

Information Holism – a New Way to Close the Information Gap

Author(s): Gerhard Luhn, Agnes Oszuszky
Published in: 2019 3rd International Conference on Advanced Information and Communications Technologies (AICT), 2019, Page(s) 101-107, ISBN 978-1-7281-2399-8
Publisher: IEEE
DOI: 10.1109/aiact.2019.8847757

Ontology-Based Model for Automotive Security Verification and Validation

Author(s): Abdelkader Magdy Shaaban, Christoph Schmittner, Thomas Gruber, A. Baith Mohamed, Gerald Quirchmayr, Erich Schikuta
Published in: Proceedings of the 21st International Conference on Information Integration and Web-based Applications & Services, 2019, Page(s) 73-82, ISBN 9781-450371797
Publisher: ACM
DOI: 10.1145/3366030.3366070

BEYOND SMART SYSTEMS – CREATING A SOCIETY OF THE FUTURE (5.0) RESOLVING DISRUPTIVE CHANGES AND SOCIAL CHALLENGES

Author(s): Schoitsch, Erwin
Published in: Proceedings of IDIMT 2019, Innovation and Transformation in a Digital World, 2, 2019, Page(s) 387-400, ISBN 978-3-99062-590-3
Publisher: Traun Verlag
DOI: 10.5281/zenodo.3605686

On-Chip Power Stage and Gate Driver for Fast Switching Applications

Author(s): Roberto di Lorenzo, Osvaldo Gasparri, Albino Pidutti, Paolo del Croce, Andrea Baschirotto
Published in: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Page(s) 266-269, ISBN 978-1-7281-0996-1
Publisher: IEEE
DOI: 10.1109/icecs46596.2019.8965103

Variable off-Time Peak Current Mode Control (VoT-PCMC) as method for average current regulation in Buck Converter Drivers

Author(s): Osvaldo Gasparri, Roberto di Lorenzo, Paolo Del Croce, Albino Pidutti, Andrea Baschirotto
Published in: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2019, Page(s) 258-261, ISBN 978-1-7281-0996-1
Publisher: IEEE
DOI: 10.1109/icecs46596.2019.8964979

Using Delays for Process flow Simplification

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: 2019 Winter Simulation Conference (WSC), 2019, Page(s) 2372-2383, ISBN 978-1-7281-3283-9
Publisher: IEEE
DOI: 10.1109/wsc40007.2019.9004724

A New High-Volume/Low-Mix Simulation Testbed for Semiconductor Manufacturing

Author(s): Michael Hassoun, Denny Kopp, Lars Monch, Adar Kalir
Published in: 2019 Winter Simulation Conference (WSC), 2019, Page(s) 2419-2428, ISBN 978-1-7281-3283-9
Publisher: IEEE
DOI: 10.1109/wsc40007.2019.9004654

Integrated Planning of Production and Engineering Activities in Semiconductor Supply Chains: A Simulation Study

Author(s): Timm Ziarnetzky, Lars Monch, Thomas Ponsignon, Hans Ehm
Published in: 2019 Winter Simulation Conference (WSC), 2019, Page(s) 2324-2335, ISBN 978-1-7281-3283-9
Publisher: IEEE
DOI: 10.1109/wsc40007.2019.9004721

Interpretable Neuronal Circuit Policies for Reinforcement Learning Environments

Author(s): Matthias Lechner, Ramin M. Hasani, Radu Grosu
Published in: IJCAI/ECAI Workshop on Explainable Artificial Intelligence (XAI), 2018
Publisher: XAI

A Holistic Digital Twin Based on Semantic Web Technologies to Accelerate Digitalization

Author(s): Patrick Moder, Hans Ehm, Eva Jofer
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Framework for Simulation-Based Decision Making in Semiconductor Value Chains

Author(s): Lars Mönch1, Hans Ehm, Thomas Ponsignon
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Digital Twin for Plan and Make Using Semantic Web Technologies – Extending the JESSI/SEMATECH MIMAC Standard to the Digital Reference

Author(s): Patrick Moder, Hans Ehm, Nour Ramzy
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Enhancing Prediction Quality of Fab Simulation by Advanced Cycle Time Modelling

Author(s): Maximilian Dilefeld, Sebastian Rank, Thorsten Schmidt
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Visualization of Automated Material Handling System Components in Semiconductor Industry over the Lifecycle

Author(s): Patrick Boden, Sebastian Rank, Thorsten Schmidt, Martin Däumler
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

A System Dynamics Approach for Modeling Return on Quality for ECS Industry

Author(s): Bernhard Oberegger, Andreas Felsberger, Gerald Reiner
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Automation of Cross-Factory Decision-Making Within Administrative Processes to Enhance Data Quality for Production

Author(s): Jacob Lohmer , Christian Flechsig, Rainer Lasch, Germar Schneider, Dietrich Eberts, Benjamin Zettler2
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

A Novel Software Architecture for Mixed Criticality Systems

Author(s): Ralf Ramsauer, Jan Kiszka, Wolfgang Mauerer
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Digitizing Human Work Places in Manufacturing Through Augmented and Mixed Reality

Author(s): Michael Spitzer, Manfred Rosenberger, Alexander Stocker, Inge Gsellmann, Matthias Hebenstreit, and Michael Schmeja
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Training the Human-in-the-Loop in Industrial Cyber Ranges

Author(s): Stela Kucek, Maria Leitner
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

PCMC DC-DC Converter Development Methodology by Means of dSPACE

Author(s): Osvaldo Gasparri, Roberto Di Lorenzo, Paolo Del Croce, Andrea Baschirotto
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Smart Platform for Rapid Prototyping: A First Solution Approach to Improve Time-to-Market and Process Control in Low-Volume Device Fabrication

Author(s): Martin Schellenberger, Sabrina Anger, Markus Pfeffer, Volker Häublein, Georg Roeder, Anton Bauer
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

Competency Requirements at Digitalized Workplaces in the Semiconductor Industry

Author(s): Sophia Keil, Fabian Lindner, Josef Moser, Rüdiger von der Weth, Germar Schneider
Published in: Digital Transformation in Semiconductor Manufacturing, 2020
Publisher: Springer

A Natural lottery Ticket Winner: Reinforcement Learning with Ordinary Neural Circuits

Author(s): Ramin Hasani, Mathias Lechner, Alexander Amini, Daniela Rus, Radu Grosu
Published in: International Conference on Machine Learning, 2020
Publisher: ICML

Gershgorin Loss Stabilizes the Recurrent Neural Network Compartment of an End-to-end Robot Learning Scheme

Author(s): Mathias Lechner, Ramin Hasani, Daniela Rus, Radu Grosu
Published in: International Conference on Robotics and Automation 2020 (ICRA), 2020
Publisher: IEEE

Integrating critical queue time constraints into SMT2020 simulation models

Author(s): Denny Kopp, Michael Hassoun, Adar Kalir, Lars Mönch
Published in: Proceedings of the 2020 Winter Simulation Conference, 2020
Publisher: IEEE

Algorithm to Design Conductive Mesh for Tamperproof Envelope

Author(s): Sorin Chiţu, Daniel Ciprian Vasile, Tudor Ioan Honceriu, Paul Svasta
Published in: International Symposium for Design and Technology of Electronics Packages (SIITME), 2020
Publisher: IEEE
DOI: 10.1109/siitme50350.2020.9292275

Yield prediction in semiconductor manufacturing using an AI-based cascading classification system

Author(s): Peter Stich, Michael Wahl, Peter Czerner, Christian Weber, Madjid Fathi
Published in: 2020 IEEE International Conference on Electro Information Technology (EIT), 2020, Page(s) 609-614, ISBN 978-1-7281-5317-9
Publisher: IEEE
DOI: 10.1109/eit48999.2020.9208250

Towards a Resilient Society – Technology 5.0, Risks and Ethics

Author(s): Schoitsch Erwin
Published in: IDIMT 2020, 9, 2020
Publisher: Trauner Verlag
DOI: 10.5281/zenodo.4000984

Weakly-Supervised Learning for Multimodal Human Activity Recognition in Human-Robot Collaboration Scenarios

Author(s): Clemens Pohlt, homas Schlegl, Sven Wachsmuth
Published in: IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS), 2020
Publisher: IEEE

Erfolgsfaktoren bei der Einführung Digitaler Technologien im Kontext von Industrie 4.0

Author(s): Stocker Alexander, Rosenberger Manfred, Resztej Mirjam, Damalas Stelios Andreas
Published in: Mensch und Computer 2020 - Workshopband, 2020
Publisher: Gesellschaft für Informatik e.V
DOI: 10.18420/muc2020-ws116-006

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Author(s): Patrick Boden, Sebastian Rank, Thorsten Schmidt
Published in: ASIM Fachtagung - 25. Symposium Simulationstechnik, 2020
Publisher: ASIM - Arbeitsgemeinschaft Simulation
DOI: 10.11128/arep.59.a59019

Chip and Board Scale Transient Thermal Simulations for Power MOS Devices Reliability Analysis

Author(s): Madalin Vasile Moise, Paul Svasta, Norocel Codreanu, Ciprian Ionescu, Mihaela Pantazica, Alexandru Vasile, Bogdan Mihailescu, Cristian Boianceanu
Published in: 2021 44th International Spring Seminar on Electronics Technology (ISSE), 2021, Page(s) 1-4, ISBN 978-1-6654-1477-7
Publisher: IEEE
DOI: 10.1109/isse51996.2021.9467624

Development and Evaluation of a Blockchain Concept for Production Planning and Control in the Semiconductor Industry

Author(s): Herrgoß, Laura; Lohmer, Jacob; Schneider, Germar; Lasch, Rainer
Published in: IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), 2020
Publisher: IEEE
DOI: 10.5281/zenodo.4003638

Challenges in Smart Health Applications using Wearable Medical Internet of Things – A Review

Author(s): Benedikt Schnell, Patrick Moder, Hans Ehm, Marcel Konstantinov, Mahmoud Ismail
Published in: ICICT 2021 – 6th International Congress on Information and Communication Technology, 2021
Publisher: Infineon Technologies AG

Using representative process flows for simulation model simplification

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: International Conference on Industrial Technology, 2021
Publisher: IEEE

Adversarial Training is Not Ready for Robot Learning

Author(s): Lechner, Mathias; Hasani, Ramin; Grosu, Radu; Rus, Daniela; Henzinger, Thomas A.
Published in: IEEE International Conference on Robotics and Automation (ICRA), 2021
Publisher: IEEE
DOI: 10.1109/icra48506.2021.9561036

Einsatzmöglichkeiten der Rückwärtssimulation zur Produktionsplanung in der Halbleiterfertigung

Author(s): Christoph Laroque, Christoph Löffler, Wolfgang Scholl, Germar Schneider
Published in: Proceedings ASIM SST 2020, 2020, Page(s) 397-401, ISBN 9783901608933
Publisher: ARGESIM Publisher Vienna
DOI: 10.11128/arep.59.a59055

Automated and Optimized Lot-To-Order Matching in 300 mm Semiconductor Facilities

Author(s): Christian Flechsig, Jacob Lohmer, Rainer Lasch, Benjamin Zettler, Germar Scheider, Dietrich Eberts
Published in: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2021, Page(s) 1-6, ISBN 978-1-7281-8645-0
Publisher: IEEE
DOI: 10.1109/ASMC51741.2021.9435730

Visual Analytics for Data-Driven Analysis in Semiconductor Manufacturing

Author(s): Boden, Patrick; Rank, Sebastian; Schmidt, Thorsten
Published in: Proceedings ASIM SST 2020, 1, 2020, ISBN 9783901608933
Publisher: Arbeitsgemeinschaft Simuluation

SIMULATION MODEL SIMPLIFICATION FOR CHANGING PRODUCT MIX SCENARIO

Author(s): Igor Stogniy, Wolfgang Scholl, Hans Ehm
Published in: Proceedings of the 2021 Winter Simulation Conferenc, 2021
Publisher: IEEE

DC-DC Buck Converter with Constant Off-Time Peak Current Mode Control

Author(s): Osvaldo Gasparri, Roberto Di Lorenzo, Albino Pidutti, Paolo Del Croce, Andrea Baschirotto
Published in: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2020
Publisher: IEEE
DOI: 10.1109/icecs49266.2020.9294913

Assessing the Impact of Information Assistance Systems on a Worker Level - A Pre-Study towards an Evaluation Framework

Author(s): Lindner Fabian, Winkler Daniel, Müller Arvid, Mühlan Kevin, Keil Sophia
Published in: Mensch und Computer - Workshopband 2020, 2020
Publisher: Gesellschaft für Informatik
DOI: 10.18420/muc2020-ws116-001

A DISCRETE-EVENT HEURISTIC FOR MAKESPAN OPTIMIZATION IN MULTI-SERVERFLOW-SHOP PROBLEMS WITH MACHINE RE-ENTERING

Author(s): Angel A. Juan, Pedro Copado, Javier Panadero, Christoph Laroque, Rocio de la Torre
Published in: Proceedings of the 2020 Winter Simulation Conference, 2020
Publisher: IEEE

Model-based versus Model-free Deep Reinforcement Learning for Autonomous Racing Cars

Author(s): Brunnbauer, Axel; Berducci, Luigi; Brandstätter, Andreas; Lechner, Mathias; Hasani, Ramin; Rus, Daniela; Grosu, Radu
Published in: preprint, 1, 2021
Publisher: TU Vienna

Poster: Smart Virtual Collaboration to Optimize the Development Process in Semiconductor Industry

Author(s): Germar Schneider, Fabian Lindner, Sophia Keil
Published in: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Publisher: apc/m

Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition

Author(s): Schrunner, Stefan; Scheiber, Michael; Jenul, Anna; Zernig, Anja; Kästner, Andre; Kern, Roman
Published in: preprint, 2, 2021
Publisher: Know Center

Development and evaluation of a Blockchain concept for the IFD 300 mm Pre-Assembly Line

Author(s): Germar Schneider; Laura Herrgoß; Jacob Lohmer; Rainer Lasch
Published in: apcm, 2, 2021
Publisher: apcm
DOI: 10.5281/zenodo.4686629

Variable Selection Using Nearest Neighbor Gaussian Processes

Author(s): Posch, Konstantin; Arbeiter, Maximilian; Pleschberger, Martin; Pilz, Juergen
Published in: preprint, 1, 2021
Publisher: University Klagenfurt

Presentation: Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Author(s): Germar Schneider, Laura Herrgoß, Jacob Lohmer, Rainer Lasch
Published in: EUROPEAN ADVANCED PROCESS CONTROL AND MANUFACTURING (APC|M) CONFERENCE, 2021
Publisher: APC/M

Poster: Chances & Challenges of Digitization in Semiconductor Fabs and Success Factors during the Implementation

Author(s): Schneider G., Herrgoß L, Lindner F., Keil S.
Published in: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Publisher: European Advanced Process Control and Manufacturing Conference

Poster: An experimental proof of the different granularity levels of automated-generated long-term simulation model

Author(s): Igor Stogniy, Wolfgang Scholl
Published in: 19th European Advanced Process Control and Manufacturing Conference (apc|m), 2019
Publisher: 19th European Advanced Process Control and Manufacturing Conference (apc|m)

Presentation: New defect classification methodology with regard to causal modeling, supervised by engineers (SME)

Author(s): Andre Schaaf-Ledermüller
Published in: APC 2018: Advanced Process Control Conference, 2018
Publisher: apc conference

Presentation: On the deep nature of human knowledge (part II): Physical information, knowledge and language

Author(s): Gerhard Luhn, Germar Schneider, Gerald Huether
Published in: APC 2018: Advanced Process Control Conference, 2018
Publisher: apc conference

Presentation: On the deep nature of human knowledge (part I): Neuroscience, quantum physics and the imaginary

Author(s): Gerhard Luhn, Germar Schneider, Gerald Hüther
Published in: APC 2018: Advanced Process Control Conference, 2018
Publisher: apc conference

Liquid Time-constant Recurrent Neural Networks as Universal Approximators

Author(s): Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Published in: preprint, 1, 2018
Publisher: arxiv.org

Re-purposing Compact Neuronal Circuit Policies to Govern Reinforcement Learning Tasks

Author(s): Hasani, Ramin M.; Lechner, Mathias; Amini, Alexander; Rus, Daniela; Grosu, Radu
Published in: preprint, 1, 2018
Publisher: arix.org

Presentation: The List is Our Process! An analysis of the kernel's email-based development process

Author(s): Ralf Ramsauer, Sebastian Duda, Lukas Bulwahn, Wolfgang Mauerer
Published in: Embedded Linux Conference Europe, 2019
Publisher: ELCE

"Presentation: Quicker from R&D to Line - A ""Smart Experiments"" Approach"

Author(s): S. Anger, M. Schellenberger, M. Pfeffer, V. Häublein, G. Roeder, A. Bauer
Published in: Workshop of GMM-Fachgruppe 1.2.3 Abscheide- und Ätzverfahren, 2019
Publisher: GMM

"Presentation: Digitale Kompetenzen in der Hochschullehre - ""10.000 Schritte in den Fußstapfen eines 'Pickers'"""

Author(s): Keil S., Mühlan K., Winkler D., Lindner F.
Published in: 14th Regional Conference for Engineering Pedagogy, 2019
Publisher: HSZG

Poster: An Advanced Further Education Framework for Industry 4.0 - Developing a Certification Program for Digital Transformation

Author(s): Sophia Keil, Fabian Lidner, Kevin Mühlan, Daniel Winkler
Published in: 2019
Publisher: HSZG
DOI: 10.13140/rg.2.2.11557.96480

Presentation: A Planning Approach for an Effective Digitalization of Processes in Mature Semiconductor Production Facilities

Author(s): Keil S., Schneider G., Lindner F., Jakubowitz T.
Published in: 2019
Publisher: HSZG

"Poster: Die Bedeutung ""klassischer"" Kompetenzen in der digitalen Transformation"

Author(s): Lindner F., Mühlan K., Winkler D., Naumann F., Keil S.
Published in: Workshop on E-Learning, 2019
Publisher: HSZG
DOI: 10.13140/rg.2.2.35748.83846

Presentation: Statistical Modelling and Design for Quality Control and Reliability Analysis in Power Semiconductor Manufacturing Processes

Author(s): Jürgen Pilz, Daniel Kurz, Natalie Vollert
Published in: DAGSTAT Conference, 2019
Publisher: DAGSTAT

Presentation: Two Worlds - Common Concept?

Author(s): A. Zernig, K. Krebs, F. D. Frumosu, D. Surmann
Published in: European Network for Business and Industrial Statistics, 2019
Publisher: ENBIS

Presentation: The impact of supply chain design options on performance measures in the semiconductor industry

Author(s): Bernhard Oberegger, Andreas Felsberger, Boualem Rabta, Gerald Reiner
Published in: 30th European Conference on Operational Research (EURO), 2019
Publisher: EURO

Presentation: Modeling an Ontology for Planning and Control Tasks in Semiconductor Value Chains

Author(s): Sebastian Arens, Lars Moench
Published in: European Conference on Operational Research, 2019
Publisher: European Conference on Operational Research

Real-time Electrical Power Prediction in a Combined Cycle Power Plant

Author(s): Lobo, Jesus L.; Ballesteros, Igor; Oregi, Izaskun; Del Ser, Javier
Published in: 2019
Publisher: Tecnalia

Presentation: Experimentelle Untersuchung der Auswirkungen digitalisierter Arbeitsplätze auf Menschen in der Industrie 4.0 Modellfabrik.

Author(s): Rinat Saifoulline, Sabine Friese, Tobias Jakubowitz, Dirk Reichelt, Rüdiger von der Weth
Published in: AOW Tagung 2019, 2019
Publisher: AOW

Presentation: Computersimulation komplexer Arbeitsanforderungen als Werkzeug für Qualifikation und prospektive Arbeitsgestaltung.

Author(s): Rüdiger von der Weth, Tobias Jakubowitz, Sabine Friese, Rinat Saifoulline
Published in: 11. Tagung der Fachgruppe Arbeits-, Organisations- und Wirtschaftspsychologie der Deutschen Gesellschaft für Psychologie, 2019
Publisher: AOW

Presentation: Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Author(s): Konstantin Posch, Jürgen Pilz
Published in: 10th International Workshop on Simulation and Statistics, 2019
Publisher: ÖSG

Can a Compact Neuronal Circuit Policy be Re-purposed to Learn Simple Robotic Control?

Author(s): Ramin Hasani, Mathias Lechner, Alexander Amin, Daniela Rus, Radu Grosu
Published in: preprint, 2018
Publisher: TU Wien

On Information Plane Analyses of Neural Network Classifiers -- A Review

Author(s): Geiger, Bernhard C.
Published in: preprint, 1, 2020
Publisher: Know Center

LUNAR: Cellular automata for drifting data streams

Author(s): Jesus L. Lobo, Javier Del Ser, Francisco Herrera
Published in: Information Sciences, 543, 2021, Page(s) 467-487, ISSN 0020-0255
Publisher: Elsevier BV
DOI: 10.1016/j.ins.2020.08.064

Learn to Shape the Digital Transformation: The Design Approach of a Learning Factory for Industrial Engineers

Author(s): Fabian Lindner, Daniel Winkler, Kevin Mühlan, Uwe Wendt, Sophia Keil
Published in: SSRN Electronic Journal, 2021, ISSN 1556-5068
Publisher: Elsevier
DOI: 10.2139/ssrn.3858409

DC-DC Buck Converter Driver with Variable Off-Time Peak Current Mode Control

Author(s): svaldo Gasparri, Paolo Del Croce, Andrea Baschirotto
Published in: Advances in Science, Technology and Engineering Systems Journal, 2020, ISSN 2415-6698
Publisher: ASTES
DOI: 10.25046/aj050642

Ultra-thin oxide breakdown for OTP development in power technologies

Author(s): Osvaldo Gasparri, Mirko Bernardoni, Paolo Del Croce, Andrea Baschirotto
Published in: e & i Elektrotechnik und Informationstechnik, 138/1, 2021, Page(s) 44-47, ISSN 0932-383X
Publisher: Springer Verlag
DOI: 10.1007/s00502-020-00838-1

A Comparison of Variational Bounds for the Information Bottleneck Functional

Author(s): Bernhard C. Geiger, Ian S. Fischer
Published in: Entropy, 22/11, 2020, Page(s) 1229, ISSN 1099-4300
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e22111229

Transformation of semantic knowledge into simulation-based decision support

Author(s): Wiking Jurasky, Patrick Moder, Michael Milde, Hans Ehm, Gunther Reinhart
Published in: Robotics and Computer-Integrated Manufacturing, 71, 2021, Page(s) 102174, ISSN 0736-5845
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.rcim.2021.102174

Zur Messung des Einflusses von „Augmented Reality“ auf die individuelle Produktivität bei Montagearbeiten

Author(s): Manfred Rosenberger, Michael Fellmann, Fabienne Lambusch, Michael Poppe, Michael Spitzer
Published in: HMD Praxis der Wirtschaftsinformatik, 57/3, 2020, Page(s) 451-464, ISSN 1436-3011
Publisher: SpringerLink
DOI: 10.1365/s40702-020-00620-z

Cluster Purging: Efficient Outlier Detection based on Rate-Distortion Theory

Author(s): Maximilian Bernhard Toller, Bernhard Claus Geiger, Roman Kern
Published in: IEEE Transactions on Knowledge and Data Engineering, 2021, Page(s) 1-1, ISSN 1041-4347
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tkde.2021.3103571

On Information Plane Analyses of Neural Network Classifiers – A Review

Author(s): Bernhard C. Geiger
Published in: IEEE Transactions on Neural Networks and Learning Systems, 2021, ISSN 2162-2388
Publisher: IEEE
DOI: 10.1109/tnnls.2021.3089037

CURIE: A Cellular Automaton for Concept Drift Detection

Author(s): Lobo, Jesus L.; Del Ser, Javier; Osaba, Eneko; Bifet, Albert; Herrera, Francisco
Published in: Data Mining and Knowledge Discovery, Special Issue of the Journal Track of ECML PKDD 2021, 2020, ISSN 1573-756X
Publisher: Springer
DOI: 10.1007/s10618-021-00776-2

SMT2020—A Semiconductor Manufacturing Testbed

Author(s): Denny Kopp, Michael Hassoun, Adar Kalir, Lars Monch
Published in: IEEE Transactions on Semiconductor Manufacturing, 2020, Page(s) 1-1, ISSN 0894-6507
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tsm.2020.3001933

Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations with Applications in Sensitivity Analysis and Yield Prediction

Author(s): Elena-Diana Sandru, Emilian David, Ingrid Kovacs, Andi Buzo, Corneliu Burileanu, Georg Pelz
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, Page(s) 1-1, ISSN 0278-0070
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tcad.2021.3054804

Transferrable Framework Based on Knowledge Graphs for Generating Explainable Results in Domain-Specific, Intelligent Information Retrieval

Author(s): Hasan Abu-Rasheed, Christian Weber, Johannes Zenkert , Mareike Dornhöfer and Madjid Fathi
Published in: Journal informatics, 2022, ISSN 2227-9709
Publisher: MDPI
DOI: 10.3390/informatics9010006

Production planning and scheduling in multi-factory production networks: a systematic literature review

Author(s): Jacob Lohmer, Rainer Lasch
Published in: International Journal of Production Research, 2020, Page(s) 1-27, ISSN 0020-7543
Publisher: Taylor & Francis
DOI: 10.1080/00207543.2020.1797207

Investigation of the Airborne Molecular Contamination Behavior in 300 mm Semiconductor Front - End Manufacturing

Author(s): Peter Franze, Germar Schneider, Clara Zaengle, Markus Pfeffer, Stefan Kaskel
Published in: International Journal of Materials Science and Applications, 9/1, 2020, Page(s) 14, ISSN 2327-2635
Publisher: Science Publishing Group
DOI: 10.11648/j.ijmsa.20200901.13

Understanding Neural Networks and Individual Neuron Importance via Information-Ordered Cumulative Ablation

Author(s): Rana Ali Amjad, Kairen Liu, Bernhard C. Geiger
Published in: IEEE Transactions on Neural Networks and Learning Systems, 2021, Page(s) 1-11, ISSN 2162-237X
Publisher: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2021.3088685

A Geometric Perspective on Information Plane Analysis

Author(s): Mina Basirat, Bernhard C. Geiger, Peter M. Roth
Published in: Entropy, 23/6, 2021, Page(s) 711, ISSN 1099-4300
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e23060711

A novel Bayesian approach for variable selection in linear regression models

Author(s): Konstantin Posch, Maximilian Arbeiter, Juergen Pilz
Published in: Computational Statistics & Data Analysis, 144, 2020, Page(s) 106881, ISSN 0167-9473
Publisher: Elsevier BV
DOI: 10.1016/j.csda.2019.106881

SAZED: parameter-free domain-agnostic season length estimation in time series data

Author(s): Maximilian Toller, Tiago Santos, Roman Kern
Published in: Data Mining and Knowledge Discovery, 2019, ISSN 1384-5810
Publisher: Kluwer Academic Publishers
DOI: 10.1007/s10618-019-00645-z

Spiking Neural Networks and online learning: an overview and perspectives

Author(s): Jesus L. Lobo, Javier Del Ser, Albert Bifet, Nikola Kasabov
Published in: Neural Networks, 2020, Page(s) 88-100, ISSN 0893-6080
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.neunet.2019.09.004

Correlated Parameters to Accurately Measure Uncertainty in Deep Neural Networks

Author(s): Konstantin Posch, Juergen Pilz
Published in: IEEE Transactions on Neural Networks and Learning Systems, 2020, Page(s) 1-15, ISSN 2162-237X
Publisher: IEEE Computational Intelligence Society
DOI: 10.1109/tnnls.2020.2980004

An Empirical Survey of Functions and Configurations of Open-Source Capture the Flag (CTF) Environments

Author(s): Stela Kucek, Maria Leitner
Published in: Journal of Network and Computer Applications, 151, 2020, Page(s) 102470, ISSN 1084-8045
Publisher: Academic Press
DOI: 10.1016/j.jnca.2019.102470

Exploiting the stimuli encoding scheme of evolving Spiking Neural Networks for stream learning

Author(s): Jesus L. Lobo, Izaskun Oregi, Albert Bifet, Javier Del Ser
Published in: Neural Networks, 123, 2020, Page(s) 118-133, ISSN 0893-6080
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.neunet.2019.11.021

Stream Learning in Energy IoT Systems: A Case Study in Combined Cycle Power Plants

Author(s): Jesus L. Lobo, Igor Ballesteros, Izaskun Oregi, Javier Del Ser, Sancho Salcedo-Sanz
Published in: Energies, 13/3, 2020, Page(s) 740, ISSN 1996-1073
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/en13030740

Experimental Wafer Carrier Contamination Analysis and Monitoring in Fully Automated 300 mm Power Production Lines

Author(s): Clara Zängle, Markus Pfeffer, Peter Franze, Germar Schneider, Anton Bauer
Published in: Solid State Phenomena, 314, 2021, Page(s) 34-40, ISSN 1662-9779
Publisher: Scientific.net
DOI: 10.4028/www.scientific.net/ssp.314.34

A Fast Switching Current Controlled DC/DC Converter for Automotive Applications

Author(s): Osvaldo Gasparri, Albino Pidutti, Paolo Del Croce, Andrea Baschirotto
Published in: Journal of Electrical and Electronic Engineering, 9/4, 2021, Page(s) 123, ISSN 2329-1613
Publisher: Science Publishing Group
DOI: 10.11648/j.jeee.20210904.14

Robotic Process Automation in purchasing and supply management: A multiple case study on potentials, barriers, and implementation

Author(s): Flechsig, Christian; Anslinger, Franziska; Lasch, Rainer
Published in: Journal of Purchasing and Supply Management, 2021, ISSN 1478-4092
Publisher: Pergamon Press Ltd.
DOI: 10.1016/j.pursup.2021.100718

Neural circuit policies enabling auditable autonomy

Author(s): Mathias Lechner, Ramin Hasani, Alexander Amini, Thomas A. Henzinger, Daniela Rus, Radu Grosu
Published in: Nature Machine Intelligence, 2/10, 2020, Page(s) 642-652, ISSN 2522-5839
Publisher: Springer Nature
DOI: 10.1038/s42256-020-00237-3

In Search of Socio-Technical Congruence: A Large-Scale Longitudinal Study

Author(s): Wolfgang Mauerer; Mitchell Joblin; Damian Andrew Andrew Tamburri; Carlos Paradis; Rick Kazman; Sven Apel
Published in: IEEE Transactions on Software Engineering, 2021, ISSN 0098-5589
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tse.2021.3082074

Information Bottleneck: Theory and Applications in Deep Learning

Author(s): Bernhard C. Geiger, Gernot Kubin
Published in: Entropy, 2020, ISSN 1099-4300
Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
DOI: 10.3390/e22121408

SECURITY SYSTEM FOR DETECTING TAMPERING AND THERMAL SIDE CHANNEL ATTACKS

Author(s): Daniel Ciprian Vasile, Paul Svasta
Published in: UPB Scientific Bulletin, Series C: Electrical Engineering and Computer Science, 2020, ISSN 1454-234X
Publisher: Universitatea Politehnica Bucuresti

Digital Transformation in Semiconductor Manufacturing - Proceedings of the 1st and 2nd European Advances in Digital Transformation Conference, EADTC 2018, Zittau, Germany and EADTC 2019, Milan, Italy

Author(s): Sophia Keil, Fabian Lindner, Rainer Lasch, Jacob Lohmer (Editors)
Published in: Lecture Notes in Electrical Engineering, 2020, ISBN 978-3-030-48602-0
Publisher: Springer
DOI: 10.1007/978-3-030-48602-0

Interpretable Recurrent Neural Networks in Continuous-time Control Environments

Author(s): Ramin Hasani
Published in: Interpretable Recurrent Neural Networks in Continuous-time Control Environments, 2020
Publisher: Technische Universiät Wien

Datasets

Data Set of Existing Summary Statistics from Equipment Sensor Data

Author(s): Pleschberger, Martin
Published in: Zenodo

Equipment Sensor Data from Semiconductor Frontend Production

Author(s): Pleschberger, Martin; Zernig, Anja; Kaestner, Andre
Published in: Zenodo

In Search of Socio-Technical Congruence: A Large-Scale Longitudinal Study

Author(s): Mauerer, Wolfgang; Joblin, Mitchell; Tamburri, Damian Andrew; Paradis, Carlos; Kazman, Rick; Apel, Sven
Published in: Zenodo

Production planning and scheduling in multi-factory production networks: a systematic literature review

Author(s): Lohmer, Jacob; Lasch, Rainer
Published in: Taylor & Francis

Data Set of Extracted Summary Statistics from Equipment Sensor Data

Author(s): Martin Pleschberger
Published in: Zenodo

Software

Git repository archive for the reproduction package of "Silentium! Run-Analyse-Eradicate the Noise out of the DB/OS Stack"

Author(s): Mauerer, Wolfgang; Ramsauer, Ralf; Lucas, Edson; Lohmann, Daniel; Scherzinger, Stefanie
DOI: 10.5281/zenodo.4602325; 10.5281/zenodo.4602324
Publisher: Zenodo

vo3xel/blender-python-module: Open-source release

Author(s): Spitzer, Michael
DOI: 10.5281/zenodo.5167141; 10.5281/zenodo.5167140
Publisher: Zenodo

vo3xel/raclink-blender-demo: DOI added

Author(s): Spitzer, Michael; Hebenstreit, Matthias
DOI: 10.5281/zenodo.5499899; 10.5281/zenodo.5499893
Publisher: Zenodo

Reproduction package for "Silentium! Run-Analyse-Eradicate the Noise out of the DB/OS Stack"

Author(s): Mauerer, Wolfgang; Ramsauer, Ralf; Lucas, Edson; Lohmann, Daniel; Scherzinger, Stefanie
DOI: 10.5281/zenodo.4602295; 10.5281/zenodo.4602296
Publisher: Zenodo

vo3xel/python-occ: Open-source release

Author(s): Michael Spitzer; Matthias Hebenstreit
DOI: 10.5281/zenodo.5163811
Publisher: Zenodo

vo3xel/raclink-occ-demo: DOI added

Author(s): Spitzer, Michael; Hebenstreit, Matthias
DOI: 10.5281/zenodo.5499852; 10.5281/zenodo.5499835
Publisher: Zenodo